会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 5. 发明授权
    • Methods and apparatus for detecting a substrate notch or flat
    • 用于检测基板切口或平面的方法和装置
    • US08101934B2
    • 2012-01-24
    • US11683420
    • 2007-03-07
    • Hui ChenHaochuan ZhangNoel A. Manto
    • Hui ChenHaochuan ZhangNoel A. Manto
    • G01V8/00
    • G01V8/12
    • In a first aspect, a first apparatus is provided. The first apparatus includes a through-beam sensor coupled to a scrubber and adapted to detect a notch or flat of a substrate in the scrubber during processing. The through-beam sensor has (1) an emitter facing a first major surface of a substrate in the scrubber and adapted to transmit a beam toward an edge of the first major surface; and (2) a receiver facing a second major surface of the substrate and adapted to receive the beam transmitted from the emitter when the edge of the substrate does not obstruct the beam. Numerous other aspects are provided.
    • 在第一方面中,提供了一种第一装置。 第一装置包括耦合到洗涤器并适于在处理期间检测洗涤器中的基板的凹口或平面的通过光束传感器。 通过光束传感器具有(1)发射器面向洗涤器中的基板的第一主表面并且适于将光束传送到第一主表面的边缘; 和(2)接触器,其面对衬底的第二主表面,并且适于在衬底的边缘不阻挡光束时接收从发射器发射的光束。 提供了许多其他方面。