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    • 3. 发明授权
    • Ionizing beam inspection device and process
    • 离子束检测装置及工艺
    • US07102136B2
    • 2006-09-05
    • US10485936
    • 2003-05-30
    • Jean-Marc Fontbonne
    • Jean-Marc Fontbonne
    • G01T1/20
    • G01T1/02G01T1/169G01T1/22
    • A beam inspection device includes an inspection head having a scintillator and at least one ionizing radiation diffuser block connected to the scintillator. At least one image may be formed from at least one part of the inspection head that includes the scintillator. The device may discriminate between a scintillation light from the scintillator and stray {hacek over (C)}erenkov light in the inspection head. The scintillator includes at least one heavy plate having two principal opposing faces, the plate being approximately homogeneous with the scintillation material, and the diffuser block covers at least one of the principle faces of the scintillator plate.
    • 光束检查装置包括具有闪烁体的检查头和连接到闪烁体的至少一个电离辐射漫射块。 可以从包括闪烁体的检查头的至少一部分形成至少一个图像。 该装置可以区分来自闪烁体的闪烁光和杂散(检查头中的Cerenkov光),闪烁体包括至少一个具有两个主要相对面的厚板,该板与闪烁材料近似均匀,并且 扩散器块覆盖闪烁体板的至少一个主要面。