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1. 发明授权

US07214910B2 On-chip power supply regulator and temperature control system 失效
标题翻译：片上电源调节器和温度控制系统
公开(公告)号：US07214910B2
公开(公告)日：2007-05-08
申请号：US10884933
申请日：2004-07-06
申请人： Howard Hao Chen , William J. Ferrante , Louis L. Hsu , Carl J. Radens
发明人： Howard Hao Chen , William J. Ferrante , Louis L. Hsu , Carl J. Radens
IPC分类号： H05B1/02
CPC分类号： G05D23/20 , G05D23/1931 , Y10T307/469
摘要： An on-chip temperature control system includes a temperature sensor, which monitors a temperature of a chip, and a hysteresis comparator which checks whether the temperature is in an acceptable range. A reference adjustment circuit is responsive to the hysteresis comparator to adjust an on-chip voltage to control the temperature locally by adjusting a local supply voltage, if the temperature is out of range.
摘要翻译：片上温度控制系统包括监测芯片温度的温度传感器和检查温度是否在可接受范围内的滞后比较器。如果温度超出范围，参考调节电路响应于迟滞比较器来调节片上电压以局部地调节局部电源电压来控制温度。

2. 发明授权

US07078259B2 Method for integrating thermistor 失效
标题翻译：热敏电阻集成方法
公开(公告)号：US07078259B2
公开(公告)日：2006-07-18
申请号：US10707746
申请日：2004-01-08
申请人： Jon A. Casey , William J. Ferrante , Edward W. Kiewra , Carl J. Radens , William R. Tonti
发明人： Jon A. Casey , William J. Ferrante , Edward W. Kiewra , Carl J. Radens , William R. Tonti
IPC分类号： H01L21/00
CPC分类号： H01L21/76895 , G01K7/226 , H01C7/006 , H01L21/76224 , H01L21/76838
摘要： A structure and method are provided for forming a thermistor. Isolation structures are formed in a substrate including at least an upper layer of a single crystal semiconductor. A layer of salicide precursor is deposited over the isolation region and the upper layer. The salicide precursor is then reacted with the upper layer to form a salicide self-aligned to the upper layer. Finally, the unreacted portions of the salicide precursor are then removed while preserving a portion of the salicide precursor over the isolation region as a body of the thermistor. An alternative integrated circuit thermistor is formed from a region of thermistor material in an embossed region of an interlevel dielectric (ILD).
摘要翻译：提供了用于形成热敏电阻的结构和方法。隔离结构形成在至少包括单晶半导体的上层的基板中。一层自杀化合物前体沉积在隔离区和上层上。然后将自对准硅化物前体与上层反应以形成与上层自对准的自对准硅化物。最后，除去自对准硅胶前体的未反应部分，同时在作为热敏电阻体的隔离区域上保留一部分自杀化合物前体。一种替代的集成电路热敏电阻由层间电介质（ILD）的压花区域中的热敏电阻材料的区域形成。

3. 发明授权

US07543198B2 Test data reporting and analyzing using data array and related data analysis 失效
标题翻译：使用数据阵列和相关数据分析测试数据报告和分析
公开(公告)号：US07543198B2
公开(公告)日：2009-06-02
申请号：US11163527
申请日：2005-10-21
申请人： William J. Ferrante , John J. Cassels , Stephen Wu
发明人： William J. Ferrante , John J. Cassels , Stephen Wu
IPC分类号： G06F11/00 , G11C29/00 , G01R31/28 , G01R31/02 , G01R31/26
CPC分类号： G11C29/56 , G01R31/31935 , G11C29/56008 , G11C2029/5604
摘要： Reporting and/or analyzing test data from a plurality of tests of an array structure using a data array. One method includes obtaining the test data, and reporting the test data in a data array, which includes at least two portions representing different tests. Data stored in the data array is organized according to a translation table, which describes the locations of data for tests and criteria for data to be analyzed within the data array. Numerous other data arrangements such as a coordinate file listing a pre-defined maximum number of fail points, or a chip report including fail points by chip may also be generated. The data array reports all test data in a more easily generated and stored form, and may be converted to an image. A data analysis method for analyzing data using the data array is also presented.
摘要翻译：使用数据阵列从阵列结构的多个测试报告和/或分析测试数据。一种方法包括获得测试数据，并将测试数据报告在数据阵列中，该数据阵列包括表示不同测试的至少两个部分。存储在数据阵列中的数据根据翻译表进行组织，该转换表描述了要在数据阵列中分析的数据的测试数据和标准的位置。也可以生成诸如列出预定义的最大失败点数的坐标文件或包括芯片故障点的芯片报告的许多其他数据布置。数据阵列以更容易生成和存储的形式报告所有测试数据，并可将其转换为图像。还提出了一种用于使用数据阵列分析数据的数据分析方法。

4. 发明授权

US07668683B2 Numerical test data reporting in an image file and subsequent analysis 有权
标题翻译：图像文件中的数字测试数据报告和后续分析
公开(公告)号：US07668683B2
公开(公告)日：2010-02-23
申请号：US11847584
申请日：2007-08-30
申请人： John J. Cassels , William J. Ferrante , Stephen Wu
发明人： John J. Cassels , William J. Ferrante , Stephen Wu
IPC分类号： G01R31/00
CPC分类号： G01R13/029 , G01R31/31703
摘要： The present disclosure is directed to numerical test data reporting using an image file and subsequent analysis of the test data. A method for capturing and analyzing test data in accordance with an embodiment includes: capturing multi-bit integer values of test data; writing each multi-bit integer value to a multi-bit vertical field in an image file; extracting the multi-bit integer values from the multi-bit vertical fields in the image file; and analyzing the extracted multi-bit integer values.
摘要翻译：本公开涉及使用图像文件的数值测试数据报告和随后的测试数据分析。根据实施例的用于捕获和分析测试数据的方法包括：捕获测试数据的多位整数值; 将每个多位整数值写入图像文件中的多位垂直字段; 从图像文件中的多位垂直字段中提取多位整数值; 并分析提取的多位整数值。

5. 发明申请

US20090063068A1 NUMERICAL TEST DATA REPORTING IN AN IMAGE FILE AND SUBSEQUENT ANALYSIS 有权
标题翻译：数字测试数据报告在图像文件和后续分析
公开(公告)号：US20090063068A1
公开(公告)日：2009-03-05
申请号：US11847584
申请日：2007-08-30
申请人： John J. Cassels , William J. Ferrante , Stephen Wu
发明人： John J. Cassels , William J. Ferrante , Stephen Wu
IPC分类号： G01R29/00 , G01R19/00 , G01R27/00
CPC分类号： G01R13/029 , G01R31/31703
摘要： The present disclosure is directed to numerical test data reporting using an image file and subsequent analysis of the test data. A method for capturing and analyzing test data in accordance with an embodiment includes: capturing multi-bit integer values of test data; writing each multi-bit integer value to a multi-bit vertical field in an image file; extracting the multi-bit integer values from the multi-bit vertical fields in the image file; and analyzing the extracted multi-bit integer values.
摘要翻译：本公开涉及使用图像文件的数值测试数据报告和随后的测试数据分析。根据实施例的用于捕获和分析测试数据的方法包括：捕获测试数据的多位整数值; 将每个多位整数值写入图像文件中的多位垂直字段; 从图像文件中的多位垂直字段中提取多位整数值; 并分析提取的多位整数值。

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