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1. 发明授权

US06643807B1 Array-built-in-self-test (ABIST) for efficient, fast, bitmapping of large embedded arrays in manufacturing test 失效
标题翻译：阵列内置自检（ABIST），用于制造测试中大型嵌入式阵列的高效快速位图
公开(公告)号：US06643807B1
公开(公告)日：2003-11-04
申请号：US09629507
申请日：2000-08-01
申请人： Jay G. Heaslip , Gary W. Maier , Gerard M. Salem , Timothy J. Von Reyn
发明人： Jay G. Heaslip , Gary W. Maier , Gerard M. Salem , Timothy J. Von Reyn
IPC分类号： G11C2900
CPC分类号： G11C29/44 , G11C2207/104
摘要： A structure and method for an integrated circuit which includes read/write memory having a plurality of memory devices, each of the memory devices having a unique address; a built-in self-test (BIST) engine, the BIST engine having a controller responsive to a test enable signal and operative to generate and store test data in the read/write memory; a comparator operative to compare retrieved data read from the read/write memory and the test data during a first pass test, the comparator identifying failed cycles where the retrieved data does not correspond correctly to the test data; and a diagnostic unit operative to store the failed cycles and being responsive to the controller generating and storing the test data in the read/write memory and operative to store failed data and failing addresses during a first pass test, wherein the BIST engine stops only at each of the failed cycles during the first pass test.
摘要翻译：一种用于集成电路的结构和方法，包括具有多个存储器件的读/写存储器，每个存储器件具有唯一的地址; 内置自检（BIST）引擎，BIST引擎具有响应于测试使能信号的控制器，并且可操作地在读/写存储器中生成并存储测试数据; 比较器，用于比较在第一次通过测试期间从读/写存储器读取的检索数据和测试数据，比较器识别检索数据与测试数据不正确对应的故障周期; 以及诊断单元，用于存储故障循环并响应于所述控制器在所述读/写存储器中产生和存储所述测试数据，并且在第一次通过测试期间可操作以存储故障数据和故障地址，其中所述BIST引擎仅在在第一次通过测试期间的每个故障循环。

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