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    • 1. 发明授权
    • Magneto-resistor digitizer
    • 磁电阻数字转换器
    • US5243317A
    • 1993-09-07
    • US804738
    • 1991-12-11
    • Hsing ChenPie-Yu JeangSpring YehTing ChouPing-Wei Wang
    • Hsing ChenPie-Yu JeangSpring YehTing ChouPing-Wei Wang
    • G06F3/033G06F3/046H01C10/00
    • G06F3/046H01C10/00
    • A digitizer whose sensing elements are made of magnetoresistive materials is designed for use with a computer system. The digitizer board includes a substrate made of dielectric material; a first array of strip-shaped magneto-resistors arranged on the front surface of the substrate; a second array of strip-shaped magneto-resistors arranged on the reverse surface of the substrate; a plurality of analog comparators coupled to the magneto-resistors; and a pen with a magnetic pinpoint used for pointing to a particular location on the front side of the digitizer board. The resistance of the magneto-resistors will vary due to a magnetic field emerging from the nearby pinpoint, and the magnetic-resistors will be effected, and subsequently the comparators connected to the magneto-resistors will send digital signals to the computer system.
    • 感测元件由磁阻材料制成的数字化仪被设计用于计算机系统。 数字转换器板包括由介电材料制成的基板; 布置在所述基板的前表面上的第一阵列的带状磁阻电阻器; 布置在所述基板的相反表面上的第二阵列的带状磁电阻器; 耦合到所述磁电阻器的多个模拟比较器; 以及具有用于指向数字转换器板的前侧上的特定位置的磁性精确点的笔。 磁阻电阻的电阻将由于从附近的尖端产生的磁场而变化,并且磁阻将被实现,随后连接到磁阻的比较器将向计算机系统发送数字信号。
    • 3. 发明授权
    • Specimen preparation by focused ion beam technique
    • 通过聚焦离子束技术制备样品
    • US06251782B1
    • 2001-06-26
    • US09361027
    • 1999-07-23
    • Angela Y.C. LeeTing Chou
    • Angela Y.C. LeeTing Chou
    • H01L21302
    • G01N1/32
    • A method for preparing small area parallel lapping specimens by a focused ion beam technique is disclosed in which a multiple-staged ion beam milling process is used to prepare a specimen for microscopic examination. The method may be carried out by first providing a high current ion beam for removal of a top surface of a specimen exposing a surface that immediately covers the characteristic feature to be examined to define a small window area that contains the characteristic feature. The present invention novel method may further be combined with a wet etching step after the ion beam milling process is completed. In the wet etching step, a three dimensional surface containing the characteristic feature to be examined is revealed which can then be observed under a scanning electron microscope.
    • 公开了一种通过聚焦离子束技术制备小面积平行研磨试样的方法,其中使用多级离子束研磨方法制备用于显微镜检查的样品。 该方法可以通过首先提供高电流离子束来去除暴露表面的样品的顶表面,该表面立即覆盖待检查的特征,以限定包含特征特征的小窗口区域。 本发明的新方法可以在离子束研磨过程完成之后进一步与湿蚀刻步骤组合。 在湿蚀刻步骤中,显示出包含要检查的特征的三维表面,然后可以在扫描电子显微镜下观察。