专利快速检索-快速检索全球专利，免费商用专利数据库-IPRDB

1. 发明授权

US06650130B1 Integrated circuit device defect detection method and apparatus employing light emission imaging 有权
标题翻译：采用发光成像的集成电路器件缺陷检测方法和装置
公开(公告)号：US06650130B1
公开(公告)日：2003-11-18
申请号：US09386572
申请日：1999-08-31
申请人： Jeffrey A. Kash , Phillip J. Nigh , David P. Vallet
发明人： Jeffrey A. Kash , Phillip J. Nigh , David P. Vallet
IPC分类号： G01R31303
CPC分类号： G01R31/311
摘要： A method of and apparatus (10) for detecting one or more defects (130) in a plurality of chips (110) on a wafer (40). The method comprises a first step of simultaneously providing electrical power to the plurality of chips, thereby generating one or more light signals (120) corresponding to the one or more defects in the plurality of chips. The second step is simultaneously forming an image (150) of the plurality of chips so as to simultaneously detect the one or more light signals. The apparatus (10) for carrying out the method comprises electrical probes (30) for providing electrical power to the plurality of chips, a detector (60) to detect the one or more light signals emitted by the chips as a result of electrical power interacting with the one or more defects, and an imaging system (50) arranged so as to form an image of the plurality of chips, including the light signals, onto the detection surface (64).
摘要翻译：一种用于检测晶片（40）上的多个芯片（110）中的一个或多个缺陷（130）的方法和装置（10）。该方法包括同时向多个芯片提供电力的第一步骤，从而产生对应于多个芯片中的一个或多个缺陷的一个或多个光信号（120）。第二步骤同时形成多个芯片的图像（150），以便同时检测一个或多个光信号。用于执行该方法的装置（10）包括用于向多个芯片提供电力的电探测器（30），检测器（60），用于检测由于电力相互作用而由芯片发射的一个或多个光信号具有一个或多个缺陷，以及成像系统（50），被布置成在检测表面（64）上形成包括光信号的多个芯片的图像。

2. 发明授权

US08805126B2 Photonic modulator with forward-and reverse-biased diodes for separate tuning and modulating elements 有权
标题翻译：具有正向和反向偏置二极管的光子调制器，用于单独的调谐和调制元件
公开(公告)号：US08805126B2
公开(公告)日：2014-08-12
申请号：US13588871
申请日：2012-08-17
申请人： Benjamin G. Lee , Jeffrey A. Kash , Alexander V. Rylyakov , Clint L. Schow
发明人： Benjamin G. Lee , Jeffrey A. Kash , Alexander V. Rylyakov , Clint L. Schow
IPC分类号： G02F1/225
CPC分类号： G02F1/0121 , G02F1/025 , G02F1/2257
摘要： A method and structure for a modulator which includes a forward-biased diode optimized for power and area to perform a tuning function, and a reverse-biased diode optimized for speed to perform a modulation function.
摘要翻译：一种用于调制器的方法和结构，其包括针对功率和面积优化的正向偏置二极管以执行调谐功能，以及针对速度进行优化的反向偏置二极管以执行调制功能。

3. 发明授权

US07474815B2 Interconnecting (mapping) a two-dimensional optoelectronic (OE) device array to a one-dimensional waveguide array 有权
标题翻译：将二维光电（OE）器件阵列互连（映射）到一维波导阵列
公开(公告)号：US07474815B2
公开(公告)日：2009-01-06
申请号：US11374777
申请日：2006-03-14
申请人： Russell A. Budd , Punit P. Chiniwalla , John A. Guckenberger , Jeffrey A. Kash , Jeremy D. Schaub , Michael Tan , Jeannine M. Trewhella , Garry Trott
发明人： Russell A. Budd , Punit P. Chiniwalla , John A. Guckenberger , Jeffrey A. Kash , Jeremy D. Schaub , Michael Tan , Jeannine M. Trewhella , Garry Trott
IPC分类号： G02B6/12
CPC分类号： G02B6/43 , G02B6/42 , G02B6/4214 , G02B6/4246
摘要： For integrated circuits including circuit packaging and circuit communication technologies provision is made for a method of interconnecting or mapping a two-dimensional optoelectronic (OE) device array to a one-dimensional waveguide array. Also provided is an arrangement for the interconnecting or mapping of a two-dimensional optoelectronic (OE) device array to a one-dimensional waveguide array.
摘要翻译：对于包括电路封装和电路通信技术的集成电路，提供了将二维光电（OE）器件阵列互连或映射到一维波导阵列的方法。还提供了用于将二维光电（OE）器件阵列互连或映射到一维波导阵列的布置。

4. 发明授权

US07791087B2 Device for defeating reverse engineering of integrated circuits by optical means 失效
标题翻译：用于通过光学方式消除集成电路逆向工程的装置
公开(公告)号：US07791087B2
公开(公告)日：2010-09-07
申请号：US12610808
申请日：2009-11-02
申请人： Jeffrey A. Kash , James C. Tsang , Daniel R. Knebel
发明人： Jeffrey A. Kash , James C. Tsang , Daniel R. Knebel
IPC分类号： H01L27/15
CPC分类号： H01L23/576 , G01R31/311 , G01R31/31719 , H01L23/573 , H01L27/02 , H01L27/0207 , H01L2924/0002 , Y10S257/922 , H01L2924/00
摘要： An integrated circuit and method are provided for preventing reverse engineering by monitoring light emissions emitted from transistors and such electrically active devices in the integrated circuit. The method prevents, in an integrated circuit, a pattern of light emitted from at least one active device in the integrated circuit from being detected external to the integrated circuit by fading the light emitted from the at least one active device in the integrated circuit and that is emitted external to the integrated circuit. Bright light emission emitted in substantial close proximity to the at least one active device in the integrated circuit, and emitted external to the integrated circuit, fades a pattern of light emission emitted from the at least one active device.
摘要翻译：提供了一种用于通过监视从集成电路中的晶体管和这种电活动器件发射的光发射来防止逆向工程的集成电路和方法。该方法在集成电路中防止从集成电路中的至少一个有源器件发射的光的图案通过使从集成电路中的至少一个有源器件发射的光衰减而在集成电路外部被检测到在集成电路外部被检测，并且以及从集成电路中的至少一个有源器件发出的光的衰减，以及在集成电路外部发射。在集成电路中实质上非常接近于至少一个有源器件发射并且被发射到集成电路外部的明亮的发光使得从至少一个有源器件发射的发光模式变淡。

5. 发明申请

US20080205817A1 INTERCONNECTING (MAPPING) A TWO-DIMENSIONAL OPTOELECTRONIC (OE) DEVICE ARRAY TO A ONE-DIMENSIONAL WAVEGUIDE ARRAY 有权
标题翻译：互连（映射）二维光电（OE）器件阵列到一维波形阵列
公开(公告)号：US20080205817A1
公开(公告)日：2008-08-28
申请号：US12117803
申请日：2008-05-09
申请人： Russell A. Budd , Punit P. Chiniwalla , John A. Guckenberger , Jeffrey A. Kash , Jeremy D. Schaub , Michael Tan , Jeannine M. Trewhella , Garry Trott
发明人： Russell A. Budd , Punit P. Chiniwalla , John A. Guckenberger , Jeffrey A. Kash , Jeremy D. Schaub , Michael Tan , Jeannine M. Trewhella , Garry Trott
IPC分类号： G02B6/12 , H01L33/00
CPC分类号： G02B6/43 , G02B6/42 , G02B6/4214 , G02B6/4246
摘要： For integrated circuits including circuit packaging and circuit communication technologies provision is made for a method of interconnecting or mapping a two-dimensional optoelectronic (OE) device array to a one-dimensional waveguide array. Also provided is an arrangement for the interconnecting or mapping of a two-dimensional optoelectronic (OE) device array to a one-dimensional waveguide array.
摘要翻译：对于包括电路封装和电路通信技术的集成电路，提供了将二维光电（OE）器件阵列互连或映射到一维波导阵列的方法。还提供了用于将二维光电（OE）器件阵列互连或映射到一维波导阵列的布置。

6. 发明授权

US07058247B2 Silicon carrier for optical interconnect modules 有权
标题翻译：用于光互连模块的硅载体
公开(公告)号：US07058247B2
公开(公告)日：2006-06-06
申请号：US10738064
申请日：2003-12-17
申请人： John D. Crow , Casimer M. DeCusatis , Jeffrey A. Kash , Jean M. Trewhella
发明人： John D. Crow , Casimer M. DeCusatis , Jeffrey A. Kash , Jean M. Trewhella
IPC分类号： G02B6/12
CPC分类号： G02B6/43 , G02B6/4214 , G02B6/4232 , H01L2224/16225 , H01L2224/73253 , H01L2924/15311
摘要： An embodiment of the invention is an optical interconnect module comprising a silicon carrier; a communication integrated circuit mounted on the silicon carrier and an optical integrated circuit flip chip mounted on the silicon carrier. The optical integrated circuit is in electrical communication with the communication integrated circuit by electrical paths in the silicon carrier. Optical paths in the silicon carrier provide optical coupling between the optical integrated circuit and an optical link.
摘要翻译：本发明的实施例是一种包括硅载体的光学互连模块; 安装在硅载体上的通信集成电路和安装在硅载体上的光学集成电路倒装芯片。光学集成电路通过硅载体中的电路与通信集成电路电连通。硅载体中的光路提供光集成电路和光链路之间的光耦合。

7. 发明授权

US06515304B1 Device for defeating reverse engineering of integrated circuits by optical means 失效
标题翻译：用于通过光学方式消除集成电路逆向工程的装置
公开(公告)号：US06515304B1
公开(公告)日：2003-02-04
申请号：US09603570
申请日：2000-06-23
申请人： Jeffrey A. Kash , James C. Tsang , Daniel R. Knebel
发明人： Jeffrey A. Kash , James C. Tsang , Daniel R. Knebel
IPC分类号： H01L3300
CPC分类号： H01L23/576 , G01R31/311 , G01R31/31719 , H01L23/573 , H01L27/02 , H01L27/0207 , H01L2924/0002 , Y10S257/922 , H01L2924/00
摘要： An integrated circuit chip (IC) is equipped with a device for preventing reverse engineering by monitoring light emissions emitted from transistors and such electrically active devices in a circuit located in the IC. The device can be an opaque structure that blocks emissions from being detected external to the IC. Alternatively, the device can reduce light emissions from the transistors to prevent detection of the light emissions external to the IC. The device, in another alternative, can emit extraneous light emissions to hide a pattern of light emissions emitted from the transistors. As a further alternative, the device can add random delay to a signal driving the transistors to randomize the pattern of light emissions emitted from the transistors to prevent detection of a predetermined pattern of light emissions external to the IC.
摘要翻译：集成电路芯片（IC）配备有通过监视位于IC中的电路中的晶体管和这种电活动器件发射的发光来防止逆向工程的装置。该器件可以是阻挡在IC外部检测到发射的不透明结构。或者，该器件可以减少来自晶体管的光发射，以防止IC外部的光发射的检测。在另一个替代方案中，该装置可以发射外部光发射以隐藏从晶体管发射的光发射模式。作为另外的替代方案，器件可以向驱动晶体管的信号增加随机延迟，以随机化从晶体管发射的发光模式，以防止检测IC外部的预定的光发射模式。

8. 发明授权

US5559912A Wavelength-selective devices using silicon-on-insulator 失效
标题翻译：使用绝缘体上硅的波长选择器件
公开(公告)号：US5559912A
公开(公告)日：1996-09-24
申请号：US529933
申请日：1995-09-15
申请人： Farid Agahi , Bardia Pezeshki , Jeffrey A. Kash , Jeffrey J. Welser
发明人： Farid Agahi , Bardia Pezeshki , Jeffrey A. Kash , Jeffrey J. Welser
IPC分类号： G02B6/00 , G02B6/12 , G02F1/313 , H01L31/0232 , H01L31/10 , G02B6/26 , H04J14/02
CPC分类号： G02B6/12007 , G02F1/3133
摘要： This invention describes how commercial silicon-on-insulator material can be used to fabricate both wavelength filters and wavelength-selective photodetectors. The silicon-on-insulator substrates have a buried silicon dioxide layer and a thin top silicon layer and are manufactured for high speed electonics applications. However, in this invention, the thin silicon layer is used as the core of a waveguide and the buried silicon dioxide as a lower cladding region. Another cladding layer and a low index waveguide is fabricated on the commercial substrate to form an asymmetric waveguide coupler structure. The added low index waveguide and the original thin silicon layer form the two waveguides of the coupler. Since the the two waveguide materials have very different indices of refraction, they are only phase-matched at one wavelength. Thus for a given thickness of materials, only one wavelength couples between the two waveguides. By adding an absorptive layer in the silicon waveguide and electrical contacts, wavelength sensitive photodetection is obtained. The buried insulator layer is the key to device operation, providing a very low index buried cladding region.
摘要翻译：本发明描述了商业硅绝缘体材料如何用于制造波长滤波器和波长选择性光电检测器。绝缘体上硅衬底具有埋置的二氧化硅层和薄的顶部硅层，并且被制造用于高速电子学应用。然而，在本发明中，薄硅层用作波导的核心，埋入的二氧化硅用作下部包层区域。在商业基板上制造另一包层和低折射率波导以形成非对称波导耦合器结构。添加的低折射率波导和原始薄硅层形成耦合器的两个波导。由于两个波导材料具有非常不同的折射率，它们仅在一个波长处相位匹配。因此，对于给定厚度的材料，在两个波导之间仅耦合一个波长。通过在硅波导和电触点中添加吸收层，获得波长敏感的光电检测。掩埋绝缘体层是器件操作的关键，提供了非常低折射率的掩埋包层区域。

9. 发明授权

US07781782B2 Device for defeating reverse engineering of integrated circuits by optical means 失效
标题翻译：用于通过光学方式消除集成电路逆向工程的装置
公开(公告)号：US07781782B2
公开(公告)日：2010-08-24
申请号：US12610823
申请日：2009-11-02
申请人： Jeffrey A. Kash , James C. Tsang , Daniel R. Knebel
发明人： Jeffrey A. Kash , James C. Tsang , Daniel R. Knebel
IPC分类号： H01L27/15
CPC分类号： H01L23/576 , G01R31/311 , G01R31/31719 , H01L23/573 , H01L27/02 , H01L27/0207 , H01L2924/0002 , Y10S257/922 , H01L2924/00
摘要： An integrated circuit and method are provided for preventing reverse engineering by monitoring light emissions emitted from transistors and such electrically active devices in the integrated circuit. The method prevents, in an integrated circuit, a pattern of light emitted from at least one active device in the integrated circuit from being detected external to the integrated circuit by randomizing a pattern of light emitted from the at least one active device in an integrated circuit and that is emitted external to the integrated circuit. The pattern of light emitted from the at least one active device in the integrated circuit and that is emitted external to the integrated circuit can be randomized by randomizing a clock signal applied to a clocked circuit comprising the at least one active device in the integrated circuit.
摘要翻译：提供了一种用于通过监视从集成电路中的晶体管和这种电活动器件发射的光发射来防止逆向工程的集成电路和方法。该方法在集成电路中防止通过将集成电路中的至少一个有源器件发射的光的模式随机化，从而在集成电路外部检测从集成电路中的至少一个有源器件发射的光的图案，并且在集成电路外部发射。从集成电路中的至少一个有源器件发射并且被发射到集成电路外部的光的图案可以通过将施加到包括集成电路中的至少一个有源器件的时钟电路的时钟信号随机化来随机化。

10. 发明申请

US20100044724A1 DEVICE FOR DEFEATING REVERSE ENGINEERING OF INTEGRATED CIRCUITS BY OPTICAL MEANS 失效
标题翻译：通过光学手段防止集成电路反向工程的设备
公开(公告)号：US20100044724A1
公开(公告)日：2010-02-25
申请号：US12610791
申请日：2009-11-02
申请人： Jeffrey A. Kash , James C. Tsang , Daniel R. Knebel
发明人： Jeffrey A. Kash , James C. Tsang , Daniel R. Knebel
IPC分类号： H01L27/15
CPC分类号： H01L23/576 , G01R31/311 , G01R31/31719 , H01L23/573 , H01L27/02 , H01L27/0207 , H01L2924/0002 , Y10S257/922 , H01L2924/00
摘要： An integrated circuit and method are provided for preventing reverse engineering by monitoring light emissions emitted from transistors and such electrically active devices in the integrated circuit. The method prevents, in an integrated circuit, a pattern of light emitted from at least one active device in the integrated circuit from being detected external to the integrated circuit by reduction of the intensity of light emitted from the at least one active device in the integrated circuit thereby preventing the reduced intensity light emitted from the at least one active device in the integrated circuit from being detected external to the integrated circuit. The intensity of light emitted from the at least one active device in the integrated circuit can be reduced by modification of operational characteristics of the at least one active device during switching transitions.
摘要翻译：提供了一种用于通过监视从集成电路中的晶体管和这种电活动器件发射的光发射来防止逆向工程的集成电路和方法。该方法在集成电路中防止从集成电路中的至少一个有源器件发射的光的图案在集成电路外部被检测，通过减少从集成电路中的至少一个有源器件发射的光的强度从而防止在集成电路外部检测到从集成电路中的至少一个有源器件发射的强度减小的光。可以通过在切换转换期间修改至少一个有源器件的操作特性来减小从集成电路中的至少一个有源器件发射的光的强度。

你已经成功收藏专利！

检索式保存成功!

IPRDB

热门服务

关于我们

友情链接

联系方式