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1. 发明授权

US07092196B2 Characteristic measurement of an actuation drive coil and associated damping mechanism 失效
标题翻译：致动驱动线圈和相关阻尼机构的特性测量
公开(公告)号：US07092196B2
公开(公告)日：2006-08-15
申请号：US10876197
申请日：2004-06-23
申请人： James H. Eaton , Darrell G. Follett , David H. Harper , Wayne I. Imaino , Leif S. Kirschenbaum , Andrew J. McKee , Luis H. Palacios
发明人： James H. Eaton , Darrell G. Follett , David H. Harper , Wayne I. Imaino , Leif S. Kirschenbaum , Andrew J. McKee , Luis H. Palacios
IPC分类号： G11B5/02 , G11B9/00 , G01B7/00 , G11B21/04
CPC分类号： G11B5/5508 , G11B5/556
摘要： A system and method for analyzing a coil actuator of a type having a coil and a magnet. A current source selectively applies a first current to a coil of a coil actuator for setting a moveable part of the coil actuator to a first position. A recording system captures data corresponding to a back electromotive force voltage produced by oscillation of the coil actuator upon movement of the moveable part of the coil actuator to a second position. A processor applies a curve fit to the back electromotive force data for calculating a frequency characteristic and damping response of the coil actuator.
摘要翻译：一种用于分析具有线圈和磁体的线圈致动器的系统和方法。电流源选择性地向线圈致动器的线圈施加第一电流，以将线圈致动器的可移动部分设置到第一位置。当线圈致动器的可移动部分移动到第二位置时，记录系统捕获对应于由线圈致动器的振荡产生的反电动势电压的数据。处理器对用于计算线圈致动器的频率特性和阻尼响应的反电动势数据施加曲线拟合。

2. 发明授权

US08810241B2 Methods for detecting damage to magnetoresistive sensors 有权
标题翻译：检测磁阻传感器损坏的方法
公开(公告)号：US08810241B2
公开(公告)日：2014-08-19
申请号：US13186341
申请日：2011-07-19
申请人： Icko E. Tim Iben , Darrell G. Follett , Guillermo Paniagua
发明人： Icko E. Tim Iben , Darrell G. Follett , Guillermo Paniagua
IPC分类号： G01R33/12
CPC分类号： G11B27/36 , G11B5/3948 , G11B5/40 , G11B2220/90
摘要： A system and method for detecting a damaged magnetoresistive sensor includes measuring a median DiffPN value of a group of GMR sensors on a module, the sensors characterized as having been deposited on a same wafer and having been lapped as a single unit; comparing the DiffPN values to the median; determining that physical and/or magnetic damage has occurred to an individual sensor if the difference in the DiffPN value of the individual sensor from the median is greater than a statistically predetermined value for the group of sensors; where the difference is at least one times the average of the standard deviations of a large number of normal modules or the average of the standard deviations of a large number of modules, wherein at least the largest and the smallest DiffPN value within the module is not included in the calculation of the module's standard deviation.
摘要翻译：用于检测损坏的磁阻传感器的系统和方法包括测量模块上的一组GMR传感器的中值DiffPN值，所述传感器被表征为已经沉积在相同的晶片上并且已被研磨为单个单元; 将DiffPN值与中位数进行比较; 如果单个传感器的DiffPN值与中值的差异大于传感器组的统计预定值，则确定个体传感器已经发生物理和/或磁损伤; 其中差异是大量正常模块的标准偏差的平均值的平均值或大量模块的标准偏差的平均值的至少一倍，其中模块中至少最大和最小的DiffPN值不是包含在模块标准偏差的计算中。

3. 发明申请

US20090268325A1 METHODS FOR DETECTING DAMAGE TO MAGNETORESISTIVE SENSORS 失效
标题翻译：检测磁传感器损坏的方法
公开(公告)号：US20090268325A1
公开(公告)日：2009-10-29
申请号：US12111089
申请日：2008-04-28
申请人： Icko E. Tim Iben , Darrell G. Follett , Guillermo Paniagua
发明人： Icko E. Tim Iben , Darrell G. Follett , Guillermo Paniagua
IPC分类号： G11B27/36
CPC分类号： G11B27/36 , G11B5/3948 , G11B5/40 , G11B2220/90
摘要： In one embodiment, a method for detecting a damaged magnetoresistive sensor includes analyzing readback signals of a plurality of sensors each being positioned over data tracks on a passing magnetic medium; determining whether at least one of the readback signals is out of phase with respect to the other readback signals, and/or whether at least one of the readback signals has a significantly lower amplitude that the other readback signals. Additional methods are also presented.
摘要翻译：在一个实施例中，用于检测损坏的磁阻传感器的方法包括分析多个传感器的回读信号，每个传感器位于通过磁介质上的数据轨道上; 确定所述回读信号中的至少一个是否相对于其他回读信号是异相的，和/或所述回读信号中的至少一个是否具有显着较低的其他回读信号的幅度。还介绍了其他方法。

4. 发明授权

US08018226B2 Methods for detecting damage to magnetoresistive sensors 失效
标题翻译：检测磁阻传感器损坏的方法
公开(公告)号：US08018226B2
公开(公告)日：2011-09-13
申请号：US12111089
申请日：2008-04-28
申请人： Icko E. Tim Iben , Darrell G. Follett , Guillermo Paniagua
发明人： Icko E. Tim Iben , Darrell G. Follett , Guillermo Paniagua
IPC分类号： G01R33/12
CPC分类号： G11B27/36 , G11B5/3948 , G11B5/40 , G11B2220/90
摘要： In one embodiment, a method for detecting a damaged magnetoresistive sensor includes analyzing readback signals of a plurality of sensors each being positioned over data tracks on a passing magnetic medium; determining whether at least one of the readback signals is out of phase with respect to the other readback signals, and/or whether at least one of the readback signals has a significantly lower amplitude that the other readback signals. Additional methods are also presented.
摘要翻译：在一个实施例中，用于检测损坏的磁阻传感器的方法包括分析多个传感器的回读信号，每个传感器位于通过磁介质上的数据轨道上; 确定所述回读信号中的至少一个是否相对于其他回读信号是异相的，和/或所述回读信号中的至少一个是否具有显着较低的其他回读信号的幅度。还介绍了其他方法。

5. 发明申请

US20110276287A1 METHODS FOR DETECTING DAMAGE TO MAGNETORESISTIVE SENSORS 有权
标题翻译：检测磁传感器损坏的方法
公开(公告)号：US20110276287A1
公开(公告)日：2011-11-10
申请号：US13186341
申请日：2011-07-19
申请人： Icko E. Tim Iben , Darrell G. Follett , Guillermo Paniagua
发明人： Icko E. Tim Iben , Darrell G. Follett , Guillermo Paniagua
IPC分类号： G06F19/00
CPC分类号： G11B27/36 , G11B5/3948 , G11B5/40 , G11B2220/90
摘要： A system and method for detecting a damaged magnetoresistive sensor includes measuring a median DiffPN value of a group of GMR sensors on a module, the sensors characterized as having been deposited on a same wafer and having been lapped as a single unit; comparing the DiffPN values to the median; determining that physical and/or magnetic damage has occurred to an individual sensor if the difference in the DiffPN value of the individual sensor from the median is greater than a statistically predetermined value for the group of sensors; where the difference is at least one times the average of the standard deviations of a large number of normal modules or the average of the standard deviations of a large number of modules, wherein at least the largest and the smallest DiffPN value within the module is not included in the calculation of the module's standard deviation.
摘要翻译：用于检测损坏的磁阻传感器的系统和方法包括测量模块上的一组GMR传感器的中值DiffPN值，所述传感器被表征为已经沉积在相同的晶片上并且已被研磨为单个单元; 将DiffPN值与中位数进行比较; 如果单个传感器的DiffPN值与中值的差异大于传感器组的统计预定值，则确定个体传感器已经发生物理和/或磁损伤; 其中差异是大量正常模块的标准偏差的平均值的平均值或大量模块的标准偏差的平均值的至少一倍，其中模块中至少最大和最小的DiffPN值不是包含在模块标准偏差的计算中。

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