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    • 4. 发明授权
    • Methods, arrangements and systems for polarization-sensitive optical frequency domain imaging of a sample
    • 样品的偏振敏感光学频域成像的方法,布置和系统
    • US07742173B2
    • 2010-06-22
    • US11697012
    • 2007-04-05
    • Seok-Hyun YunJohannes F. De BoerGuillermo J. TearneyBrett Eugene Bouma
    • Seok-Hyun YunJohannes F. De BoerGuillermo J. TearneyBrett Eugene Bouma
    • G01B9/02
    • G01N21/4795G01B9/02002G01B9/02004G01B9/02011G01B9/02091G01B2290/70
    • Arrangements and methods are provided for obtaining data associated with a sample. For example, at least one first electro-magnetic radiation can be provided to a sample and at least one second electro-magnetic radiation can be provided to a reference (e.g., a non-reflective reference). A frequency of such radiation(s) can repetitively vary over time with a first characteristic period. In addition, a polarization state of the first electro-magnetic radiation, the second electro-magnetic radiation, a third electro-magnetic radiation (associated with the first radiation) or a fourth electro-magnetic radiation (associated with the second radiation) can repetitively vary over time with a second characteristic period which is shorter than the first period. The data for imaging at least one portion of the sample can be provided as a function of the polarization state. In addition or alternatively, the third and fourth electro-magnetic radiations can be combined so as to determine an axial reflectance profile of at least one portion of the sample.
    • 提供了用于获取与样本相关的数据的安排和方法。 例如,可以向样品提供至少一个第一电磁辐射,并且可以向参考(例如,非反射参考)提供至少一个第二电磁辐射。 这种辐射的频率可以在第一特征周期内随时间重复地变化。 此外,第一电磁辐射,第二电磁辐射,第三电磁辐射(与第一辐射相关联)或第四电磁辐射(与第二辐射相关联)的极化状态可以重复地 随着时间而变化,其具有比第一周期短的第二特征周期。 用于成像至少一部分样品的数据可以作为偏振态的函数提供。 另外或替代地,可以组合第三和第四电磁辐射,以便确定样品的至少一部分的轴向反射率分布。
    • 6. 发明申请
    • METHODS, ARRANGEMENTS AND SYSTEMS FOR POLARIZATION-SENSITIVE OPTICAL FREQUENCY DOMAIN IMAGING OF A SAMPLE
    • 方法,用于样品的偏振光敏频域成像的安排和系统
    • US20070236700A1
    • 2007-10-11
    • US11697012
    • 2007-04-05
    • Seok-Hyun YunJohannes F. De BoerGuillermo J. TearneyBrett Eugene Bouma
    • Seok-Hyun YunJohannes F. De BoerGuillermo J. TearneyBrett Eugene Bouma
    • G01B9/02
    • G01N21/4795G01B9/02002G01B9/02004G01B9/02011G01B9/02091G01B2290/70
    • Arrangements and methods are provided for obtaining data associated with a sample. For example, at least one first electro-magnetic radiation can be provided to a sample and at least one second electro-magnetic radiation can be provided to a reference (e.g., a non-reflective reference). A frequency of such radiation(s) can repetitively vary over time with a first characteristic period. In addition, a polarization state of the first electro-magnetic radiation, the second electro-magnetic radiation, a third electro-magnetic radiation (associated with the first radiation) or a fourth electro-magnetic radiation (associated with the second radiation) can repetitively vary over time with a second characteristic period which is shorter than the first period. The data for imaging at least one portion of the sample can be provided as a function of the polarization state. In addition or alternatively, the third and fourth electro-magnetic radiations can be combined so as to determine an axial reflectance profile of at least one portion of the sample.
    • 提供了用于获取与样本相关的数据的安排和方法。 例如,可以向样品提供至少一个第一电磁辐射,并且可以向参考(例如,非反射参考)提供至少一个第二电磁辐射。 这种辐射的频率可以在第一特征周期内随时间重复地变化。 此外,第一电磁辐射,第二电磁辐射,第三电磁辐射(与第一辐射相关联)或第四电磁辐射(与第二辐射相关联)的偏振状态可以重复地 随着时间而变化,其具有比第一周期短的第二特征周期。 用于成像至少一部分样品的数据可以作为偏振态的函数提供。 另外或替代地,可以组合第三和第四电磁辐射,以便确定样品的至少一部分的轴向反射率分布。