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    • 3. 发明授权
    • Semiconductor device
    • 半导体器件
    • US07079443B2
    • 2006-07-18
    • US10631752
    • 2003-08-01
    • Masato TakitaMasato MatsumiyaSatoshi EtoToshikazu NakamuraMasatomo HasegawaAyako KitamotoKuninori KawabataHideki KanouToru KogaYuki IshiiShinichi YamadaKaoru Mori
    • Masato TakitaMasato MatsumiyaSatoshi EtoToshikazu NakamuraMasatomo HasegawaAyako KitamotoKuninori KawabataHideki KanouToru KogaYuki IshiiShinichi YamadaKaoru Mori
    • G11C8/08
    • G11C5/147G11C8/08G11C8/12G11C11/4074G11C11/4085G11C2207/2227
    • A semiconductor device includes a word line drive circuit for resetting the word line by driving the word line connected to a memory cell and is constituted so as to switch a reset level of the word line drive circuit, which is set at the time of the reset operation of the word line, between a first potential such as a ground potential and a second potential such as a negative potential. Further, a semiconductor device including a memory cell array formed by arranging a plurality of memory cells and a word line reset level generating circuit for generating a negative potential makes it possible to vary the amount of a current supply of the word line reset level generating circuit when non-selected word lines are set to a negative potential by applying the output of the word line reset level generating circuit to the non-selected word lines, and varies the amount of the current supply of the negative potential in accordance with the operation of the memory cell array. Furthermore, in a semiconductor device including a plurality of power source circuits each having an oscillation circuit and a capacitor, for driving the capacitor by the oscillation signal outputted by the oscillation circuit, at least a part of these power source circuits shares in common the oscillation circuit, and different capacitors are driven by the oscillation signal outputted from the common oscillation circuit.
    • 半导体器件包括字线驱动电路,用于通过驱动连接到存储单元的字线来重置字线,并且被构造成切换在复位时设置的字线驱动电路的复位电平 在诸如地电位的第一电位和诸如负电位的第二电位之间的字线的操作。 此外,包括通过布置多个存储单元形成的存储单元阵列和用于产生负电位的字线复位电平发生电路的半导体器件使得可以改变字线复位电平产生电路的电流供应量 当通过将字线复位电平产生电路的输出施加到未被选择的字线而将未被选择的字线设置为负电位时,根据操作来改变负电位的电流供给量 存储单元阵列。 此外,在具有振荡电路和电容器的多个电源电路的半导体装置中,通过由振荡电路输出的振荡信号来驱动电容器,这些电源电路的至少一部分共享振荡 电路,不同的电容器由共同的振荡电路输出的振荡信号驱动。
    • 7. 发明授权
    • Semiconductor memory device with overdriven sense amplifier and stabilized power-supply circuit of source follower type
    • 半导体存储器件,具有过驱动读出放大器和源极跟随器类型的稳定电源电路
    • US06262930B1
    • 2001-07-17
    • US09612281
    • 2000-07-07
    • Kaoru MoriMasato MatsumiyaAyako KitamotoShinichi YamadaYuki IshiiHideki KanouMasato Takita
    • Kaoru MoriMasato MatsumiyaAyako KitamotoShinichi YamadaYuki IshiiHideki KanouMasato Takita
    • G11C700
    • G11C7/06
    • To reduce current consumption, there is provided a circuit for each bank, comprising selection circuits 26 through 28 each for selecting either a normal supply voltage Vii or a higher supply voltage Vjj as a supply voltage VH0 in response to a selection control signals SC0 and *SC0, a selection control circuit 22 for generating the signals SC0 and *SC0 to make the selection circuits select Vii when a bank activation signal BRAS0 is inactive and Vjj for a predetermined period in response to activation of BRAS0, and sense amplifier driving circuits 111 through 113 for supplying the ground voltage and VH0 to the sense amplifier rows in response to activation of sense amplifier control signals. To stabilize the output voltage Vii of the power supply circuit having a NMOS transistor, the drain electrode, gate and source electrodes of which are at VCC, VG and approximately Vii=VG−Vth, where Vth is the threshold voltage of the NMOS transistor 45, a leak circuit is employed. The leak circuit has a NMOS transistor connected between Vii and ground. Wasteful power consumption by the current flowing to the leak circuit is negligibly small, e.g. 1 to 10 &mgr;A, and the variation of the supply voltage Vii reduces effectively.
    • 为了减少电流消耗,为每个存储体提供一个电路,其中包括选择电路26至28,每个选择电路26至28用于响应于选择控制信号SC0和*选择正常电源电压Vii或较高电源电压Vjj作为电源电压VH0, SC0,用于产生信号SC0和* SC0的选择控制电路22,以使得当存储体激活信号BRAS0不活动时选择电路选择Vii,并响应于BRAS0的激活而在预定时间段内选择Vjj,读出放大器驱动电路111通过 113,用于响应于感测放大器控制信号的激活而将接地电压和VH0提供给读出放大器行。 为了稳定具有NMOS晶体管的电源电路的输出电压Vii,其漏电极,栅极和源电极处于VCC,VG和大约Vii = VG-Vth,其中Vth是NMOS晶体管45的阈值电压 ,采用泄漏电路。 泄漏电路具有连接在Vii和地之间的NMOS晶体管。 通过流向泄漏电路的电流浪费的功率消耗可忽略不计,例如, 1〜10μA,电源电压Vii的变化有效降低。
    • 8. 发明授权
    • Semiconductor memory device with overdriven sense amplifier and
stabilized power-supply circuit of source follower type
    • 半导体存储器件,具有过驱动读出放大器和源极跟随器类型的稳定电源电路
    • US6115316A
    • 2000-09-05
    • US342060
    • 1999-06-29
    • Kaoru MoriMasato MatsumiyaAyako KitamotoShinichi YamadaYuki IshiiHideki KanouMasato Takita
    • Kaoru MoriMasato MatsumiyaAyako KitamotoShinichi YamadaYuki IshiiHideki KanouMasato Takita
    • G11C7/06G11C8/00
    • G11C7/06
    • To reduce current consumption, there is provided a circuit for each bank, comprising selection circuits 26 through 28 each for selecting either a normal supply voltage Vii or a higher supply voltage Vjj as a supply voltage VH0 in response to a selection control signals SC0 and *SC0, a selection control circuit 22 for generating the signals SC0 and *SC0 to make the selection circuits select Vii when a bank activation signal BRAS0 is inactive and Vjj for a predetermined period in response to activation of BRAS0, and sense amplifier driving circuits 111 through 113 for supplying the ground voltage and VH0 to the sense amplifier rows in response to activation of sense amplifier control signals. To stabilize the output voltage Vii of the power supply circuit having a NMOS transistor, the drain electrode, gate and source electrodes of which are at VCC, VG and approximately Vii=VG-Vth, where Vth is the threshold voltage of the NMOS transistor 45, a leak circuit is employed. The leak circuit has a NMOS transistor connected between Vii and ground. Wasteful power consumption by the current flowing to the leak circuit is negligibly small, e.g. 1 to 10 .mu.A, and the variation of the supply voltage Vii reduces effectively.
    • 为了减少电流消耗,为每个存储体提供一个电路,其中包括选择电路26至28,每个选择电路26至28用于响应于选择控制信号SC0和*选择正常电源电压Vii或较高电源电压Vjj作为电源电压VH0, SC0,用于产生信号SC0和* SC0的选择控制电路22,以使得当存储体激活信号BRAS0不活动时选择电路选择Vii,并响应于BRAS0的激活而在预定时间段内选择Vjj,读出放大器驱动电路111通过 113,用于响应于感测放大器控制信号的激活而将接地电压和VH0提供给读出放大器行。 为了稳定具有NMOS晶体管的电源电路的输出电压Vii,其漏电极,栅极和源电极处于VCC,VG和大约Vii = VG-Vth,其中Vth是NMOS晶体管45的阈值电压 ,采用泄漏电路。 泄漏电路具有连接在Vii和地之间的NMOS晶体管。 通过流向泄漏电路的电流浪费的功率消耗可忽略不计,例如, 1至10μA,并且电源电压Vii的变化有效降低。