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    • 1. 发明授权
    • Process, arrangements and systems for providing frequency domain imaging of a sample
    • 用于提供样品频域成像的过程,布置和系统
    • US09364143B2
    • 2016-06-14
    • US13465580
    • 2012-05-07
    • Seok-Hyun YunJohannes F. de Boer
    • Seok-Hyun YunJohannes F. de Boer
    • A61B6/00A61B3/10A61B5/00G01N21/45G01N21/47
    • A61B3/102A61B3/0025A61B3/1233A61B3/14A61B5/0059A61B5/0066A61B5/418G01N21/45G01N21/4795
    • Exemplary apparatus, arrangement and method can be provided for obtaining information associated with an anatomical structure or sample using optical microscopy. A radiation can include first electromagnetic radiation(s) directed to an anatomical sample and at least one second electromagnetic radiation directed to a reference. A wavelength of the radiation can vary over time, and the wavelength can be shorter than approximately 1150 nm. An interference can be detected between third and forth radiations associated with the first, second and fourth radiation, respectively. At least one image corresponding to portion(s) of the sample can be generated using data associated with the interference. Source arrangement(s) can be provided which is configured to provide an electromagnetic radiation having a wavelength that varies over time. A period of a variation of the wavelength of the first electromagnetic radiation(s) can be shorter than 1 millisecond, and the wavelength can be shorter than approximately 1150 nm.
    • 可以提供示例性的装置,布置和方法,以使用光学显微镜获得与解剖结构或样品相关联的信息。 辐射可以包括指向解剖样品的第一电磁辐射和指向参考的至少一个第二电磁辐射。 辐射的波长可以随时间变化,并且波长可以短于约1150nm。 可以分别在与第一,第二和第四辐射相关联的第三和第四辐射之间检测干扰。 可以使用与干扰相关联的数据来生成对应于样本的一部分的至少一个图像。 可以提供源装置,其配置为提供具有随时间变化的波长的电磁辐射。 第一电磁辐射的波长变化的周期可以短于1毫秒,并且波长可以短于约1150nm。
    • 3. 发明申请
    • PROCESS, ARRANGEMENTS AND SYSTEMS FOR PROVIDING FREQUENCY DOMAIN IMAGING OF A SAMPLE
    • 用于提供样品的频域成像的过程,安排和系统
    • US20120316434A1
    • 2012-12-13
    • US13465580
    • 2012-05-07
    • Seok-Hyun YunJohannes F. de Boer
    • Seok-Hyun YunJohannes F. de Boer
    • A61B6/02
    • A61B3/102A61B3/0025A61B3/1233A61B3/14A61B5/0059A61B5/0066A61B5/418G01N21/45G01N21/4795
    • Exemplary apparatus, arrangement and method can be provided for obtaining information associated with an anatomical structure or sample using optical microscopy. A radiation can include first electromagnetic radiation(s) directed to an anatomical sample and at least one second electromagnetic radiation directed to a reference. A wavelength of the radiation can vary over time, and the wavelength can be shorter than approximately 1150 nm. An interference can be detected between third and forth radiations associated with the first, second and fourth radiation, respectively. At least one image corresponding to portion(s) of the sample can be generated using data associated with the interference. Source arrangement(s) can be provided which is configured to provide an electromagnetic radiation having a wavelength that varies over time. A period of a variation of the wavelength of the first electromagnetic radiation(s) can be shorter than 1 millisecond, and the wavelength can be shorter than approximately 1150 nm.
    • 可以提供示例性的装置,布置和方法,以使用光学显微镜获得与解剖结构或样品相关联的信息。 辐射可以包括指向解剖样品的第一电磁辐射和指向参考的至少一个第二电磁辐射。 辐射的波长可以随时间变化,并且波长可以短于约1150nm。 可以分别在与第一,第二和第四辐射相关联的第三和第四辐射之间检测干扰。 可以使用与干扰相关联的数据来生成对应于样本的一部分的至少一个图像。 可以提供源装置,其配置为提供具有随时间变化的波长的电磁辐射。 第一电磁辐射的波长变化的周期可以短于1毫秒,并且波长可以短于约1150nm。
    • 4. 发明授权
    • Process, arrangements and systems for providing frequency domain imaging of a sample
    • 用于提供样品频域成像的过程,布置和系统
    • US08175685B2
    • 2012-05-08
    • US11744287
    • 2007-05-04
    • Seok-Hyun YunJohannes F. de Boer
    • Seok-Hyun YunJohannes F. de Boer
    • A61B6/00
    • A61B3/102A61B3/0025A61B3/1233A61B3/14A61B5/0059A61B5/0066A61B5/418G01N21/45G01N21/4795
    • Apparatus, arrangement and method are provided for obtaining information associated with an anatomical structure or a sample using optical microscopy. For example, a radiation can be provided which includes at least one first electromagnetic radiation directed to be provided to an anatomical sample and at least one second electro-magnetic radiation directed to a reference. A wavelength of the radiation can vary over time, and the wavelength is shorter than approximately 1150 nm. An interference can be detected between at least one third radiation associated with the first radiation and at least one fourth radiation associated with the second radiation. At least one image corresponding to at least one portion of the sample can be generated using data associated with the interference. In addition, at least one source arrangement can be provided which is configured to provide an electromagnetic radiation which has a wavelength that varies over time. A period of a variation of the wavelength of the first electromagnetic radiation can be shorter than 1 millisecond, and the wavelength is shorter than approximately 1150 nm.
    • 提供了用于使用光学显微镜获得与解剖结构或样品相关联的信息的装置,布置和方法。 例如,可以提供辐射,其包括至少一个被引导到解剖样品的第一电磁辐射和指向参考的至少一个第二电磁辐射。 辐射的波长可随时间变化,波长比约1150nm短。 可以在与第一辐射相关联的至少一个第三辐射与与第二辐射相关联的至少一个第四辐射之间检测干扰。 可以使用与干扰相关联的数据来生成对应于样本的至少一部分的至少一个图像。 此外,可以提供至少一个源装置,其被配置为提供具有随时间变化的波长的电磁辐射。 第一电磁辐射的波长变化的周期可以短于1毫秒,并且波长比约1150nm短。