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1. 发明授权

US07224750B2 Apparatus and method for receiving RF signal free of 1/f noise in radio communication system 失效
标题翻译：用于在无线电通信系统中接收没有1 / f噪声的RF信号的装置和方法
公开(公告)号：US07224750B2
公开(公告)日：2007-05-29
申请号：US10461264
申请日：2003-06-13
申请人： Jae-wan Kim , In-chul Hwang , Hae-moon Seo , Young-jin Kim
发明人： Jae-wan Kim , In-chul Hwang , Hae-moon Seo , Young-jin Kim
IPC分类号： H03K9/00
CPC分类号： H03D7/163
摘要： An apparatus and method for receiving RF signals in a RF communication system are provided. The apparatus for receiving RF signals comprises a pre-processing unit for bandpass-filtering a signal received through an external antenna with a predetermined bandwidth and extracting a RF input signal having a desired frequency; a mixing unit for mixing the RF input signal provided from the pre-processing unit with a local oscillation signal having the same frequency as the RF input signal and generating a desired baseband signal; a noise-free-signal amplifying unit for shifting the desired baseband signal to a band that is free of effects due to 1/f noise, amplifying the shifted baseband signal, and re-shifting the amplified signal to the baseband; and a baseband processing unit for selecting a desired channel signal from the amplified baseband signal to be provided from the noise-free-signal amplifying unit and amplifying the selected signal.
摘要翻译：提供了一种用于在RF通信系统中接收RF信号的装置和方法。用于接收RF信号的装置包括预处理单元，用于对具有预定带宽的外部天线接收的信号进行带通滤波，并提取具有期望频率的RF输入信号; 混合单元，用于将从预处理单元提供的RF输入信号与具有与RF输入信号相同频率的本地振荡信号混合并产生期望的基带信号; 无噪声信号放大单元，用于将期望的基带信号移位到由于1 / f噪声而无效的频带，放大经移位的基带信号，并将放大的信号重新移位到基带; 以及基带处理单元，用于从要由无噪声信号放大单元提供的放大基带信号中选择期望的信道信号，并放大所选择的信号。

2. 发明授权

US08279448B2 Shape measurement apparatus and method 有权
标题翻译：形状测量装置及方法
公开(公告)号：US08279448B2
公开(公告)日：2012-10-02
申请号：US12676245
申请日：2008-08-19
申请人： Jae-wan Kim , Tae-bong Eom , Jong-ahn Kim , Chu-shik Kang
发明人： Jae-wan Kim , Tae-bong Eom , Jong-ahn Kim , Chu-shik Kang
IPC分类号： G01B11/02 , H01S3/13
CPC分类号： G01B11/2441
摘要： A shape measurement apparatus and method using a laser interferometer are disclosed. The shape measurement apparatus includes a plurality of laser devices, which generate beams, emit a beam of a specific frequency from among the generated beams, and output interference signals for detecting wavelengths of the generated beams, and a controller for detecting the wavelengths of the generated beams from the outputted interference signals, and controlling the laser devices on the basis of the detected wavelengths. The optical unit projects the beam of the laser device on a target object, and generates an interference pattern of the object. Several shutters are closed and opened. If the shutters are closed, they prevent the beam of each laser device to be projected on the optical unit. An image pickup unit captures the interference pattern.
摘要翻译：公开了一种使用激光干涉仪的形状测量装置和方法。形状测量装置包括多个激光装置，其产生光束，从所生成的光束中发射特定频率的光束，并输出用于检测所生成的光束的波长的干涉信号;以及控制器，用于检测所产生的光束的波长来自所输出的干扰信号的光束，并且基于检测到的波长来控制激光器件。光学单元将激光装置的光束投射在目标物体上，并产生物体的干涉图案。几个百叶窗关闭并打开。如果快门关闭，则可以防止每个激光装置的光束投射到光学单元上。摄像单元捕获干涉图案。

3. 发明授权

US07015747B2 Device for controlling a frequency response by scaling an impedance 有权
标题翻译：用于通过缩放阻抗来控制频率响应的装置
公开(公告)号：US07015747B2
公开(公告)日：2006-03-21
申请号：US10750599
申请日：2003-12-29
申请人： Jae-wan Kim
发明人： Jae-wan Kim
IPC分类号： H03B1/00
CPC分类号： H03H19/008
摘要： Provided is a device for controlling a frequency response by scaling an impedance. The device includes a filter and a duty ratio controller. The filter generates an output signal after removing a frequency from an input signal, and comprises a first impedance component and a switch. The switch, which is serially connected to the first impedance component, is switched on or off in response to a duty-controlled clock signal. The duty ratio controller receives a clock signal, controls a duty ratio of the clock signal, and generates the duty-controlled clock signal. The duty ratio controller comprises a flip-flop, which has a clock terminal that receives the clock signal, and a reset terminal, which receives a delayed signal obtained after delaying the clock signal by a time delay. The duty ratio controller further comprises a delay component that receives the clock signal, generates the delayed signal, and controls the time delay in response to a duty control signal.
摘要翻译：提供了一种通过缩放阻抗来控制频率响应的装置。该装置包括滤波器和占空比控制器。滤波器在从输入信号中去除频率之后产生输出信号，并且包括第一阻抗分量和开关。串行连接到第一阻抗分量的开关响应于占空比控制的时钟信号被接通或断开。占空比控制器接收时钟信号，控制时钟信号的占空比，并产生占空比控制时钟信号。占空比控制器包括具有接收时钟信号的时钟端子的触发器和复位端子，其接收在延迟时钟信号之后获得的延迟信号。占空比控制器还包括延迟部件，其接收时钟信号，产生延迟信号，并响应于占空比控制信号来控制时间延迟。

4. 发明申请

US20050151760A1 Method of inspecting a flat panel display 有权
标题翻译：检查平板显示器的方法
公开(公告)号：US20050151760A1
公开(公告)日：2005-07-14
申请号：US10949254
申请日：2004-09-27
申请人： Jae-wan Kim , Hyoung-jo Jeon , Yong-sik Kim , Hwa-sub Shim , Hyeongmin Ahn , Ho-seok Choi , Myung-ho Jung , Min Hong , Joung-hag Kim , Young-su Ryu , Sung-chai Kim , Seung-gun Byoun , Suk-in Yoo , Kyu-nam Choi , Jae-yeong Lee
发明人： Jae-wan Kim , Hyoung-jo Jeon , Yong-sik Kim , Hwa-sub Shim , Hyeongmin Ahn , Ho-seok Choi , Myung-ho Jung , Min Hong , Joung-hag Kim , Young-su Ryu , Sung-chai Kim , Seung-gun Byoun , Suk-in Yoo , Kyu-nam Choi , Jae-yeong Lee
IPC分类号： G02F1/13 , G06T7/00 , G09G3/00 , G09G3/20 , G09G3/36 , G09G5/10
CPC分类号： G09G3/006 , G06T7/0004 , G09G3/20 , G09G3/36 , Y10S345/904
摘要： A method of inspecting a flat panel display including inputting an image data signal into the flat panel display, obtaining an image displayed on the flat panel display in response to the input image data signal with a camera, extracting a raw brightness information corresponding to each location from the obtained image, calculating a fitting brightness information corresponding to each location through the curve fitting based on the raw brightness information, calculating a brightness difference corresponding to each location between the raw brightness information and the fitting brightness information, and detecting stain locations with the brightness difference beyond a predetermined permitted limit.
摘要翻译：一种检查平板显示器的方法，包括将图像数据信号输入到平板显示器中，根据相机的输入图像数据信号获得显示在平板显示器上的图像，提取与每个位置相对应的原始亮度信息根据所获得的图像，通过基于原始亮度信息，通过曲线拟合计算与各位置对应的拟合亮度信息，计算与原始亮度信息和拟合亮度信息之间的每个位置对应的亮度差，并且检测染色位置亮度差超出预定的允许极限。

5. 发明申请

US20100182614A1 SHAPE MEASUREMENT APPARATUS AND METHOD 有权
标题翻译：形状测量装置和方法
公开(公告)号：US20100182614A1
公开(公告)日：2010-07-22
申请号：US12676245
申请日：2008-08-19
申请人： Jae-wan Kim , Tae-bong Eom , Jong-ahn Kim , Chu-shik Kang
发明人： Jae-wan Kim , Tae-bong Eom , Jong-ahn Kim , Chu-shik Kang
IPC分类号： G01B11/24
CPC分类号： G01B11/2441
摘要： A shape measurement apparatus and method using a laser interferometer are disclosed. The shape measurement apparatus includes a plurality of laser devices, which generate beams, emit a beam of a specific frequency from among the generated beams, and output interference signals for detecting wavelengths of the generated beams, and a controller for detecting the wavelengths of the generated beams from the outputted interference signals, and controlling the laser devices on the basis of the detected wavelengths. The optical unit projects the beam of the laser device on a target object, and generates an interference pattern of the object. Several shutters are closed and opened. If the shutters are closed, they prevent the beam of each laser device to be projected on the optical unit. An image pickup unit captures the interference pattern.
摘要翻译：公开了一种使用激光干涉仪的形状测量装置和方法。形状测量装置包括多个激光装置，其产生光束，从所生成的光束中发射特定频率的光束，并输出用于检测所生成的光束的波长的干涉信号;以及控制器，用于检测所产生的光束的波长来自所输出的干扰信号的光束，并且基于检测到的波长来控制激光器件。光学单元将激光装置的光束投射在目标物体上，并产生物体的干涉图案。几个百叶窗关闭并打开。如果快门关闭，则可以防止每个激光装置的光束投射到光学单元上。摄像单元捕获干涉图案。

6. 发明授权

US07538750B2 Method of inspecting a flat panel display 有权
标题翻译：检查平板显示器的方法
公开(公告)号：US07538750B2
公开(公告)日：2009-05-26
申请号：US10949254
申请日：2004-09-27
申请人： Jae-wan Kim , Hyoung-jo Jeon , Yong-sik Douglas Kim , Hwa-sub Shim , Heong-min Ahn , Ho-seok Choi , Myung-ho Jung , Min Hong , Joung-hag Kim , Young-su Ryu , Sung-chai Kim , Seung-gun Byoun , Suk-in Yoo , Kyu-nam Choi , Jae-yeong Lee
发明人： Jae-wan Kim , Hyoung-jo Jeon , Yong-sik Douglas Kim , Hwa-sub Shim , Heong-min Ahn , Ho-seok Choi , Myung-ho Jung , Min Hong , Joung-hag Kim , Young-su Ryu , Sung-chai Kim , Seung-gun Byoun , Suk-in Yoo , Kyu-nam Choi , Jae-yeong Lee
IPC分类号： G09G3/36
CPC分类号： G09G3/006 , G06T7/0004 , G09G3/20 , G09G3/36 , Y10S345/904
摘要： A method of inspecting a flat panel display including inputting an image data signal into the flat panel display, obtaining an image displayed on the flat panel display in response to the input image data signal with a camera, extracting a raw brightness information corresponding to each location from the obtained image, calculating a fitting brightness information corresponding to each location through the curve fitting based on the raw brightness information, calculating a brightness difference corresponding to each location between the raw brightness information and the fitting brightness information, and detecting stain locations with the brightness difference beyond a predetermined permitted limit.
摘要翻译：一种检查平板显示器的方法，包括将图像数据信号输入到平板显示器中，根据相机的输入图像数据信号获得显示在平板显示器上的图像，提取与每个位置相对应的原始亮度信息根据所获得的图像，通过基于原始亮度信息，通过曲线拟合计算与各位置对应的拟合亮度信息，计算与原始亮度信息和拟合亮度信息之间的每个位置对应的亮度差，并且检测染色位置亮度差超出预定的允许极限。

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