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    • 8. 发明申请
    • Thin film transistor array substrate
    • 薄膜晶体管阵列基板
    • US20070046336A1
    • 2007-03-01
    • US11479860
    • 2006-06-29
    • Dong KangSoung EomBong KimKi Yang
    • Dong KangSoung EomBong KimKi Yang
    • H03K19/00
    • G02F1/1345G02F1/13458G02F2001/136254G09G3/006G09G3/3648G09G2300/0426
    • A thin film transistor array substrate comprises thin film transistors and pixel electrodes formed at respective pixels that are defined by gate lines and data lines that orthogonally intersect each other. The thin film transistor array substrate further comprises a plurality of gate pad units that group a plurality of gate pads extended from the gate lines, and a plurality of data pad units that groups a plurality of data pads extended from the data lines. The thin film transistor array substrate further includes a plurality of gate test terminals connected to the gate pad units and beside at least one side of the respective gate pad units, and a plurality of data test terminals connected to the data pad units and located beside at least one side of the respective data pad units.
    • 薄膜晶体管阵列基板包括薄膜晶体管和形成在各个像素处的像素电极,栅极线和彼此正交相交的数据线限定。 薄膜晶体管阵列基板还包括对从栅极线延伸的多个栅极焊盘进行分组的多个栅极焊盘单元,以及对从数据线延伸的多个数据焊盘进行分组的多个数据焊盘单元。 所述薄膜晶体管阵列基板还包括多个栅极测试端子,所述多个栅极测试端子连接到所述栅极焊盘单元并且位于各个栅极焊盘单元的至少一侧旁边,以及多个数据测试端子,所述多个数据测试端子连接到所述数据焊盘单元并位于 相应数据垫单元的最少一侧。
    • 9. 发明申请
    • Method and apparatus for testing liquid crystal display
    • 液晶显示器测试方法及装置
    • US20070046320A1
    • 2007-03-01
    • US11443113
    • 2006-05-31
    • Dong KangSoung EomBong KimKi Yang
    • Dong KangSoung EomBong KimKi Yang
    • G01R31/00
    • G09G3/006G02F1/1309G09G3/3666G09G2300/0426
    • An LCD test method and apparatus for reducing the number of channels of a probe unit is provided. An apparatus for testing a liquid crystal display including: a stage on which a liquid crystal panel is placed; a plurality of vertically divided blocks, wherein each of the vertically divided blocks include a plurality of adjacent data lines; a data probe unit that provides test pattern signals respectively to groups of at least two of the plurality of vertically divided blocks of the liquid crystal panel; a plurality of horizontally divided blocks, wherein each of the horizontally divided blocks include a plurality of adjacent gate lines; a gate probe unit that provides scanning signals respectively to the plurality of horizontally divided blocks of the liquid crystal panel; and a controller that provides test pattern signals to the data probe unit and provides scanning signals to the gate probe unit.
    • 提供了用于减少探针单元的通道数量的LCD测试方法和设备。 一种用于测试液晶显示器的装置,包括:放置液晶面板的阶段; 多个垂直分割块,其中每个垂直分割块包括多个相邻的数据线; 数据探测单元,分别向液晶面板的多个垂直分割块中的至少两个的组提供测试图形信号; 多个水平分割块,其中每个水平分割块包括多个相邻的栅极线; 栅极探针单元,其分别向液晶面板的多个水平分割块提供扫描信号; 以及控制器,其向所述数据探测单元提供测试图案信号,并向所述门探针单元提供扫描信号。