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    • 1. 发明授权
    • Test system with adjustable radio-frequency probe array
    • 具有可调式射频探头阵列的测试系统
    • US09000989B2
    • 2015-04-07
    • US13212108
    • 2011-08-17
    • Joshua G. NickelJerzy GutermanMattia PascoliniChun-Lung ChenJoss Nathan Giddings
    • Joshua G. NickelJerzy GutermanMattia PascoliniChun-Lung ChenJoss Nathan Giddings
    • G01R29/08G01R29/10G01R31/28
    • G01R29/10G01R31/2824
    • Electronic device structures may be tested using a radio-frequency test system. The radio-frequency test system may include radio-frequency test equipment and an associated test fixture. The radio-frequency test equipment may be used in generating and measuring radio-frequency signals. The test fixture may contain adjustable structures that allow the positions of radio-frequency test probes to be adjusted. The test system may be configured to position radio-frequency probes in the test fixture so that some probe contacts form electrical connections with conductive antenna structures. The radio-frequency probes may contain other contacts that are positioned to form electrical connections with conductive electronic device housing structures. During radio-frequency testing, the test equipment in the test system may apply radio-frequency test signals to the device structures under test using the test probes. Corresponding radio-frequency test signals may be measured by the test equipment.
    • 可以使用射频测试系统来测试电子设备结构。 射频测试系统可以包括射频测试设备和相关的测试夹具。 射频测试设备可用于产生和测量射频信号。 测试夹具可能包含允许调整射频测试探头位置的可调结构。 测试系统可以被配置为将射频探针放置在测试夹具中,使得一些探针触点与导电天线结构形成电连接。 射频探头可以包含定位成与导电电子器件壳体结构形成电连接的其它触点。 在射频测试期间,测试系统中的测试设备可以使用测试探针将射频测试信号应用于被测设备结构。 相应的射频测试信号可以由测试设备测量。
    • 2. 发明申请
    • TEST SYSTEM WITH ADJUSTABLE RADIO-FREQUENCY PROBE ARRAY
    • 具有可调无线电频率探头阵列的测试系统
    • US20130044033A1
    • 2013-02-21
    • US13212108
    • 2011-08-17
    • Joshua G. NickelJerzy GutermanMattia PascoliniChun-Lung ChenJoss Nathan Giddings
    • Joshua G. NickelJerzy GutermanMattia PascoliniChun-Lung ChenJoss Nathan Giddings
    • G01R29/08
    • G01R29/10G01R31/2824
    • Electronic device structures may be tested using a radio-frequency test system. The radio-frequency test system may include radio-frequency test equipment and an associated test fixture. The radio-frequency test equipment may be used in generating and measuring radio-frequency signals. The test fixture may contain adjustable structures that allow the positions of radio-frequency test probes to be adjusted. The test system may be configured to position radio-frequency probes in the test fixture so that some probe contacts form electrical connections with conductive antenna structures. The radio-frequency probes may contain other contacts that are positioned to form electrical connections with conductive electronic device housing structures. During radio-frequency testing, the test equipment in the test system may apply radio-frequency test signals to the device structures under test using the test probes. Corresponding radio-frequency test signals may be measured by the test equipment.
    • 可以使用射频测试系统来测试电子设备结构。 射频测试系统可以包括射频测试设备和相关的测试夹具。 射频测试设备可用于产生和测量射频信号。 测试夹具可能包含允许调整射频测试探头位置的可调结构。 测试系统可以被配置为将射频探针放置在测试夹具中,使得一些探针触点与导电天线结构形成电连接。 射频探头可以包含定位成与导电电子器件壳体结构形成电连接的其它触点。 在射频测试期间,测试系统中的测试设备可以使用测试探针将射频测试信号应用于被测设备结构。 相应的射频测试信号可以由测试设备测量。
    • 8. 发明授权
    • Antenna isolation elements
    • 天线隔离元件
    • US08854266B2
    • 2014-10-07
    • US13216012
    • 2011-08-23
    • Jiang ZhuJerzy GutermanMattia PascoliniJayesh NathRobert W. Schlub
    • Jiang ZhuJerzy GutermanMattia PascoliniJayesh NathRobert W. Schlub
    • H01Q1/24H01Q7/00H01Q1/52
    • H01Q1/523H01Q1/2266
    • Electronic devices may be provided with antenna structures and antenna isolation element structures. An antenna array may be located within an electronic device. The antenna array may have multiple antennas and interposed antenna isolation element structures for isolating the antennas from each other. An antenna isolation element structure may have a dielectric carrier with a longitudinal axis. A sheet of conductive material may extend around the longitudinal axis to form a conductive loop structure. The loop structure in the antenna isolation element may have a gap that spans the sheet of conductive material parallel to the longitudinal axis. Electronic components may bridge the gap. Control circuitry may adjust the electronic components to tune the antenna isolation element.
    • 电子设备可以设置有天线结构和天线隔离元件结构。 天线阵列可以位于电子设备内。 天线阵列可以具有多个天线和插入的天线隔离元件结构,用于将天线彼此隔离。 天线隔离元件结构可以具有具有纵向轴线的介电载体。 导电材料片可以围绕纵向轴线延伸以形成导电环结构。 天线隔离元件中的环路结构可以具有跨越平行于纵向轴线的导电材料片的间隙。 电子元件可能弥合差距。 控制电路可以调整电子部件以调谐天线隔离元件。