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    • 6. 发明授权
    • Memory and test method therefor
    • 记忆和测试方法
    • US5757814A
    • 1998-05-26
    • US519406
    • 1995-08-24
    • David H. McIntyre
    • David H. McIntyre
    • G01R31/28G11C16/06G11C17/00G11C29/00G11C29/04G11C29/24G06F11/00
    • G11C29/24G11C29/04G11C29/78
    • A redundancy implementation circuit has a set of memory cells each storing an address bit of an address identifying a redundant memory location and a set of comparator circuits each connected to compare the address bit stored in a memory cell with an incoming address bit. A switch selectively connects the output of the memory cell to a redundant address line supplying the incoming address bit during a test mode. A redundant address line driver is activated for supplying an incoming address bit onto the redundant address line in a normal mode, and a test line output driver is connected to the redundant address line in a test mode for utilising the redundant address line to supply test signals onto a test path.
    • 冗余实现电路具有一组存储器单元,每个存储器单元存储标识冗余存储器位置的地址的地址位和一组比较器电路,每个比较器电路连接以将存储在存储器单元中的地址位与输入地址位进行比较。 在测试模式期间,开关选择性地将存储器单元的输出连接到提供输入地址位的冗余地址线。 激活冗余地址线驱动器,以正常模式将输入地址位提供给冗余地址线,测试线输出驱动器以测试模式连接到冗余地址线,以利用冗余地址线提供测试信号 到测试路径。
    • 9. 发明授权
    • Bit line sensing in a memory array
    • 存储器阵列中的位线检测
    • US5619449A
    • 1997-04-08
    • US559695
    • 1995-11-15
    • David H. McIntyre
    • David H. McIntyre
    • G11C17/00G11C7/14G11C11/401G11C11/4099G11C16/06G11C16/28G11C16/04
    • G11C16/28G11C11/4099G11C7/14
    • A memory comprises first and second arrays of memory cells organised in rows and column. The cells in each row are connected to respective wordlines and the cells in each column are connected to a respective bit line. Wordlines of the first array are addressable independently of the wordlines of the second array. A sense amplifier is provided to sense the differential between a signal on the bit line of a selected cell in one array and a reference signal. A current souce is selectively connectable to supply the reference signal for comparison with the signal on the bit line of the addressed array. The present invention allows capacitive balancing to be achieved without the need for dummy cells.
    • 存储器包括以行和列组织的第一和第二存储器单元阵列。 每行中的单元连接到相应的字线,并且每列中的单元连接到相应的位线。 第一个阵列的字词可以独立于第二个数组的字线寻址。 提供读出放大器以感测一个阵列中所选择的单元的位线上的信号与参考信号之间的差分。 可选择性地连接电流源以提供参考信号以与寻址的阵列的位线上的信号进行比较。 本发明允许在不需要虚设单元的情况下实现电容平衡。