会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 2. 发明授权
    • Hot-carrier device degradation modeling and extraction methodologies
    • 热载体降解建模和提取方法
    • US07567891B1
    • 2009-07-28
    • US09969185
    • 2001-09-27
    • Zhihong LiuLifeng WuJeong Y. ChoiPing ChenAlvin I. ChenGang Zhang
    • Zhihong LiuLifeng WuJeong Y. ChoiPing ChenAlvin I. ChenGang Zhang
    • G06F7/60G06F17/50G06F9/45G01R15/00G01R27/28G01R27/26H03K19/20H03K19/094
    • G06F17/5036G01R31/2848G06F2217/78
    • The present invention is directed to a number of improvements in methods for hot-carrier device degradation modeling and extraction. Several improvements are presented for the improvement of building device degradation models, including allowing the user to select a device parameter used to build the device degradation model independent of the device parameter selected. The user can also select the functional relation between stress time and degradation level. To further improve accuracy, multiple acceleration parameters can be used to account for different regions of the degradation process. Analytical functions may be used to represent aged device model parameters, either directly or by fitting measured device parameters versus device age values, allowing devices with different age values to share the same device model. The concept of binning is extended to include device degradation. In addition to a binning based on device width and length, age is added. In an exemplary embodiment, only devices with minimum channel length have degraded models constructed. The present invention also allows the degradation of one device parameter to be determined based on an age value derived from another parameter. In yet another aspect, a degraded device is modeled as a fresh device with a voltage source connected to a terminal.
    • 本发明涉及用于热载体装置降解建模和提取的方法的许多改进。 提出了改进建筑设备劣化模型的几个改进,包括允许用户选择用于构建设备退化模型的设备参数,而不依赖于所选择的设备参数。 用户还可以选择应力时间与劣化水平之间的功能关系。 为了进一步提高精度,可以使用多个加速参数来解释退化过程的不同区域。 分析功能可以直接表示老化的设备模型参数,也可以通过拟合测量的设备参数与设备寿命值进行比较,从而允许具有不同年龄值的设备共享相同的设备型号。 分箱的概念被扩展到包括设备退化。 除了基于设备宽度和长度的分类,还添加了年龄。 在示例性实施例中,只有具有最小信道长度的设备具有构造的退化模型。 本发明还允许基于从另一参数导出的年龄值来确定一个设备参数的劣化。 在另一方面,劣化设备被建模为具有连接到终端的电压源的新设备。
    • 3. 发明申请
    • Hot-Carrier Device Degradation Modeling and Extraction Methodologies
    • 热载体装置降解建模和提取方法
    • US20090299716A1
    • 2009-12-03
    • US12486191
    • 2009-06-17
    • Zhihong LiuLifeng WuJeong Y. ChoiPing ChenAlvin I. ChenGang Zhang
    • Zhihong LiuLifeng WuJeong Y. ChoiPing ChenAlvin I. ChenGang Zhang
    • G06F17/50G01R31/26
    • G06F17/5036G01R31/2848G06F2217/78
    • The present invention is directed to a number of improvements in methods for hot-carrier device degradation modeling and extraction. Several improvements are presented for the improvement of building device degradation models, including allowing the user to select a device parameter used to build the device degradation model independent of the device parameter selected. The user can also select the functional relation between stress time and degradation level. To further improve accuracy, multiple acceleration parameters can be used to account for different regions of the degradation process. Analytical functions may be used to represent aged device model parameters, either directly or by fitting measured device parameters versus device age values, allowing devices with different age values to share the same device model. The concept of binning is extended to include device degradation. In addition to a binning based on device width and length, age is added. In an exemplary embodiment, only devices with minimum channel length have degraded models constructed. The present invention also allows the degradation of one device parameter to be determined based on an age value derived from another parameter. In yet another aspect, a degraded device is modeled as a fresh device with a voltage source connected to a terminal.
    • 本发明涉及用于热载体装置降解建模和提取的方法的许多改进。 提出了改进建筑设备劣化模型的几个改进,包括允许用户选择用于构建设备退化模型的设备参数,而不依赖于所选择的设备参数。 用户还可以选择应力时间与劣化水平之间的功能关系。 为了进一步提高精度,可以使用多个加速参数来解释退化过程的不同区域。 分析功能可以直接表示老化的设备模型参数,也可以通过拟合测量的设备参数与设备寿命值进行比较,从而允许具有不同年龄值的设备共享相同的设备型号。 分箱的概念被扩展到包括设备退化。 除了基于设备宽度和长度的分类,还添加了年龄。 在示例性实施例中,只有具有最小信道长度的设备具有构造的退化模型。 本发明还允许基于从另一参数导出的年龄值来确定一个设备参数的劣化。 在另一方面,劣化设备被建模为具有连接到终端的电压源的新设备。
    • 4. 发明授权
    • Method and apparatus for modeling devices having different geometries
    • 用于建模具有不同几何形状的装置的方法和装置
    • US07263477B2
    • 2007-08-28
    • US10457945
    • 2003-06-09
    • Ping ChenZhihong Liu
    • Ping ChenZhihong Liu
    • G06F17/50
    • G06F17/5036
    • The present invention includes a method for modeling devices having different geometries, in which a range of interest for device geometrical variations is divided into a plurality of subregions each corresponding to a subrange of device geometrical variations. The plurality of subregions include a first type of subregions and a second type of subregions. The first or second type of subregions include one or more subregions. A regional global model is generated for each of the first type of subregions and a binning model is generated for each of the second type of subregions. The regional global model for a subregion uses one set of model parameters to comprehend the subrange of device geometrical variations corresponding to the G-type subregion. The binning model for a subregion includes binning parameters to provide continuity of the model parameters when device geometry varies across two different subregions.
    • 本发明包括一种用于建模具有不同几何形状的装置的方法,其中将装置几何变化的感兴趣的范围分成多个子区域,每个子区域对应于装置几何变化的子范围。 多个子区域包括第一类型的子区域和第二类型的子区域。 第一或第二类型的子区域包括一个或多个子区域。 为每个第一类型的子区域生成区域全局模型,并且为第二类型的子区域中的每一个生成分类模型。 一个次区域的区域全球模型使用一组模型参数来理解与G型子区域相对应的设备几何变化的子范围。 一个子区域的分箱模型包括分箱参数,以便在两个不同子区域之间设备几何变化时提供模型参数的连续性。
    • 5. 发明申请
    • Method and apparatus for modeling devices having different geometries
    • 用于建模具有不同几何形状的装置的方法和装置
    • US20050027501A1
    • 2005-02-03
    • US10457945
    • 2003-06-09
    • Ping ChenZhihong Liu
    • Ping ChenZhihong Liu
    • G06F17/50
    • G06F17/5036
    • The present invention includes a method for modeling devices having different geometries, in which a range of interest for device geometrical variations is divided into a plurality of subregions each corresponding to a subrange of device geometrical variations. The plurality of subregions include a first type of subregions and a second type of subregions. The first or second type of subregions include one or more subregions. A regional global model is generated for each of the first type of subregions and a binning model is generated for each of the second type of subregions. The regional global model for a subregion uses one set of model parameters to comprehend the subrange of device geometrical variations corresponding to the G-type subregion. The binning model for a subregion includes binning parameters to provide continuity of the model parameters when device geometry varies across two different subregions.
    • 本发明包括一种用于建模具有不同几何形状的装置的方法,其中将装置几何变化的感兴趣的范围分成多个子区域,每个子区域对应于装置几何变化的子范围。 多个子区域包括第一类型的子区域和第二类型的子区域。 第一或第二类型的子区域包括一个或多个子区域。 为每个第一类型的子区域生成区域全局模型,并且为第二类型的子区域中的每一个生成分类模型。 一个次区域的区域全球模型使用一组模型参数来理解与G型子区域相对应的设备几何变化的子范围。 一个子区域的分箱模型包括分箱参数,以便在两个不同子区域之间设备几何变化时提供模型参数的连续性。
    • 8. 发明授权
    • Stain detection
    • 污渍检测
    • US08805025B2
    • 2014-08-12
    • US13436078
    • 2012-03-30
    • Ping ChenChao HeGary Ross
    • Ping ChenChao HeGary Ross
    • G06T7/00G07D11/00
    • G07D7/187
    • A method of detecting staining on a media item is described. An example method includes receiving an image of the media item, including a plurality of pixels having different intensity values within a range of intensity values, applying central weighting to the received image, applying a threshold to each pixel in the centrally-weighted image to transform each pixel to a binary value, comparing a pixel in the evaluation image with a pixel in a binary reference image to create a difference image including (i) a stain pixel at each spatial location in which a pixel in the evaluation image has a low intensity pixel and the corresponding pixel in the binary reference image has a high intensity pixel, and (ii) a non-stain pixel at all other spatial locations. The media item is identified as stained in the event that the difference image meets a staining criterion.
    • 描述了在媒体项目上检测染色的方法。 一种示例性方法包括接收媒体项目的图像,包括在强度值范围内具有不同强度值的多个像素,对接收到的图像应用中央加权,向中央加权图像中的每个像素应用阈值以变换 每个像素为二进制值,将评估图像中的像素与二进制参考图像中的像素进行比较,以产生差分图像,其包括(i)评估图像中的像素具有低强度的每个空间位置处的污点像素 像素和二进制参考图像中的对应像素具有高强度像素,以及(ii)所有其它空间位置处的非污点像素。 在差异图像满足染色标准的情况下,媒体项目被识别为染色。
    • 9. 发明授权
    • Board-shaped heat Dissipating method of manufacturing
    • 板状散热制造方法
    • US08756810B2
    • 2014-06-24
    • US13355029
    • 2012-01-20
    • Ping ChenShu-Chun Yu
    • Ping ChenShu-Chun Yu
    • B21D53/02B23P19/02F28D15/02
    • F28D15/0275F28F2275/02F28F2275/12Y10T29/4935Y10T29/49353Y10T29/49364Y10T29/49393Y10T29/49885Y10T29/49945
    • A board-shaped heat dissipating device includes a board body having a plane face with a recess formed thereon, a heat conducting element fitted in the recess, at least one groove formed on any one of the board body and the heat conducting element, and at least one heat pipe pressed into the groove to flush with an open side of the groove. After the heat pipe is pressed into the groove and the heat conducting element is firmly fitted in the recess, portions of the heat conducting element that are higher than the plane face are removed through a cut operation, so that the heat conducting element is flush with the plane face of the board body to reduce the space occupied by the heat dissipating device. With the above arrangements, the problem of thermal resistance can be avoided and upgraded overall heat dissipation efficiency can be achieved.
    • 一种板状散热装置,包括具有形成在其上的凹部的平面的板主体,嵌合在凹部中的导热元件,形成在板主体和导热元件中的任一个上的至少一个槽, 至少一个热管被压入槽中以与槽的开放侧齐平。 在热管被压入槽中并且导热元件牢固地装配在凹部中之后,通过切割操作去除导热元件高于平面的部分,使得导热元件与 板体的平面减少了散热装置占用的空间。 通过上述布置,可以避免热阻的问题,并且可以提高总的散热效率。