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    • 5. 发明授权
    • Memristors with insulation elements and methods for fabricating the same
    • 具有绝缘元件的忆阻器及其制造方法
    • US08008648B2
    • 2011-08-30
    • US12509299
    • 2009-07-24
    • Alexandre M. BratkovskiQiangfei Xia
    • Alexandre M. BratkovskiQiangfei Xia
    • H01L29/06
    • H01L45/08H01L27/2463H01L45/1233H01L45/1246H01L45/1273H01L45/146H01L45/147H01L45/148Y10S438/90
    • Embodiments of the present invention are directed to nanoscale memristor devices that provide nonvolatile memristive switching. In one embodiment, a memristor device comprises an active region disposed between a first electrode and a second electrode. The device includes a first insulation element disposed between the first electrode and an outer portion of a first surface of the active region. The first insulation element is configured with one or more opening through which the first electrode makes physical contact with the active region. The device also includes a second insulation element disposed between the second electrode and an outer portion of a second surface of the active region. The second insulation element is configured with one or more opening through which the second electrode makes physical contact with the second surface.
    • 本发明的实施例涉及提供非易失性忆阻转换的纳米级忆阻器装置。 在一个实施例中,忆阻器装置包括设置在第一电极和第二电极之间的有源区。 该装置包括设置在第一电极和有源区域的第一表面的外部之间的第一绝缘元件。 第一绝缘元件配置有一个或多个开口,第一电极通过该开口与活性区域物理接触。 该装置还包括设置在第二电极和有源区域的第二表面的外部之间的第二绝缘元件。 第二绝缘元件配置有一个或多个开口,第二电极通过该开口与第二表面物理接触。