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1. 发明授权

US07903785B2 Method of bright-field imaging using X-rays 有权
标题翻译：使用X射线的明场成像方法
公开(公告)号：US07903785B2
公开(公告)日：2011-03-08
申请号：US12373278
申请日：2006-07-12
申请人： Jung Ho Je , Jae Mok Yi
发明人： Jung Ho Je , Jae Mok Yi
IPC分类号： G01N23/201
CPC分类号： G01N23/20083 , G01N2223/1003 , G01N2223/413 , G01N2223/646
摘要： Provided is a method of bright-field imaging using x-rays in a sample to reveal lattice defects as well as structural inhomogeneities, the method comprising: (a) disposing a sample on a holder in the Laue transmission geometry and setting the sample to a single reflection in the Bragg diffraction; (b) projecting a beam of monochromatic x-rays on the sample; and (c) obtaining transmitted radiographic images and reversed diffracted images of the projected beam of monochromatic x-rays by the sample, respectively.
摘要翻译：提供了一种利用样品中的X射线进行亮场成像以显示晶格缺陷以及结构不均匀性的方法，该方法包括：（a）在Laue透射几何中将样品放置在支架上并将样品设置为布拉格衍射中的单反射; （b）将一束单色x射线投射在样品上; 和（c）分别通过样本获得透射的放射线照相图像和反射衍射的单色X射线束的衍射图像。

2. 发明申请

US20090290681A1 METHOD OF BRIGHT-FIELD IMAGING USING X-RAYS 有权
标题翻译：使用X射线的亮场成像方法
公开(公告)号：US20090290681A1
公开(公告)日：2009-11-26
申请号：US12373278
申请日：2006-07-12
申请人： Jung Ho Je , Jae Mok Yi
发明人： Jung Ho Je , Jae Mok Yi
IPC分类号： G01N23/18 , G21K1/06
CPC分类号： G01N23/20083 , G01N2223/1003 , G01N2223/413 , G01N2223/646
摘要： Provided is a method of bright-field imaging using x-rays in a sample to reveal lattice defects as well as structural inhomogeneities, the method comprising: (a) disposing a sample on a holder in the Laue transmission geometry and setting the sample to a single reflection in the Bragg diffraction; (b) projecting a beam of monochromatic x-rays on the sample; and (c) obtaining transmitted radiographic images and reversed diffracted images of the projected beam of monochromatic x-rays by the sample, respectively.
摘要翻译：提供了一种利用样品中的X射线进行亮场成像以显示晶格缺陷以及结构不均匀性的方法，该方法包括：（a）在Laue透射几何中将样品放置在支架上并将样品设置为布拉格衍射中的单反射; （b）将一束单色x射线投射在样品上; 和（c）分别通过样本获得透射的放射线照相图像和反射衍射的单色X射线束的衍射图像。

3. 发明授权

US07620149B2 Characterization of three-dimensional distribution of defects by X-ray topography 失效
标题翻译：通过X射线形貌表征缺陷的三维分布
公开(公告)号：US07620149B2
公开(公告)日：2009-11-17
申请号：US12087402
申请日：2006-01-06
申请人： Jung Ho Je , Jae Mok Yi
发明人： Jung Ho Je , Jae Mok Yi
IPC分类号： G01N23/207
CPC分类号： G01N23/046 , G01N2223/419
摘要： Provided is a method of determining a three-dimensional distribution of structural defects in a single crystal material, the method comprising: (a) disposing a single crystal sample on a holder, the sample being set to a symmetric reflection in the Bragg Geometry; (b) projecting a beam of incident x-rays on a predetermined crystal plane in the sample and reflecting the x-rays while the sample is azimuthally rotating with respect to an normal axis, the normal axis being perpendicular to the predetermined crystal plane; (c) obtaining geometrical measured values of a two-dimensional configuration of defects on the detector plane of a CCD detector; and (d) determining the three-dimensional distribution of the defects in the sample by formulating a geometrical relation between a three-dimensional configuration of defects on the sample and the geometrical measured values of the two-dimensional configuration of defects on the detector plane.
摘要翻译：提供了一种确定单晶材料中的结构缺陷的三维分布的方法，所述方法包括：（a）将单晶样品放置在保持器上，所述样品在布拉格几何中被设置为对称反射; （b）在样品相对于法线轴方位角旋转时，将入射的X射线束投射在样品中的预定晶面上并反射X射线，法线轴线垂直于预定晶面; （c）获得CCD检测器的检测器平面上缺陷的二维构型的几何测量值; 以及（d）通过配置样品上的缺陷的三维构型与检测器平面上缺陷的二维构型的几何测量值之间的几何关系来确定样品中的缺陷的三维分布。

4. 发明申请

US20090034681A1 Characterization of Three-Dimensional Distribution of Defects by X-Ray Topography 失效
标题翻译： X射线地形三维缺陷分布特征
公开(公告)号：US20090034681A1
公开(公告)日：2009-02-05
申请号：US12087402
申请日：2006-01-06
申请人： Jung Ho Je , Jae Mok Yi
发明人： Jung Ho Je , Jae Mok Yi
IPC分类号： G01N23/207
CPC分类号： G01N23/046 , G01N2223/419
摘要： Provided is a method of determining a three-dimensional distribution of structural defects in a single crystal material, the method comprising: (a) disposing a single crystal sample on a holder, the sample being set to a symmetric reflection in the Bragg Geometry; (b) projecting a beam of incident x-rays on a predetermined crystal plane in the sample and reflecting the x-rays while the sample is azimuthally rotating with respect to an normal axis, the normal axis being perpendicular to the predetermined crystal plane; (c) obtaining geometrical measured values of a two-dimensional configuration of defects on the detector plane of a CCD detector; and (d) determining the three-dimensional distribution of the defects in the sample by formulating a geometrical relation between a three-dimensional configuration of defects on the sample and the geometrical measured values of the two-dimensional configuration of defects on the detector plane.
摘要翻译：提供了一种确定单晶材料中的结构缺陷的三维分布的方法，所述方法包括：（a）将单晶样品放置在保持器上，所述样品在布拉格几何中被设置为对称反射; （b）在样品相对于法线轴方位角旋转时，将入射的X射线束投射在样品中的预定晶面上并反射X射线，法线轴线垂直于预定晶面; （c）获得CCD检测器的检测器平面上缺陷的二维构型的几何测量值; 以及（d）通过配置样品上的缺陷的三维构型与检测器平面上缺陷的二维构型的几何测量值之间的几何关系来确定样品中的缺陷的三维分布。

5. 发明授权

US09366786B2 Method for manufacturing X-ray/γ-ray focusing optical system using atomic layer deposition 有权
标题翻译：使用原子层沉积制造X射线/γ射线聚焦光学系统的方法
公开(公告)号：US09366786B2
公开(公告)日：2016-06-14
申请号：US13976634
申请日：2011-10-28
申请人： Jung Ho Je , Jiwon Jung
发明人： Jung Ho Je , Jiwon Jung
IPC分类号： G02B3/08 , B82Y10/00 , G21K1/06 , C23C16/455
CPC分类号： G02B3/08 , B82Y10/00 , C23C16/45555 , G21K1/062 , G21K1/067 , G21K2201/061 , G21K2201/067
摘要： The present invention relates to a method for manufacturing an X-ray/γ-ray focusing optical system comprising the steps of: providing a capillary substrate; and sequentially accumulating a plurality of alternation layers, each consisting of an X-ray/γ-ray opaque material and an X-ray/γ-ray transparent material, on an inner surface of the capillary substrate in a Fresnel pattern by atomic layer deposition.
摘要翻译：本发明涉及一种制造X射线/γ射线聚焦光学系统的方法，包括以下步骤：提供毛细管基底; 并且通过原子层沉积在菲涅尔图案的毛细管基板的内表面上依次累积多个交替层，每个交替层由X射线/γ射线不透明材料和X射线/γ射线透明材料组成。

6. 发明申请

US20120298401A1 METHOD FOR FABRICATING A THREE-DIMENSIONAL ULTRAFINE POLYMER CONDUCTING WIRE, OMNIDIRECTIONAL WIRING, AND ULTRAFINE POLYMER CONDUCTING WIRE FABRICATED USING THE METHOD 审中-公开
标题翻译：用于制造三维超导聚合物导线，网状布线和使用该方法制造的超导聚合物导线的方法
公开(公告)号：US20120298401A1
公开(公告)日：2012-11-29
申请号：US13574093
申请日：2010-01-22
申请人： Jung Ho Je , Ji Tae Kim , Seung Kwon Seol
发明人： Jung Ho Je , Ji Tae Kim , Seung Kwon Seol
IPC分类号： H01B5/00 , H01B13/00
CPC分类号： H01B5/00 , H01B1/124 , H01L24/76 , H01L24/82 , H01L2224/48463 , H01L2224/76152 , H01L2224/82101 , H01L2924/00011 , H01L2924/01006
摘要： Disclosed herein is a method for fabricating a three-dimensional ultrafine conducting polymer wire having a high aspect ratio by local chemical polymerization using a micropipette. The fabricating method includes the steps of: (a) disposing a lower end of the micropipette, filled with an aqueous monomer solution corresponding to a conducting polymer, over a surface of a substrate at an alignment point at which the ultrafine conducting polymer wire is to be formed; (b) bringing the lower end of the micropipette into contact with the surface of the substrate at the alignment point; (c) drawing the micropipette away from the surface of the substrate by a predetermined distance to form a meniscus of the aqueous monomer solution between the lower end of the micropipette and the surface of the substrate; and (d) moving the micropipette in a growth direction of the ultrafine conducting polymer wire at a constant speed such that the meniscus is grown into the ultrafine conducting polymer wire having a high aspect ratio by a polymerization reaction of the meniscus with oxygen in the air.
摘要翻译：本文公开了一种通过使用微量移液管局部化学聚合制造具有高纵横比的三维超细导电聚合物线的方法。该制造方法包括以下步骤：（a）在超细导电聚合物丝线对准点处，在衬底的表面上设置填充有与导电聚合物相对应的单体水溶液的微量吸管的下端，形成; （b）在对准点使微量移液器的下端与基材的表面接触; （c）将所述微量移液管从所述基底表面拉出预定距离，以在所述微量移液管的下端与所述基底的表面之间形成所述单体水溶液的弯液面; 和（d）以恒定的速度在超细导电聚合物丝线的生长方向上移动微量移液管，使得弯月面通过弯月面与空气中的氧气的聚合反应生长成具有高纵横比的超细导电聚合物丝线。

7. 发明申请

US20090308754A1 FABRICATION OF FREESTANDING MICRO HOLLOW TUBES BY TEMPLATE-FREE LOCALIZED ELECTROCHEMICAL DEPOSITION 审中-公开
标题翻译：通过无模式定位的电化学沉积法制造微型中空管
公开(公告)号：US20090308754A1
公开(公告)日：2009-12-17
申请号：US12504774
申请日：2009-07-17
申请人： Seung Kwon Seol , Jung Ho Je , Yeu Kuang Hwu
发明人： Seung Kwon Seol , Jung Ho Je , Yeu Kuang Hwu
IPC分类号： C25D21/12 , C25D5/02
CPC分类号： C25D7/04 , C25D5/02 , C25D5/04
摘要： The present invention provides a method of fabricating a micro hollow tube, more specifically, a method of fabricating a micro hollow tube by template-free localized electrochemical deposition, in which the micro hollow tube is fabricated by the accurate control of the distribution of the electric field strength during deposition with precise interplay of the applied voltage and the distance between the microelectrode and the grown structure.
摘要翻译：本发明提供了一种制造微型中空管的方法，更具体地说，一种通过无模板的局部电化学沉积制造微型中空管的方法，其中微型中空管是通过精确控制电气分布沉积期间的场强与施加电压的精确相互作用以及微电极与生长结构之间的距离。

8. 发明申请

US20130280421A1 METHOD FOR MANUFACTURING X-RAY/GAMMA-RAY FOCUSING OPTICAL SYSTEM USING ATOMIC LAYER DEPOSITION 有权
标题翻译：使用原子层沉积制造X射线/伽玛射线聚焦光学系统的方法
公开(公告)号：US20130280421A1
公开(公告)日：2013-10-24
申请号：US13976634
申请日：2011-10-28
申请人： Jung Ho Je , Jiwon Jung
发明人： Jung Ho Je , Jiwon Jung
IPC分类号： G02B3/08
CPC分类号： G02B3/08 , B82Y10/00 , C23C16/45555 , G21K1/062 , G21K1/067 , G21K2201/061 , G21K2201/067
摘要： The present invention relates to a method for manufacturing an X-ray/γ-ray focusing optical system comprising the steps of: providing a capillary substrate; and sequentially accumulating a plurality of alternation layers, each consisting of an X-ray/γ-ray opaque material and an X-ray/γ-ray transparent material, on an inner surface of the capillary substrate in a Fresnel pattern by atomic layer deposition.
摘要翻译：本发明涉及一种用于制造X射线/γ射线聚焦光学系统的方法，包括以下步骤：提供毛细管基底; 并且通过原子层沉积在菲涅耳图案的毛细管基板的内表面上依次累积多个交替层，每个交替层由X射线/伽玛射线不透明材料和X射线/γ射线透明材料组成。

9. 发明申请

US20090155450A1 Method for manufacturing a stable freestanding pure water film 审中-公开
标题翻译：制造稳定的独立纯水膜的方法
公开(公告)号：US20090155450A1
公开(公告)日：2009-06-18
申请号：US12009153
申请日：2008-01-16
申请人： Jung Ho Je , Byung Mook Weon
发明人： Jung Ho Je , Byung Mook Weon
IPC分类号： C23C14/28
CPC分类号： C02F1/30 , B01L3/508 , C02F1/307 , C02F2103/04 , G01N1/44
摘要： The present invention relates to a method for manufacturing a stable freestanding pure water film. More specifically, the invention relates to a method for manufacturing a stable freestanding pure water film by X-ray bombardment of a small pure water volume in a capillary tube, the X-ray bombardment evaporating the pure water volume to be a pure water thin film and at the same time charging the surface of the pure water thin film to be stabilized electrically.
摘要翻译：本发明涉及制造稳定的独立纯水膜的方法。更具体地说，本发明涉及通过毛细管中的小纯水体积的X射线轰击制造稳定的独立纯水膜的方法，X射线轰击将纯水体积蒸发成纯水薄膜同时将纯水薄膜的表面充电以使其电稳定。

10. 发明申请

US20090155365A1 Method for remotely controlling a sol-gel transition of hydrogels and method for delivering a drug using the same 有权
标题翻译：用于远程控制水凝胶的溶胶 - 凝胶转变的方法和使用其进行药物输送的方法
公开(公告)号：US20090155365A1
公开(公告)日：2009-06-18
申请号：US12009157
申请日：2008-01-16
申请人： Jung Ho Je , Byung Mook Weon
发明人： Jung Ho Je , Byung Mook Weon
IPC分类号： A61M5/00 , A61K9/00 , A61N5/00
CPC分类号： A61K9/06 , A61K47/34
摘要： The present invention relates to a method for remotely controlling a sol-gel transition of hydrogels and a method for delivering a drug using the same. More specifically, the invention relates to a method of remotely controlling a sol-gel transition of polyethylene glycol (PEG)-containing hydrogels—three-dimensional networks of crosslinked polymer chains—by X-ray irradiation, and relates to a method for delivering a drug using the same.
摘要翻译：本发明涉及一种用于远程控制水凝胶的溶胶 - 凝胶转变的方法和使用其的药物输送方法。更具体地，本发明涉及一种通过X射线照射远程控制聚乙二醇（PEG）的含水凝胶 - 交联聚合物链的三维网络的溶胶 - 凝胶转变的方法，并且涉及一种递送药物使用相同。

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