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1. 发明申请

US20070228271A1 Method and apparatus for surface desorption ionization by charged particles 有权
标题翻译：带电粒子表面解吸电离的方法和装置
公开(公告)号：US20070228271A1
公开(公告)日：2007-10-04
申请号：US11398305
申请日：2006-04-04
申请人： Jean-Luc Truche , Paul Goodley , Gregor Overney
发明人： Jean-Luc Truche , Paul Goodley , Gregor Overney
IPC分类号： H01J49/14
CPC分类号： H01J49/142
摘要： An apparatus and method for generating analyte ions from a sample. An ion generating device is provided having a chamber with an outlet and a surface having a material and means for applying a high velocity gas flow through the chamber toward the outlet such that charged particles are produced by physical interaction between the high velocity gas and the material. The charged particles then induce the generation of primary ions by interaction with molecules of the high velocity gas. The primary ions are emitted from the outlet of the ion generating device toward a sample-bearing surface and analyte ions are generated by impact of the primary ions on the analyte sample on the surface.
摘要翻译：一种用于从样品中产生分析物离子的装置和方法。提供一种离子产生装置，其具有具有出口的腔室和具有材料的表面，以及用于将高速气流经由腔室朝向出口施加的装置，使得通过高速气体和材料之间的物理相互作用产生带电粒子。带电粒子然后通过与高速气体分子的相互作用诱导产生初级离子。主要离子从离子产生装置的出口朝向样品承载表面发射，分析物离子通过主离子冲击表面上的分析物样品而产生。

2. 发明申请

US20100230589A1 Method and Apparatus for Surface Desorption Ionization by Charged Particles 有权
标题翻译：通过带电粒子进行表面解吸电离的方法和装置
公开(公告)号：US20100230589A1
公开(公告)日：2010-09-16
申请号：US12753786
申请日：2010-04-02
申请人： Jean-Luc Truche , Paul C. Goodley , Gregor Overney
发明人： Jean-Luc Truche , Paul C. Goodley , Gregor Overney
IPC分类号： H01J49/26 , H01J49/04
CPC分类号： H01J49/142
摘要： An apparatus and method for generating analyte ions from a sample. An ion generating device is provided having a chamber with an outlet and a surface having a material and means for applying a high velocity gas flow through the chamber toward the outlet such that charged particles are produced by physical interaction between the high velocity gas and the material. The charged particles then induce the generation of primary ions by interaction with molecules of the high velocity gas. The primary ions are emitted from the outlet of the ion generating device toward a sample-bearing surface and analyte ions are generated by impact of the primary ions on the analyte sample on the surface.
摘要翻译：一种用于从样品中产生分析物离子的装置和方法。提供一种离子产生装置，其具有具有出口的腔室和具有材料的表面，以及用于将高速气流经由腔室朝向出口施加的装置，使得通过高速气体和材料之间的物理相互作用产生带电粒子。带电粒子然后通过与高速气体分子的相互作用诱导产生初级离子。主要离子从离子产生装置的出口朝向样品承载表面发射，分析物离子通过主离子冲击表面上的分析物样品而产生。

3. 发明授权

US07183543B1 Compensating for a measured variation in length of a flight tube of a mass spectrometer 失效
标题翻译：补偿质谱仪飞行管长度的测量变化
公开(公告)号：US07183543B1
公开(公告)日：2007-02-27
申请号：US11333744
申请日：2006-01-17
申请人： Gregor Overney , Jean-Luc Truche
发明人： Gregor Overney , Jean-Luc Truche
IPC分类号： H01J49/00
CPC分类号： H01J49/40
摘要： A mass spectrometer system comprises a flight tube having an operational length, a measurement device for measuring a variation in the longitudinal length of the flight tube, means for compensating for the measured variation in the longitudinal flight tube length, and a detector positioned near a downstream end of the flight tube. The measurement device comprises an optical interferometer, and may specifically comprise a Michelson interferometer. In a first embodiment, the mass spectrometer system includes an actuator coupled to the measurement device and the detector for moving the detector in a longitudinal direction to compensate for the measured variation in the operational flight tube length. In a second embodiment, the mass spectrometer system includes a processor coupled to the measurement device configured to calculate analyte ion mass to charge ratio. The processor is configured to modify a calculation of analyte ion mass to charge ratio using the measured variation in operational flight tube length.
摘要翻译：质谱仪系统包括具有操作长度的飞行管，用于测量飞行管的纵向长度变化的测量装置，用于补偿所测量的纵向飞行管长度的变化的装置，以及位于下游飞行管的末端。测量装置包括光学干涉仪，并且可以具体地包括迈克尔逊干涉仪。在第一实施例中，质谱仪系统包括联接到测量装置的致动器和用于沿纵向方向移动检测器的检测器，以补偿测量的操作飞行管长度的变化。在第二实施例中，质谱仪系统包括耦合到被配置为计算分析物离子质量与电荷比的测量装置的处理器。处理器被配置为使用测量的操作飞行管长度的变化来修改分析物离子质量与电荷比的计算。

4. 发明授权

US07423260B2 Apparatus for combined laser focusing and spot imaging for MALDI 有权
标题翻译： MALDI组合激光聚焦和点成像装置
公开(公告)号：US07423260B2
公开(公告)日：2008-09-09
申请号：US11266950
申请日：2005-11-04
申请人： Gregor Overney , Jean-Luc Truche
发明人： Gregor Overney , Jean-Luc Truche
IPC分类号： H01J49/04
CPC分类号： H01J49/164 , H01J49/0004
摘要： A MALDI ion source includes a sample plate for receiving a sample, a laser for producing laser radiation to ionize the sample, a first optical element arranged so as to direct the laser radiation along a first optical path toward the target area, and a second optical element arranged along the first optical path to focus the laser radiation onto the target area. The first and second optical elements are arranged that light that is reflected from the target area travels along the first optical path through the first and second optical elements, the first optical element reflecting the laser radiation along a first direction and transmitting the light reflected from the target area that has traversed the first optical path in a second direction. An imaging device for viewing the plate surface may be arranged to receive the light that has been reflected from the target area and has traversed the first optical path through the first and second optical elements.
摘要翻译： MALDI离子源包括用于接收样品的样品板，用于产生激光辐射以使样品电离的激光器，布置成将激光辐射沿着第一光路引导到目标区域的第一光学元件，以及第二光学元件沿着第一光路布置以将激光辐射聚焦到目标区域上。第一和第二光学元件布置成从目标区域反射的光通过第一和第二光学元件沿着第一光学路径行进，第一光学元件沿着第一方向反射激光辐射，并且透射从目标区域沿第二方向穿过第一光路。用于观察板表面的成像装置可以被布置成接收已经从目标区域反射并已穿过第一光路的光经过第一和第二光学元件。

5. 发明授权

US07723678B2 Method and apparatus for surface desorption ionization by charged particles 有权
标题翻译：带电粒子表面解吸电离的方法和装置
公开(公告)号：US07723678B2
公开(公告)日：2010-05-25
申请号：US11398305
申请日：2006-04-04
申请人： Jean-Luc Truche , Paul C. Goodley , Gregor Overney
发明人： Jean-Luc Truche , Paul C. Goodley , Gregor Overney
IPC分类号： H01J49/14
CPC分类号： H01J49/142
摘要： An apparatus and method for generating analyte ions from a sample. An ion generating device is provided having a chamber with an outlet and a surface having a material and means for applying a high velocity gas flow through the chamber toward the outlet such that charged particles are produced by physical interaction between the high velocity gas and the material. The charged particles then induce the generation of primary ions by interaction with molecules of the high velocity gas. The primary ions are emitted from the outlet of the ion generating device toward a sample-bearing surface and analyte ions are generated by impact of the primary ions on the analyte sample on the surface.
摘要翻译：一种用于从样品中产生分析物离子的装置和方法。提供一种离子产生装置，其具有具有出口的腔室和具有材料的表面，以及用于将高速气流经由腔室朝向出口施加的装置，使得通过高速气体和材料之间的物理相互作用产生带电粒子。带电粒子然后通过与高速气体分子的相互作用诱导产生初级离子。主要离子从离子产生装置的出口朝向样品承载表面发射，分析物离子通过主离子冲击表面上的分析物样品而产生。

6. 发明申请

US20070051899A1 Maldi sample plate imaging workstation 有权
标题翻译：马尔迪样板成像工作站
公开(公告)号：US20070051899A1
公开(公告)日：2007-03-08
申请号：US11223285
申请日：2005-09-08
申请人： Jean-Luc Truche , Gregor Overney , William Fisher , Richard Tella
发明人： Jean-Luc Truche , Gregor Overney , William Fisher , Richard Tella
IPC分类号： H01J27/24 , H01J49/16 , G01N1/28
CPC分类号： H01J49/0418 , G03B15/07
摘要： The invention provides an apparatus for producing an image of a global surface of an ion source sample plate that is exterior to an ion source. In general terms, the apparatus contains a sample plate for an ion source, an imaging device (e.g., a CCD or CMOS camera) and an illumination device that is configured to produce a light beam that contacts the sample plate surface to define a grazing angle between the light beam and the sample plate surface. The apparatus may be present at a location that is remote to the ion source.
摘要翻译：本发明提供了一种用于产生离子源外部的离子源样品板的全局表面的图像的装置。通常，该装置包含用于离子源的样品板，成像装置（例如，CCD或CMOS照相机）和照明装置，其被配置为产生接触样品板表面以限定掠入角的光束在光束和样品板表面之间。该装置可以存在于远离离子源的位置处。

7. 发明申请

US20060278824A1 Ion source sample plate illumination system 有权
标题翻译：离子源样品板照明系统
公开(公告)号：US20060278824A1
公开(公告)日：2006-12-14
申请号：US11148786
申请日：2005-06-08
申请人： Jean-Luc Truche , Gregor Overney , William Fisher , Richard Tella
发明人： Jean-Luc Truche , Gregor Overney , William Fisher , Richard Tella
IPC分类号： H01J49/16
CPC分类号： H01J49/0418 , G03B15/07 , H01J49/0004
摘要： The invention provides a mass spectrometry system ion source containing a sample plate and an illumination device that is configured to produce a light beam that contacts the sample plate surface to define a grazing angle between the light beam and the sample plate surface. The ion source may also contain an imaging device, e.g., a CCD or CMOS camera or the like, for viewing the area. In one embodiment, the imaging device may be connected to a display, e.g., a video monitor. Methods and mass spectrometry systems empliying the ion source are also provided.
摘要翻译：本发明提供一种包含样品板和照明装置的质谱系统离子源，其被配置为产生与样品板表面接触以限定光束和样品板表面之间的掠射角的光束。离子源还可以包含用于观察该区域的成像装置，例如CCD或CMOS照相机等。在一个实施例中，成像装置可以连接到显示器，例如视频监视器。还提供了使用离子源的方法和质谱系统。

8. 发明申请

US20070102632A1 Apparatus for combined laser focusing and spot imaging for MALDI 有权
标题翻译： MALDI组合激光聚焦和点成像装置
公开(公告)号：US20070102632A1
公开(公告)日：2007-05-10
申请号：US11266950
申请日：2005-11-04
申请人： Gregor Overney , Jean-Luc Truche
发明人： Gregor Overney , Jean-Luc Truche
IPC分类号： H01J49/16
CPC分类号： H01J49/164 , H01J49/0004
摘要： A MALDI ion source includes a sample plate for receiving a sample, a laser for producing laser radiation to ionize the sample, a first optical element arranged so as to direct the laser radiation along a first optical path toward the target area, and a second optical element arranged along the first optical path to focus the laser radiation onto the target area. The first and second optical elements are arranged that light that is reflected from the target area travels along the first optical path through the first and second optical elements, the first optical element reflecting the laser radiation along a first direction and transmitting the light reflected from the target area that has traversed the first optical path in a second direction. An imaging device for viewing the plate surface may be arranged to receive the light that has been reflected from the target area and has traversed the first optical path through the first and second optical elements.
摘要翻译： MALDI离子源包括用于接收样品的样品板，用于产生激光辐射以使样品电离的激光器，布置成将激光辐射沿着第一光路引导到目标区域的第一光学元件，以及第二光学元件沿着第一光路布置以将激光辐射聚焦到目标区域上。第一和第二光学元件布置成从目标区域反射的光通过第一和第二光学元件沿着第一光学路径行进，第一光学元件沿着第一方向反射激光辐射，并且透射从目标区域沿第二方向穿过第一光路。用于观察板表面的成像装置可以被布置成接收已经从目标区域反射并已穿过第一光路的光经过第一和第二光学元件。

9. 发明申请

US20060289734A1 Increased depth of field for high resolution imaging for a matrix-based ion source 有权
标题翻译：增加基于矩阵的离子源高分辨率成像的景深
公开(公告)号：US20060289734A1
公开(公告)日：2006-12-28
申请号：US11168612
申请日：2005-06-27
申请人： Jean-Luc Truche , Gregor Overney
发明人： Jean-Luc Truche , Gregor Overney
IPC分类号： H01J49/10
CPC分类号： H01J49/0418 , G03B3/10 , G03B13/34 , G06T5/50 , G06T7/571 , G06T2207/10148 , G06T2207/30108 , H01J49/0004
摘要： The invention provides a method of producing an in-focus image of an area on a sample plate for an ion source, e.g., a matrix-based ion source or any other type of ion source that employs a sample plate onto which samples are deposited. The method generally includes: a) positioning an area of the sample plate in the field of view of an imaging device; b) producing a plurality of images of the area having different in-focus regions; and c) generating an in-focus image of the area using the plurality of images. The in-focus image may be two-dimensional or three-dimensional. Systems and programming for performing the methods are also provided.
摘要翻译：本发明提供一种制造用于离子源的样品板（例如基于矩阵的离子源或使用其上沉积样品的样品板的任何其它类型的离子源）的区域的对焦图像的方法。该方法通常包括：a）将样品板的区域定位在成像装置的视野内; b）产生具有不同对焦区域的区域的多个图像; 以及c）使用所述多个图像生成所述区域的对焦图像。对焦图像可以是二维或三维的。还提供了用于执行方法的系统和编程。

10. 发明授权

US08129677B2 Method and apparatus for surface desorption ionization by charged particles 有权
标题翻译：带电粒子表面解吸电离的方法和装置
公开(公告)号：US08129677B2
公开(公告)日：2012-03-06
申请号：US12753786
申请日：2010-04-02
申请人： Jean-Luc Truche , Paul C. Goodley , Gregor Overney
发明人： Jean-Luc Truche , Paul C. Goodley , Gregor Overney
IPC分类号： H01J49/26
CPC分类号： H01J49/142
摘要： An apparatus and method for generating analyte ions from a sample. An ion generating device is provided having a chamber with an outlet and a surface having a material and means for applying a high velocity gas flow through the chamber toward the outlet such that charged particles are produced by physical interaction between the high velocity gas and the material. The charged particles then induce the generation of primary ions by interaction with molecules of the high velocity gas. The primary ions are emitted from the outlet of the ion generating device toward a sample-bearing surface and analyte ions are generated by impact of the primary ions on the analyte sample on the surface.
摘要翻译：一种用于从样品中产生分析物离子的装置和方法。提供一种离子产生装置，其具有具有出口的腔室和具有材料的表面，以及用于将高速气流经由腔室朝向出口施加的装置，使得通过高速气体和材料之间的物理相互作用产生带电粒子。带电粒子然后通过与高速气体分子的相互作用诱导产生初级离子。主要离子从离子产生装置的出口朝向样品承载表面发射，分析物离子通过主离子冲击表面上的分析物样品而产生。

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