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1. 发明授权

US08358465B2 System and method for displaying three-dimensional image 有权
标题翻译：用于显示三维图像的系统和方法
公开(公告)号：US08358465B2
公开(公告)日：2013-01-22
申请号：US11545762
申请日：2006-10-11
申请人： Jin Wook Chang , Kyoung Il Lee , Tae Soo Park
发明人： Jin Wook Chang , Kyoung Il Lee , Tae Soo Park
IPC分类号： G02B27/22
CPC分类号： H04N13/317 , H04N13/31
摘要： A three-dimensional (3D) display system and a method for use in the same are disclosed. The 3D display system includes: a display panel which includes a plurality of pixels, applies several-direction parallax image signals to the pixels according to regulations of a specific mode, and displays the several-direction parallax image signals; and a filter which is located at at least one of a front part and a rear part of the display panel, forms a predetermined barrier pattern according to regulations of the specific mode to implement a three-dimensional image, and separates the several-direction parallax image signals from each other.
摘要翻译：公开了一种三维（3D）显示系统及其使用方法。 3D显示系统包括：包括多个像素的显示面板，根据特定模式的规定向像素施加多个方向的视差图像信号，并显示多个方向的视差图像信号; 并且位于显示面板的前部和后部中的至少一个的过滤器根据特定模式的规定形成预定的屏障图案以实现三维图像，并且将多个方向的视差图像信号彼此。

2. 发明申请

US20080016953A1 ATOMIC FORCE MICROSCOPE CANTILEVER INCLUDING FIELD EFFECT TRANSISTOR AND METHOD FOR MANUFACTURING THE SAME 失效
标题翻译：含有场效应晶体管的原子力显微镜及其制造方法
公开(公告)号：US20080016953A1
公开(公告)日：2008-01-24
申请号：US11614489
申请日：2006-12-21
申请人： Moon Suhk Suh , Jin-Koog Shin , Churl Seung Lee , Kyoung Il Lee
发明人： Moon Suhk Suh , Jin-Koog Shin , Churl Seung Lee , Kyoung Il Lee
IPC分类号： G01B5/28
CPC分类号： G01Q60/30 , G01Q60/38
摘要： The present invention relates to an AFM(atomic force microscope) cantilever including a field effect transistor(FET) and a method for manufacturing the same; and, more particularly, to a method for manufacturing an AFM cantilever including an FET formed by a photolithography process, wherein an effective channel length of the FET is a nono-scale. Therefore, The present invention can easily implement a simulation for manufacturing the AFM cantilever including he FET by accurately controlling the effective channel length. And also, the present invention can manufacturer the AFM cantilever including the FET having the effective channel ranging several tens to several hundreds nanometers by applying the low price photolithography device, thereby enhancing an accuracy and yield of the manufacturing process and drastically reducing process costs.
摘要翻译：本发明涉及包括场效应晶体管（FET）的AFM（原子力显微镜）悬臂及其制造方法; 更具体地，涉及一种制造包括通过光刻工艺形成的FET的AFM悬臂的方法，其中FET的有效沟道长度是非标尺的。因此，通过精确地控制有效通道长度，本发明可以容易地实现用于制造包括他的AFM的AFM悬臂的模拟。而且，本发明还可以通过应用低价光刻装置来制造包括具有几十到几百纳米的有效通道的AFM的AFM悬臂，从而提高制造工艺的精度和产量，并显着降低工艺成本。

3. 发明授权

US06304229B1 Electromagnetic wave detecting device incorporating therein a thermocouple 有权
标题翻译：其中结合有热电偶的电磁波检测装置
公开(公告)号：US06304229B1
公开(公告)日：2001-10-16
申请号：US09614278
申请日：2000-07-12
申请人： Dae Sung Lee , Se Hong Chang , Kyoung Il Lee , Sang Mo Shin
发明人： Dae Sung Lee , Se Hong Chang , Kyoung Il Lee , Sang Mo Shin
IPC分类号： G01R2104
CPC分类号： G01R29/0878
摘要： An electromagnetic wave detecting device includes a dipole antenna having a pair of disjointed arms for receiving an electromagnetic wave and a thermocouple having a first and a second leg of two dissimilar conductors, for detecting the electromagnetic wave received by the arms of the antenna.
摘要翻译：电磁波检测装置包括具有用于接收电磁波的一对不相交臂的偶极天线和具有两个不同导体的第一和第二支腿的热电偶，用于检测由天线的臂接收的电磁波。

4. 发明申请

US20080011066A1 ATOMIC FORCE MICROSCOPE CANTILEVER AND METHOD FOR MANUFACTURING THE SAME 审中-公开
标题翻译：原子力显微镜及其制造方法
公开(公告)号：US20080011066A1
公开(公告)日：2008-01-17
申请号：US11614492
申请日：2006-12-21
申请人： Moon Suhk Suh , Jin-Koog Shin , Churl Seung Lee , Kyoung Il Lee
发明人： Moon Suhk Suh , Jin-Koog Shin , Churl Seung Lee , Kyoung Il Lee
IPC分类号： G01B5/28
CPC分类号： G01Q60/38 , G01Q70/12
摘要： The present invention relates to various types of atomic force microscope (AFM) cantilevers formed by using a photolithography process and an etching process and a method for manufacturing the same, the AFM cantilever includes a handling unit made of a semiconductor substrate, a cantilever unit extendedly formed on a bottom surface of the handling unit in a shape of a rod, a probe unit formed in a shape of a vertically protruded peak by being extendedly formed on one side surface of the cantilever unit and a probe being in contact with a surface of an object to be analyzed by being formed on the peak of the probe unit. Therefore, the present invention has an advantage that the probe of several hundred nanometers can easily formed through a general photolithography process as well as it can easily obtain a natural resonance frequency of the designed cantilever by easily setting a thickness of the cantilever member.
摘要翻译：本发明涉及通过使用光刻工艺和蚀刻工艺形成的各种原子力显微镜（AFM）悬臂及其制造方法，该AFM悬臂包括由半导体衬底制成的处理单元，延伸的悬臂单元在所述处理单元的底面上形成为杆的形状，通过在所述悬臂单元的一个侧面上延伸地形成为垂直突出的形状的探针单元和与所述悬臂单元的表面接触的探针通过形成在探针单元的峰上来分析的物体。因此，本发明的优点在于，通过通常的光刻工艺容易地形成数百纳米的探针，并且通过容易地设定悬臂构件的厚度，可以容易地获得设计的悬臂的固有共振频率。

5. 发明授权

US07095070B2 Method for fabricating Bi thin film and device using the same 有权
标题翻译：制造Bi薄膜的方法及使用其的装置
公开(公告)号：US07095070B2
公开(公告)日：2006-08-22
申请号：US10798447
申请日：2004-03-12
申请人： Woo Young Lee , Kyung Ho Shin , Suk Hee Han , Joon Yeon Chang , Hi Jung Kim , Dal Young Kim , Kwan Hyi Lee , Kyoung Il Lee , Min Hong Jeun
发明人： Woo Young Lee , Kyung Ho Shin , Suk Hee Han , Joon Yeon Chang , Hi Jung Kim , Dal Young Kim , Kwan Hyi Lee , Kyoung Il Lee , Min Hong Jeun
IPC分类号： H01L31/062 , H01L21/00
CPC分类号： H01F10/1936 , C25D3/54 , C25D5/50 , G11C11/14 , H01F1/401 , H01F41/18 , H01F41/26 , H01L43/12
摘要： In a method for fabricating a Bi thin film having a great MR (magnetoresistance) at room temperature and a method for fabricating a spintronics device using the same, the Bi thin film is fabricated by an electrodepostiting method and a sputtering method and has very great MR characteristics at room temperature, and it can be applied to various spintronics devices.
摘要翻译：在室温下具有大的MR（磁阻）的Bi薄膜的制造方法以及使用该Bi薄膜的自旋电子学装置的制造方法中，Bi薄膜通过电沉积法和溅射法制造，具有非常大的MR 在室温下的特性，并且可以应用于各种自旋电子器件。

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