会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 2. 发明申请
    • Tamper-resistant electronic circuit and module incorporating electrically conductive nano-structures
    • 具有防篡改电子电路和包含导电纳米结构的模块
    • US20110031982A1
    • 2011-02-10
    • US12806127
    • 2010-08-04
    • John LeonJames YamaguchiVolkan OzguzW. Eric Boyd
    • John LeonJames YamaguchiVolkan OzguzW. Eric Boyd
    • G01R27/28H02H3/08H05K7/00
    • H01L23/576H01L25/0657H01L2225/06517H01L2225/06527H01L2225/06541H01L2924/0002H01L2924/3011H01L2924/00
    • A device and method are disclosed comprising one or more electrically conductive nano-structures defined on one or more surfaces of a microelectronic circuit such as an integrated circuit die, microelectronic circuit package (such as a TSOP, BGA or other prepackaged IC) a stacked microelectronic circuit package, or on the surface of one or more layers in a stack of layers containing one or more ICs.In one embodiment, the electrically conductive nano-structure is in electrical connection with a monitoring circuit and acts as a “trip wire” to detect unauthorized tampering with the device or module. Such a monitoring circuit may include a power source such as an in-circuit or in-module battery and a “zeroization” circuit within the chip or package to erase the contents of a memory when the electrically conductive nano-structure is breached or altered. The device may be configured to blow one or more fuses or overcurrent protection devices when the electrically conductive nano-structure is breached or altered.In a further embodiment, one or more electrically conductive nano-structures are used to interconnect and reroute one or more electrical connections between one or more ICs (or dummy leads and vias) to create an “invisible” set of electrical connections on the chip or stack to obfuscate an attempt to reverse engineer the device, i.e., a set of connections that cannot be observed by standard test means such as by X-ray or conventional microscope.
    • 公开了一种器件和方法,其包括限定在微电子电路的一个或多个表面上的一个或多个导电纳米结构,例如集成电路管芯,微电子电路封装(例如TSOP,BGA或其它预封装IC)堆叠微电子 或者在包含一个或多个IC的层叠层中的一个或多个层的表面上。 在一个实施例中,导电纳米结构与监控电路电连接,并用作“跳闸线”,以检测未经授权的篡改设备或模块。 这样的监视电路可以包括诸如电路内或模块内电池的电源和芯片或封装内的“零化”电路,以在导电纳米结构被破坏或改变时擦除存储器的内容物。 该装置可以被配置为当导电纳米结构被破坏或改变时吹送一个或多个保险丝或过电流保护装置。 在另一个实施例中,使用一个或多个导电纳米结构来互连和重新路由一个或多个IC(或虚拟引线和通孔)之间的一个或多个电连接,以在芯片上产生“不可见”的电连接集合,或 堆叠以模糊化设备的反向工程,即通过X射线或常规显微镜的标准测试手段无法观察到的一组连接。