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    • 1. 发明授权
    • Sample holder for optical spectrometer and method for taking a spectrum
    • 用于光谱仪的样品座和采集光谱的方法
    • US5171995A
    • 1992-12-15
    • US764619
    • 1991-09-24
    • Jurgen GastArno SimonEckhard Reh
    • Jurgen GastArno SimonEckhard Reh
    • G01N21/03G01N30/74G01N35/00
    • G01N21/03G01N2021/0339G01N2021/035G01N2035/00237G01N2201/0638
    • A sample holder for placing a sample substance for transmission measurements with optical radiation into a spectrometer, in particular, a FTIR spectrometer which is at least partially made from a material transparent to the optical radiation in a intermeshing wavelength region and which exhibits an index of refraction in excess of 1 is configured as a converging lens with a concave surface (11) and a convex surface (12). To take an absorption spectrum of a powder and/or fluid dissolved or suspended sample substance, the sample substance is brought onto the concave surface (11) of the sample holder before the measurement where it, in consequence of the curvature and in contrast to a flat surface, is concentrated in a substantially smaller surface region. The configuration of the sample holder as a converging lens increases the yield of the radiation penetrating through the sample substance onto the detector of the spectrometer configuration.
    • 用于将用于具有光学辐射的透射测量的样品物质放置在光谱仪中的样品架,特别是FTIR光谱仪,其至少部分地由在相互啮合的波长区域内的光辐射透明的材料制成并且具有折射率 超过1被配置为具有凹面(11)和凸面(12)的会聚透镜。 为了获得粉末和/或流体溶解或悬浮的样品物质的吸收光谱,在测量之前将样品物质带到样品保持器的凹面(11)上,其中由于曲率而与 平坦的表面集中在基本上较小的表面区域。 作为会聚透镜的样品架的构造增加了穿透样品物质的辐射的产量到光谱仪配置的检测器上。
    • 5. 发明授权
    • Method for the routine identification of plastics
    • 塑料常规识别方法
    • US5510619A
    • 1996-04-23
    • US342355
    • 1994-11-18
    • Gunter ZachmannJurgen GastArno SimonReiner Schubel
    • Gunter ZachmannJurgen GastArno SimonReiner Schubel
    • B07C5/342G01N21/35G01N33/44G01J1/00B07C5/344
    • G01N33/442B07C5/342G01N21/3563G01N2021/3595
    • A method for routine identification of materials of plastic components with the assistance of infrared spectroscopy with which an infrared reflection spectrum is taken from the surface of a plastic component to be investigated and compared to a set of reference spectra, whereby the material of the plastic component under investigation is correlated to a class of plastic materials represented by one of the reference spectrum, is characterized in that the plastic component under investigation is positioned with the assistance of a video device (25, 26) and in that the infrared reflection spectrum is recorded in the range of the mid-infrared (MIR) in a wave length region between 400 and 4,000 cm.sup.-1. In this fashion even plastics which, for example, are filled with carbon can be routinely identified. It is preferred when the first derivative of the recorded IR spectrum with respect to wave number is taken and compared to the first derivative of the IR spectra of the reference spectra.
    • 借助于红外光谱学常规识别塑料部件材料的方法,从被研究的塑料部件的表面取出红外反射光谱,并与一组参考光谱进行比较,由此塑料部件的材料 正在研究中的一类由参考光谱之一表示的塑料材料相关,其特征在于所研究的塑料部件借助于视频装置(25,26)定位,并且记录红外反射光谱 在400至4000cm -1的波长区域的中红外(MIR)的范围内。 这样一来,甚至可以常规地确定例如填充有碳的塑料。 记录红外光谱相对于波数的一阶导数是优选的,并与参考光谱的红外光谱的一阶导数进行比较。
    • 6. 发明授权
    • Optical instrument
    • 光学仪器
    • US4760258A
    • 1988-07-26
    • US924067
    • 1986-10-28
    • Jurgen GastArno Simon
    • Jurgen GastArno Simon
    • G01J3/08G01N21/35
    • G01J3/08
    • In an IR-FR- spectrometer, a light beam (10) is guided from a source to a detector (31) and is passed, in a first mode of operation, by means of first optical means (12, 19, 20) through a sample to be measured (28) and, in a second mode of operation, by second optical means (12, 22, 21) through a reference sample (32). The first and second optical means comprise a common mirror element (12) having at least first and second mirror surfaces (13, 14, 15, 16) which are inclined relative to each other. The mirror surfaces abut in at least one point. There is provided means for moving the mirror element (12) relative to the light beam so that during such relative movement the impinging point of the light beam (10) is displace from the first mirror surface (13), over onto the second mirror surface (14).
    • 在IR-FR-光谱仪中,光束(10)从源极被引导到检测器(31),并且在第一操作模式下通过第一光学装置(12,19,20)通过 待测量的样品(28),并且在第二操作模式下,通过第二光学装置(12,22,21)通过参考样品(32)。 第一和第二光学装置包括具有相对于彼此倾斜的至少第一和第二镜面(13,14,15,16)的公共镜元件(12)。 镜面至少贴在一个点上。 提供了用于相对于光束移动镜元件(12)的装置,使得在这种相对运动期间,光束(10)的入射点从第一镜面(13)移位到第二镜面 (14)。
    • 8. 发明授权
    • Sample chamber for an optical spectrometer
    • 光谱仪样品室
    • US3958882A
    • 1976-05-25
    • US471847
    • 1974-05-22
    • Jurgen Gast
    • Jurgen Gast
    • G01J3/08G01J3/453G01N21/00
    • G01J3/453G01J3/08
    • A sample chamber for an optical spectrometer comprising means for selecting one of two modes of operation: a transmission mode or a reflection mode. The mode-selecting means comprise optical elements for switching the path of the optical beam passing through the sample chamber so that the beam either passes through a sample or is incident upon and reflects off of a surface of a sample. Coupled to the path-selecting means are means for moving a sample to the position and orientation relative to the optical beam which is appropriate to the mode of operation selected.
    • 一种用于光谱仪的样品室,包括用于选择两种操作模式之一的装置:透射模式或反射模式。 模式选择装置包括光学元件,用于切换通过样品室的光束的路径,使得光束通过样品或入射到样品的表面并从其反射。 与路径选择装置相耦合的装置是用于将样本移动到相对于适于所选择的操作模式的光束的位置和取向的装置。
    • 9. 发明授权
    • Auxiliary unit for carrying out reflection measurements using an IR
spectrometer
    • 使用红外光谱仪进行反射测量的辅助单元
    • US4479058A
    • 1984-10-23
    • US426221
    • 1982-09-28
    • Jurgen GastLutz WunschGunter Zachmann
    • Jurgen GastLutz WunschGunter Zachmann
    • G01N21/35G01N21/47G01N21/55G01J5/08
    • G01N21/55G01N21/35G01N21/47
    • An auxiliary device enabling reflection measurements to be carried out by an IR spectrometer designed for the performance of transmission measurements comprises two deflecting mirrors (22, 23) to be positioned in the straight beam section of the spectrometer and two focussing reflector arrangements (26, 2, 27) of which the first forms at the location of the sample (16) to be investigated by the reflection method a reduced image of the focus (30) situated within the ray of beams (28) deflected by the first deflecting mirror (22) while the said second focussing reflector arrangement forms an enlarged image of the said reduced focus at a distance before the said second deflecting mirror (23) so that the beam of rays (33) emitted by the said second deflecting mirror forms a prolongation of the beam of rays inciding upon the said first deflecting mirror just as if the auxiliary device did not exist. Each reflector arrangement comprises a collimator mirror (26, 27) for parallelizing the divergent beam of rays emitted by the associated deflecting mirror (22, 23) and sections of a common parabolic mirror (2), the beams of rays (29, 31) emitted by the said collimator mirror (26, 27) extending in parallel to the axis of the said parabolic mirror (2) and the sample being arranged at a point coinciding with its focal point (16).
    • 能够通过设计用于实现透射测量的IR光谱仪进行反射测量的辅助装置包括两个位于光谱仪的直梁部分中的偏转镜(22,23),以及两个聚焦反射器装置(26,2 ,27),其中通过反射方法在待测样品(16)的位置处的第一个形式形成位于由第一偏转镜(22)偏转的光束(28)的射线(30)的缩小图像 ),而所述第二聚焦反射器装置在所述第二偏转镜(23)之前的距离处形成所述缩小焦点的放大图像,使得由所述第二偏转镜发射的光束(33)形成延长的 就像辅助设备不存在一样,入射到所述第一偏转镜上的光束。 每个反射器装置包括准直镜(26,27),用于使由相关联的偏转镜(22,23)发射的发射光束和共同抛物面镜(2)的部分平行化,射线束(29,31) 由平行于所述抛物面镜(2)的轴线延伸的所述准直器反射镜(26,27)发射,并且所述样品布置在与其焦点(16)重合的点处。
    • 10. 发明授权
    • Mirror optics with grazing incidence reflection
    • 具有掠射入射反射的镜面光学
    • US5495363A
    • 1996-02-27
    • US167482
    • 1993-12-15
    • Jurgen Gast
    • Jurgen Gast
    • G01N21/35G01N21/55G02B21/04G02B17/00
    • G02B21/04G01N21/55G01N2021/3595
    • In an infrared (IR) microscope for a Fourier transform (FT) infrared spectrometer with a Cassegrain mirror-lens with which an incident beam (15) can be focused via a convex mirror (16) and a concave mirror (17) onto a first point-shaped region (19) on the surface of a sample (20) under an angle of incidence .beta.
    • 在具有卡塞格伦镜像透镜的傅立叶变换(FT)红外光谱仪的红外(IR)显微镜中,入射光束(15)可以通过凸面镜(16)和凹面镜(17)聚焦到第一 在相对于光轴(22)入射角β<60°的角度并且随后通过光路x行进在样品(20)的表面上的点状区域(19),第一平面镜(1) 以及在所述凹面镜(17)和所述样品(20)的表面之间布置第二平面镜(2),使得从所述凹面镜(17)沿所述样品(20)的方向反射的所述发光束(30) )在第一平面镜(1)上聚焦到第二平面镜(2)上,然后聚焦到样品(20)表面上的第二点状区域(19')上,第二点状区域位于 在比第一点状区域(19)更靠近透镜(16,17)的光轴(22)上,由此光路的总和等于 光路x,由此入射角β'大于60°,并且由此第三平面镜(3)和第四平面镜(4)相对于第二(2)和第一(1)平面对称地布置 镜子。