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1. 发明申请

US20140192602A1 DEFECTIVE MEMORY COLUMN REPLACEMENT WITH LOAD ISOLATION 有权
标题翻译：有缺陷的记忆柱替换与负载隔离
公开(公告)号：US20140192602A1
公开(公告)日：2014-07-10
申请号：US13733948
申请日：2013-01-04
申请人： INTERNATIONAL BUSINESS MACHINES CORPORATION
发明人： Silke Penth , Raphael Polig , Tobias Werner , Alexander Woerner
IPC分类号： G11C29/04
CPC分类号： G11C29/04 , G11C11/41 , G11C29/785 , G11C29/832
摘要： Exemplary embodiments of the present invention disclose a method and system for substituting a group of memory cells for a defective group of memory cells in a memory. In a step, an exemplary embodiment replaces a signal path to a group of defective memory cells with a signal path to a redundant group of memory cells. In another step, an exemplary embodiment isolates the signal path to the redundant group of memory cells from a load imposed by the signal path to the replaced group of defective memory cells.
摘要翻译：本发明的示例性实施例公开了一种用于将一组存储器单元替换为存储器中的存储器单元的缺陷组的方法和系统。在一个步骤中，示例性实施例将具有到冗余存储器单元组的信号路径的信号路径替换到一组缺陷存储器单元。在另一步骤中，示例性实施例将来自由信号路径施加的负载的冗余组的信号路径隔离到更换的有缺陷的存储器单元组。

2. 发明申请

US20140089880A1 METHOD AND SYSTEM TO FIX EARLY MODE SLACKS IN A CIRCUIT DESIGN 有权
标题翻译：在电路设计中固定早期模式滑块的方法和系统
公开(公告)号：US20140089880A1
公开(公告)日：2014-03-27
申请号：US14035125
申请日：2013-09-24
申请人： INTERNATIONAL BUSINESS MACHINES CORPORATION
发明人： Wilhelm Haller , Ulrich Krauch , Kurt Lind , Alexander Woerner
IPC分类号： G06F17/50
CPC分类号： G06F17/5068 , G06F17/5031 , G06F17/5036 , G06F17/505 , G06F17/5077
摘要： An improved method for fixing an early mode slack in a hierarchically designed hardware device with at least one source macro, an integration unit and at least one sink macro comprises: Loading hardware design timing data to determine pins where an early mode slack fix can be applied to fix an early mode slack; for each such pin determining a location across the design hierarchy for the early mode slack fix by calculating a weight value for each of a selection of fix locations of the early mode slack based on absolute values of arrival times of data signals, ratio and difference between arrival times of late mode data signals and early mode data signals; and assigning the early mode slack fix to the determined location based on said weight value.
摘要翻译：一种用于利用至少一个源宏，集成单元和至少一个宿宏固定分层设计的硬件设备中的早期模式松弛的改进方法包括：加载硬件设计定时数据以确定可以应用早期模式松弛修复的引脚修复早期模式松弛; 对于每个这样的引脚，通过基于数据信号的到达时间的绝对值计算早期模式松弛的固定位置的选择中的每一个的权重值来确定用于早期模式松弛固定的跨设计层级的位置，晚期模式数据信号和早期模式数据信号的到达时间; 以及基于所述权重值将早期模式松弛固定分配给所确定的位置。

3. 发明授权

US09058456B2 Method and system to fix early mode slacks in a circuit design 有权
标题翻译：在电路设计中解决早期模式松弛的方法和系统
公开(公告)号：US09058456B2
公开(公告)日：2015-06-16
申请号：US14035125
申请日：2013-09-24
申请人： INTERNATIONAL BUSINESS MACHINES CORPORATION
发明人： Wilhelm Haller , Ulrich Krauch , Kurt Lind , Alexander Woerner
IPC分类号： G06F17/50
CPC分类号： G06F17/5068 , G06F17/5031 , G06F17/5036 , G06F17/505 , G06F17/5077
摘要： An improved method for fixing an early mode slack in a hierarchically designed hardware device with at least one source macro, an integration unit and at least one sink macro comprises: Loading hardware design timing data to determine pins where an early mode slack fix can be applied to fix an early mode slack; for each such pin determining a location across the design hierarchy for the early mode slack fix by calculating a weight value for each of a selection of fix locations of the early mode slack based on absolute values of arrival times of data signals, ratio and difference between arrival times of late mode data signals and early mode data signals; and assigning the early mode slack fix to the determined location based on said weight value.
摘要翻译：一种用于利用至少一个源宏，集成单元和至少一个宿宏固定分层设计的硬件设备中的早期模式松弛的改进方法包括：加载硬件设计定时数据以确定可以应用早期模式松弛修复的引脚修复早期模式松弛; 对于每个这样的引脚，通过基于数据信号的到达时间的绝对值计算早期模式松弛的固定位置的选择中的每一个的权重值来确定用于早期模式松弛固定的跨设计层级的位置，晚期模式数据信号和早期模式数据信号的到达时间; 以及基于所述权重值将早期模式松弛固定分配给所确定的位置。

4. 发明授权

US08964493B2 Defective memory column replacement with load isolation 有权
标题翻译：带有负载隔离的内存列替换不良
公开(公告)号：US08964493B2
公开(公告)日：2015-02-24
申请号：US13733948
申请日：2013-01-04
申请人： International Business Machines Corporation
发明人： Silke Penth , Raphael Polig , Tobias Werner , Alexander Woerner
IPC分类号： G11C29/00 , G11C17/18 , G11C29/04
CPC分类号： G11C29/04 , G11C11/41 , G11C29/785 , G11C29/832
摘要： Exemplary embodiments of the present invention disclose a method and system for substituting a group of memory cells for a defective group of memory cells in a memory. In a step, an exemplary embodiment replaces a signal path to a group of defective memory cells with a signal path to a redundant group of memory cells. In another step, an exemplary embodiment isolates the signal path to the redundant group of memory cells from a load imposed by the signal path to the replaced group of defective memory cells.
摘要翻译：本发明的示例性实施例公开了一种用于将一组存储器单元替换为存储器中的存储器单元的缺陷组的方法和系统。在一个步骤中，示例性实施例将具有到冗余存储器单元组的信号路径的信号路径替换到一组缺陷存储器单元。在另一步骤中，示例性实施例将来自由信号路径施加的负载的冗余组的信号路径隔离到更换的有缺陷的存储器单元组。

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