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1. 发明授权

US07668683B2 Numerical test data reporting in an image file and subsequent analysis 有权
标题翻译：图像文件中的数字测试数据报告和后续分析
公开(公告)号：US07668683B2
公开(公告)日：2010-02-23
申请号：US11847584
申请日：2007-08-30
申请人： John J. Cassels , William J. Ferrante , Stephen Wu
发明人： John J. Cassels , William J. Ferrante , Stephen Wu
IPC分类号： G01R31/00
CPC分类号： G01R13/029 , G01R31/31703
摘要： The present disclosure is directed to numerical test data reporting using an image file and subsequent analysis of the test data. A method for capturing and analyzing test data in accordance with an embodiment includes: capturing multi-bit integer values of test data; writing each multi-bit integer value to a multi-bit vertical field in an image file; extracting the multi-bit integer values from the multi-bit vertical fields in the image file; and analyzing the extracted multi-bit integer values.
摘要翻译：本公开涉及使用图像文件的数值测试数据报告和随后的测试数据分析。根据实施例的用于捕获和分析测试数据的方法包括：捕获测试数据的多位整数值; 将每个多位整数值写入图像文件中的多位垂直字段; 从图像文件中的多位垂直字段中提取多位整数值; 并分析提取的多位整数值。

2. 发明申请

US20090129185A1 SEMICONDUCTOR CIRCUITS CAPABLE OF SELF DETECTING DEFECTS 审中-公开
标题翻译：能够自行检测缺陷的半导体电路
公开(公告)号：US20090129185A1
公开(公告)日：2009-05-21
申请号：US11941996
申请日：2007-11-19
申请人： John J. Cassels , Jonathan Robert Fales , Muthukumarasamy Karthikeyan , Thomas Martin Maffitt
发明人： John J. Cassels , Jonathan Robert Fales , Muthukumarasamy Karthikeyan , Thomas Martin Maffitt
IPC分类号： G11C29/04
CPC分类号： G11C29/38
摘要： A digital circuit and a method for operating the same. The digital circuit includes (a) M×N regular cells electrically arranged in M rows and N columns, (b) N reference cells corresponding one-to-one to the N columns, and (c) N comparing circuits corresponding one-to-one to the N columns. Each regular cell is electrically coupled to a comparing circuit. Each reference cell is electrically coupled to the associated comparing circuit. Each regular cell includes a first tap node. Each reference cell includes P tap nodes. If a first voltage of the first tap node of a regular cell is between two voltages of two tap nodes of the P tap nodes of the associated reference cell, then the associated comparing circuit is capable of generating a first signal. If the first voltage is not between the two voltages, then the associated comparing circuit is capable of generating a second signal.
摘要翻译：数字电路及其操作方法。数字电路包括（a）以M行和N列电排列的M×N个常规单元，（b）与N列一一对应的N个参考单元，以及（c）N个比较电路对应于一对一 N列。每个常规单元电耦合到比较电路。每个参考单元电耦合到相关的比较电路。每个常规单元包括第一抽头节点。每个参考单元包括P抽头节点。如果规则单元的第一抽头节点的第一电压在相关参考单元的P抽头节点的两个抽头节点的两个电压之间，则相关联的比较电路能够产生第一信号。如果第一电压不在两个电压之间，则相关联的比较电路能够产生第二信号。

3. 发明申请

US20090063068A1 NUMERICAL TEST DATA REPORTING IN AN IMAGE FILE AND SUBSEQUENT ANALYSIS 有权
标题翻译：数字测试数据报告在图像文件和后续分析
公开(公告)号：US20090063068A1
公开(公告)日：2009-03-05
申请号：US11847584
申请日：2007-08-30
申请人： John J. Cassels , William J. Ferrante , Stephen Wu
发明人： John J. Cassels , William J. Ferrante , Stephen Wu
IPC分类号： G01R29/00 , G01R19/00 , G01R27/00
CPC分类号： G01R13/029 , G01R31/31703
摘要： The present disclosure is directed to numerical test data reporting using an image file and subsequent analysis of the test data. A method for capturing and analyzing test data in accordance with an embodiment includes: capturing multi-bit integer values of test data; writing each multi-bit integer value to a multi-bit vertical field in an image file; extracting the multi-bit integer values from the multi-bit vertical fields in the image file; and analyzing the extracted multi-bit integer values.
摘要翻译：本公开涉及使用图像文件的数值测试数据报告和随后的测试数据分析。根据实施例的用于捕获和分析测试数据的方法包括：捕获测试数据的多位整数值; 将每个多位整数值写入图像文件中的多位垂直字段; 从图像文件中的多位垂直字段中提取多位整数值; 并分析提取的多位整数值。

4. 发明授权

US07543198B2 Test data reporting and analyzing using data array and related data analysis 失效
标题翻译：使用数据阵列和相关数据分析测试数据报告和分析
公开(公告)号：US07543198B2
公开(公告)日：2009-06-02
申请号：US11163527
申请日：2005-10-21
申请人： William J. Ferrante , John J. Cassels , Stephen Wu
发明人： William J. Ferrante , John J. Cassels , Stephen Wu
IPC分类号： G06F11/00 , G11C29/00 , G01R31/28 , G01R31/02 , G01R31/26
CPC分类号： G11C29/56 , G01R31/31935 , G11C29/56008 , G11C2029/5604
摘要： Reporting and/or analyzing test data from a plurality of tests of an array structure using a data array. One method includes obtaining the test data, and reporting the test data in a data array, which includes at least two portions representing different tests. Data stored in the data array is organized according to a translation table, which describes the locations of data for tests and criteria for data to be analyzed within the data array. Numerous other data arrangements such as a coordinate file listing a pre-defined maximum number of fail points, or a chip report including fail points by chip may also be generated. The data array reports all test data in a more easily generated and stored form, and may be converted to an image. A data analysis method for analyzing data using the data array is also presented.
摘要翻译：使用数据阵列从阵列结构的多个测试报告和/或分析测试数据。一种方法包括获得测试数据，并将测试数据报告在数据阵列中，该数据阵列包括表示不同测试的至少两个部分。存储在数据阵列中的数据根据翻译表进行组织，该转换表描述了要在数据阵列中分析的数据的测试数据和标准的位置。也可以生成诸如列出预定义的最大失败点数的坐标文件或包括芯片故障点的芯片报告的许多其他数据布置。数据阵列以更容易生成和存储的形式报告所有测试数据，并可将其转换为图像。还提出了一种用于使用数据阵列分析数据的数据分析方法。

5. 发明申请

US20120139574A1 VERTICAL PROBE TIP ROTATIONAL SCRUB AND METHOD 审中-公开
标题翻译：垂直探头旋转滚筒和方法
公开(公告)号：US20120139574A1
公开(公告)日：2012-06-07
申请号：US12960604
申请日：2010-12-06
申请人： John J. Cassels , Garry L. Moore , Ronald A. Feroli
发明人： John J. Cassels , Garry L. Moore , Ronald A. Feroli
IPC分类号： G01R31/20
CPC分类号： G01R1/06733 , G01R1/07314 , G01R1/07392
摘要： A vertical probe tip rotational scrub and method is described. The vertical probe includes a wafer prober chuck; a wafer positioned on the wafer prober chuck; and at least one probe having a probe tip, the at least one probe tip rotatably mounted such that the probe tip provides a rotational scrub on a surface of a wafer surface. A method for wafer probing is also described, the method includes: determining a vertical location of a wafer surface relative to at least one probe having a probe tip; retracting the probe tip; and imparting an upward motion on the at least one probe in response to the retracting of the probe tip, wherein the upward motion results in a rotational scrub of the wafer surface.
摘要翻译：描述了垂直探针头旋转磨擦和方法。垂直探头包括晶圆探针卡盘; 位于晶片探针卡盘上的晶片; 以及至少一个探针，其具有探针尖端，所述至少一个探针尖端可旋转地安装成使得探针尖端在晶片表面的表面上提供旋转磨擦。还描述了用于晶片探测的方法，该方法包括：确定晶片表面相对于具有探针尖端的至少一个探针的垂直位置; 缩回探针尖; 并且响应于所述探针尖端的缩回而在所述至少一个探针上施加向上运动，其中所述向上运动导致所述晶片表面的旋转擦除。

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