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    • 4. 发明申请
    • Substrate illumination and inspection system
    • 基板照明和检查系统
    • US20070258085A1
    • 2007-11-08
    • US11417297
    • 2006-05-02
    • Michael RobbinsPaul ForderhaseJoel BaileyKevin Nguyen
    • Michael RobbinsPaul ForderhaseJoel BaileyKevin Nguyen
    • G01N21/00
    • G01N21/9503G01N21/4738
    • A substrate illumination and inspection system provides for illuminating and inspecting a substrate particularly the substrate edge. The system uses a light diffuser with a plurality of lights disposed at its exterior or interior for providing uniform diffuse illumination of a substrate. An optic and imaging system exterior of the light diffuser are used to inspect the plurality of surfaces of the substrate including specular surfaces. The optic is held at an angle from a surface normal to avoid reflective artifacts from the specular surface of the substrate. The optic can be rotated radially relative to a center point of the substrate edge to allow for focused inspection of all surfaces of the substrate edge. The plurality of lights can modulate color and intensity of light to enhance inspection of the substrate for defects.
    • 衬底照明和检查系统提供用于照明和检查衬底,特别是衬底边缘。 该系统使用具有设置在其外部或内部的多个光的光漫射器,用于提供衬底的均匀漫射照明。 光扩散器的光学和成像系统外部用于检查包括镜面的基板的多个表面。 光学元件保持与表面法线成一定角度,以避免来自基板的镜面的反射伪影。 光学元件可以相对于基板边缘的中心点径向旋转,以允许对基板边缘的所有表面进行聚焦检查。 多个光可以调制光的颜色和强度,以增强基板对缺陷的检查。
    • 8. 发明申请
    • Automatically detecting and routing of test signals
    • 自动检测和路由测试信号
    • US20060200715A1
    • 2006-09-07
    • US10548993
    • 2004-02-28
    • Daniel AveryJoel Bailey
    • Daniel AveryJoel Bailey
    • G01R31/28
    • G01R31/318558H04L43/50
    • A circuit testing approach involves configurable switch control for automatically detecting and routing test signals along a plurality of test circuit paths (240, 242, 244). According to an example embodiment of the present invention, a microcontroller (205) is programmed to monitor input nodes (210) using an interrupt routine for automatically detecting test signals (i.e., digital and/or JTAG test signals). Upon the detection of the test signals, the microcontroller controls a controllable switch (220) for routing the test data along one of the test circuit paths. With this approach, manual switching for routing the test signals is not necessary, which has been found to be useful in applications where access to the circuit paths for switching is difficult or impossible.
    • 电路测试方法涉及可配置的开关控制,用于沿多个测试电路路径(240,242,244)自动检测和路由测试信号。 根据本发明的示例实施例,微控制器(205)被编程为使用用于自动检测测试信号(即,数字和/或JTAG测试信号)的中断程序监视输入节点(210)。 在检测到测试信号时,微控制器控制用于沿着测试电路路径之一路由测试数据的可控开关(220)。 使用这种方法,不需要用于路由测试信号的手动切换,这已经被发现在对于切换电路路径的访问困难或不可能的应用中是有用的。
    • 9. 发明申请
    • Graphical user interface and approach therefor
    • 图形用户界面及其方法
    • US20050197798A1
    • 2005-09-08
    • US10794991
    • 2004-03-05
    • Daniel AveryMichael SmithJoel BaileyJerry Schumacher
    • Daniel AveryMichael SmithJoel BaileyJerry Schumacher
    • G06F7/38
    • G06F3/0481
    • A circuit testing and control approach involves configurable switch control for automatically detecting and routing test signals along a plurality of test circuit paths. According to an example embodiment of the present invention, graphical user interface (GUI) (240) includes stored computer-executable code that, when executed, causes a micro-computer circuit to send configuration signals to a microcontroller (220). A configurable circuit (215) coupled to the microcontroller is then configured by the microcontroller, in response to the configuration signals, for routing test signals using controllable switches. In one implementation, the configurable circuit includes circuits on inter-connectable circuit boards (210, 250, 260), with sense nodes for detecting the presence of an inter-connectable circuit board coupled to another. In response to the detected presence (or lack thereof), the controllable switches control the routing of the test signals between the inter-connectable circuit boards. The configuration signals are used for one or more of actively controlling the microcontroller, programming the microcontroller (e.g., storing program code therein) or requesting data from the microcontroller. With these approaches, automatic switching of test signal paths, on an individual circuit and in connection with other circuits, is achieved without necessarily physically accessing the configurable circuit.
    • 电路测试和控制方法涉及可配置的开关控制,用于沿多个测试电路路径自动检测和路由测试信号。 根据本发明的示例实施例,图形用户界面(GUI)(240)包括存储的计算机可执行代码,其在被执行时使微计算机电路向微控制器(220)发送配置信号。 然后,耦合到微控制器的可配置电路(215)由微控制器响应于配置信号被配置用于使用可控开关路由测试信号。 在一个实现中,可配置电路包括可互连电路板(210,250,260)上的电路,其中感测节点用于检测耦合到另一电路板的可连接电路板的存在。 响应于检测到的存在(或不存在),可控开关控制可连接的电路板之间的测试信号的路由。 配置信号用于主动控制微控制器,编程微控制器(例如,其中存储程序代码)或从微控制器请求数据的一个或多个。 利用这些方法,实现了测试信号路径在各个电路上以及与其它电路的连接的自动切换,而不必物理地访问可配置电路。