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    • 2. 发明申请
    • POLARIZATION CONVERSION LIGHT PIPE DEVICE
    • 极化转换灯管设备
    • US20060045456A1
    • 2006-03-02
    • US10711177
    • 2004-08-30
    • Po Liang ChiangYi Wei LiuHsin Wen TsaiHsueh Chen ChangCi Guang Peng
    • Po Liang ChiangYi Wei LiuHsin Wen TsaiHsueh Chen ChangCi Guang Peng
    • G02B6/27
    • G02B6/105
    • This invention provides a polarization conversion light pipe device suited for LCD- or LCoS-based projection applications. The polarization conversion light pipe device encompasses a light tunnel defined by four side reflection mirrors with a rectangular cross section. The light tunnel has a light entrance face at one end and a light exit face at the other end. A front reflection mirror having an aperture thereon is mounted on the light entrance face. A retardation plate for rotating the direction of an electric field of a polarized light beam is situated in the light tunnel. A polarization beam splitter module is situated between the exit face of the light tunnel and the retardation plate. The polarization beam splitter module has a reflective polarization beam splitting surface that is substantially 45 degree-inclined with respect to one of the side reflection mirrors.
    • 本发明提供一种适用于基于LCD或LCoS的投影应用的偏振转换光管装置。 偏振光转换光管装置包括由具有矩形横截面的四个侧反射镜限定的光通道。 光通道在一端具有光入射面,另一端具有光出射面。 其上具有孔的前反射镜安装在光入射面上。 用于旋转偏振光束的电场方向的延迟板位于光通道中。 偏振分束器模块位于光通道的出射面和延迟板之间。 偏振分束器模块具有相对于一个侧面反射镜基本上45度倾斜的反射偏振分束表面。
    • 4. 发明申请
    • OPTICAL SYSTEM FOR PROJECTION DISPLAY APPARATUSES
    • 用于投影显示设备的光学系统
    • US20060146289A1
    • 2006-07-06
    • US10905398
    • 2004-12-30
    • Po Liang ChiangYi Wei LiuHsin Wen TsaiHsueh-Chen ChangCi Guang Peng
    • Po Liang ChiangYi Wei LiuHsin Wen TsaiHsueh-Chen ChangCi Guang Peng
    • G03B21/14
    • H04N5/7416G03B21/2073
    • An optical system utilizing a unique polarizer separating plate to replace conventional PBS prism is disclosed. The optical system of this invention, which may be applied to projection display apparatuses such as rear projection type televisions, includes an illumination system for generating a homogeneous light beam, a polarizer separating plate comprising a polarization separation surface that splits the light beam into a first polarized light beam with a first polarization status and a second polarized light beam with a second polarization status, wherein the first polarized light beam propagates through a first aberration compensation lens to a first panel, and a second polarized light beam propagates through a second aberration compensation lens to a second panel. According to one embodiment, the polarizer separating plate includes two sheets of glass substrates having the same thickness and the polarization separation surface is sandwiched by the two sheets of glass substrates.
    • 公开了一种利用独特的偏振器分离板代替常规PBS棱镜的光学系统。 本发明的光学系统可以应用于投影型显示装置如背投型电视机,包括用于产生均匀光束的照明系统,偏振器分离板,其包括将光束分成第一 具有第一偏振状态的偏振光束和具有第二偏振状态的第二偏振光束,其中所述第一偏振光束通过第一像差补偿透镜传播到第一面板,并且第二偏振光束传播通过第二像差补偿 镜头到第二个面板。 根据一个实施例,偏振器分离板包括具有相同厚度的两片玻璃基板,并且偏振分离表面被两片玻璃基板夹在中间。
    • 10. 发明授权
    • Method of nano thin film thickness measurement by auger electron spectroscopy
    • 通过螺旋电子能谱法测量纳米薄膜厚度的方法
    • US07582868B2
    • 2009-09-01
    • US11192199
    • 2005-07-27
    • Zhi Cheng JiangShan Dan LiYuen Kwan KamYi Wei Liu
    • Zhi Cheng JiangShan Dan LiYuen Kwan KamYi Wei Liu
    • G01N23/00
    • G01B15/02G01N23/2276
    • A system and method for measuring the thickness of an ultra-thin multi-layer film on a substrate is disclosed. A physical model of an ultra-thin multilayer structure and Auger electron emission from the nano-multilayer structure is built. A mathematical model for the Auger Electron Spectroscopy (AES) measurement of the multilayer thin film thickness is derived according to the physical model. Auger electron spectroscopy (AES) is first performed on a series of calibration samples. The results are entered into the mathematical model to determine the parameters in the mathematical equation. The parameters may be calibrated by the correlation measurements of the alternate techniques. AES analysis is performed on the ultra-thin multi-layer film structure. The results are entered into the mathematical model and the thickness is calculated.
    • 公开了一种用于测量衬底上的超薄多层膜的厚度的系统和方法。 建立了超薄多层结构的物理模型和纳米多层结构的俄歇电子发射。 根据物理模型推导了多层薄膜厚度的俄歇电子能谱(AES)测量数学模型。 首先在一系列校准样品上进行俄歇电子能谱(AES)。 将结果输入到数学模型中以确定数学方程中的参数。 可以通过替代技术的相关性测量来校准参数。 对超薄多层膜结构进行AES分析。 将结果输入到数学模型中,并计算厚度。