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    • 10. 发明授权
    • Program method of multi-bit memory device and data storage system using the same
    • 多位存储器件和数据存储系统的程序方法使用相同
    • US08441862B2
    • 2013-05-14
    • US13080809
    • 2011-04-06
    • Hong Rak SonHan Woong YooJaehong KimJun Jin Kong
    • Hong Rak SonHan Woong YooJaehong KimJun Jin Kong
    • G11C16/06
    • G11C11/5628G11C16/3436
    • Provided is a program method of a multi-bit memory device with memory cells arranged in rows and columns. The program method includes a programming each memory cell of the first group of memory cells to a state within a first group of states according to a verify voltage level of a first group of verify voltage levels within a first range of levels, and programming each memory cell of the second group of memory cells to a state within a second group of states according to a verify voltage level of a second group of verify voltage levels within a second range of levels. The lowest verify voltage level in the second range of levels is higher than the highest verify voltage level in the first range of levels. A first voltage difference between adjacent verify voltage levels within the first range of levels is different from a second voltage difference between the highest verify voltage level of the second group of verify voltage levels and the lowest verify voltage level of the third group of verify voltage levels.
    • 提供了具有排列成行和列的存储单元的多位存储器件的编程方法。 程序方法包括根据第一级别的第一组验证电压电平的验证电压电平将第一组存储器单元的每个存储器单元编程到第一组状态内的状态,以及编程每个存储器 第二组存储器单元的单元根据在第二级别范围内的第二组验证电压电平的验证电压电平而处于第二组状态内的状态。 第二级别的最低验证电压电平高于第一级别范围内的最高验证电压电平。 在第一级别范围内的相邻验证电压电平之间的第一电压差不同于第二组验证电压电平的最高验证电压电平与第三组验证电压电平的最低验证电压电平之间的第二电压差 。