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    • 7. 发明申请
    • Optical semiconductor devices on InP substrate
    • InP衬底上的光学半导体器件
    • US20070051937A1
    • 2007-03-08
    • US11500292
    • 2006-08-08
    • Katsumi KishinoIchiro NomuraKoshi TamamuraHitoshi Nakamura
    • Katsumi KishinoIchiro NomuraKoshi TamamuraHitoshi Nakamura
    • H01L29/06
    • H01S5/347B82Y20/00H01L31/0296H01L31/035236H01L33/06H01L33/28H01S5/0218H01S2304/02
    • The present invention aims at providing a structure in which a high p-type carrier concentration of 1×1017 cm−3 or more is obtained in a material in which, although it shows normally p-type conductivity, a carrier concentration smaller than 1×1017 cm−3 is only obtained. Also, the present invention aims at providing highly reliable semiconductor element and device each of which has excellent characteristics such as light emitting characteristics and a long lifetime. Each specific layer, i.e., each ZnSe0.53Te0.47 layer (2ML) is inserted between host layers, i.e., Mg0.5Zn0.29Cd0.21Se layers (each having 10ML (atomic layer) thickness) each of which is lattice matched to an InP substrate. In this case, each specific layer in which a sufficient carrier concentration of 1×1018 cm−3 or more is obtained when a single layer is inserted at suitable intervals. As a result, a sufficient hole concentration of 1×1017 cm−3 or more is obtained in the overall crystal in a material in which a hole concentration smaller than 1×1017 cm−3 has been only conventionally obtained.
    • 本发明的目的在于提供一种结构,其中在其中显示出1×10 17 -3 -3以上的高p型载流子浓度的材料中获得 通常是p型导电性,仅获得小于1×10 17 cm -3的载流子浓度。 另外,本发明的目的在于提供高度可靠的半导体元件和器件,其各自具有优异的特性,例如发光特性和长寿命。 每个特定层,即每个ZnSe 0.53 Te 0.47层(2ML)被插入到主体层之间,即Mg 0.5 Zn 2+ 每个都具有与InP衬底晶格匹配的Se层(每个具有10ML(原子层)厚度)。 在这种情况下,当以适当的间隔插入单层时,获得其中足够的载流子浓度为1×10 18 cm -3以上的特定层。 结果,在其中空穴浓度小于1×10 6Ω的材料中,在整个晶体中获得足够的空穴浓度为1×10 17 cm -3以上的空穴浓度。 只有传统上获得了17厘米-3 -3。
    • 8. 发明授权
    • Optical semiconductor devices on InP substrate
    • InP衬底上的光学半导体器件
    • US07772586B2
    • 2010-08-10
    • US11500292
    • 2006-08-08
    • Katsumi KishinoIchiro NomuraKoshi TamamuraHitoshi Nakamura
    • Katsumi KishinoIchiro NomuraKoshi TamamuraHitoshi Nakamura
    • H01L33/00
    • H01S5/347B82Y20/00H01L31/0296H01L31/035236H01L33/06H01L33/28H01S5/0218H01S2304/02
    • The present invention aims at providing a structure in which a high p-type carrier concentration of 1×1017 cm−3 or more is obtained in a material in which, although it shows normally p-type conductivity, a carrier concentration smaller than 1×1017 cm−3 is only obtained. Also, the present invention aims at providing highly reliable semiconductor element and device each of which has excellent characteristics such as light emitting characteristics and a long lifetime.Each specific layer, i.e., each ZnSe0.53Te0.47 layer (2 ML) is inserted between host layers, i.e., Mg0.5Zn0.29Cd0.21Se layers (each having 10 ML (atomic layer) thickness) each of which is lattice matched to an InP substrate. In this case, each specific layer in which a sufficient carrier concentration of 1×1018 cm−3 or more is obtained when a single layer is inserted at suitable intervals. As a result, a sufficient hole concentration of 1×1017 cm−3 or more is obtained in the overall crystal in a material in which a hole concentration smaller than 1×1017 cm−3 has been only conventionally obtained.
    • 本发明的目的在于提供一种结构,其中虽然其表现出正常的p型导电性,但载流子浓度小于1×10 7的材料,其中获得1×1017cm-3以上的高p型载流子浓度 仅获得1017厘米-3。 另外,本发明的目的在于提供高度可靠的半导体元件和器件,其各自具有优异的特性,例如发光特性和长寿命。 每个特定层,即每个ZnSe0.53Te0.47层(2ML)被插入在主层之间,即Mg0.5Zn0.29Cd0.21Se层(每层具有10ML(原子层)厚度),每层具有格子匹配 到InP衬底。 在这种情况下,当以适当的间隔插入单层时,获得其中1×10 18 cm -3以上的载流子浓度足够的每个特定层。 结果,在通常获得的空穴浓度小于1×1017cm-3的材料中,在整个晶体中获得足够的空穴浓度为1×10 17 cm -3以上。
    • 9. 发明授权
    • Semiconductor laser
    • 半导体激光器
    • US07656918B2
    • 2010-02-02
    • US11688275
    • 2007-03-20
    • Katsumi KishinoIchiro NomuraTsunenori AsatsumaHitoshi Nakamura
    • Katsumi KishinoIchiro NomuraTsunenori AsatsumaHitoshi Nakamura
    • H01S3/16H01S3/04
    • H01S5/327H01S5/3018H01S5/3216
    • A semiconductor laser having an n-cladding layer, an optical guide layer, an active layer, an optical guide layer, and a p-cladding layer above an InP substrate, in which the active layer has a layer constituted with Be-containing group II-VI compound semiconductor mixed crystals, and at least one of layers of the n-cladding layer, the optical guide layer, and the p-cladding layer has a layer constituted with elements identical with those of the Be-containing group II-VI compound semiconductor mixed crystals of the active layer, and the layer is constituted with a superlattice structure comprising, as a well layer, mixed crystals of a Be compositions with the fluctuation of the composition being within ±30% compared with the Be composition of the group II-VI compound semiconductor mixed crystals of the active layer, whereby the device characteristics of the semiconductor laser comprising the Be-containing group II-VI compound semiconductor matched with the InP substrate.
    • 一种在InP衬底上方具有n包层,导光层,有源层,导光层和p包覆层的半导体激光器,其中活性层具有由含Be的基团II构成的层 -VI化合物半导体混晶,并且n包层,导光层和p包层的层中的至少一层具有由与含Be的II-VI族化合物相同的元素构成的层 活性层的半导体混合晶体,并且该层由超晶格结构构成,该超晶格结构包括与组II的Be组分相比,Be组分与组合物的波动在±30%以内的混合晶体作为阱层 -VI化合物半导体混合晶体,由此包括与InP衬底相匹配的含Be基团II-VI化合物半导体的半导体激光器的器件特性。