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1. 发明授权

US09417163B2 Analyzer for substance 有权
标题翻译：物质分析仪
公开(公告)号：US09417163B2
公开(公告)日：2016-08-16
申请号：US14191622
申请日：2014-02-27
申请人： Hitachi, Ltd.
发明人： Hisashi Nagano , Yasuaki Takada , Yuichiro Hashimoto , Masakazu Sugaya , Hideo Kashima , Koichi Terada , Yasutaka Suzuki
IPC分类号： G01N1/22 , G01N33/00 , G01N15/00 , H01J49/04
CPC分类号： G01N1/2211 , G01N33/0057 , G01N2015/0046 , H01J49/0422
摘要： Provided is an analyzer for a substance, including: a first particle holding unit having a tubular shape; a first intake pipe for sucking a gas from an upper side of the first particle holding unit to cause a cyclonic phenomenon inside the first particle holding unit; a first supply pipe for supplying a sample containing particles, the first supply pipe being connected to a side surface of the first particle holding unit; a first flow control unit for controlling a flow rate of a gas flowing into the first particle holding unit to hold the rotationally moving particles inside the first particle holding unit for a predetermined time period and then cause the particles to settle, the first flow control unit being connected to a lower part of the first particle holding unit; a first collection heating unit for collecting and heating the settled particles; and an analysis unit for analyzing a substance vaporized from the particles through the heating by the first collection heating unit, the analysis unit being connected to the first collection heating unit through a pipe.
摘要翻译：本发明提供一种物质分析装置，包括：具有管状的第一颗粒保持单元; 用于从第一颗粒保持单元的上侧吸入气体以在第一颗粒保持单元内引起气旋现象的第一进气管; 用于供应含有颗粒的样品的第一供应管，所述第一供应管连接到所述第一颗粒保持单元的侧表面; 第一流量控制单元，用于控制流入第一颗粒保持单元的气体的流量，以将旋转移动的颗粒保持在第一颗粒保持单元内一段预定时间段，然后使颗粒沉降，第一流量控制单元连接到第一颗粒保持单元的下部; 第一采集加热单元，用于收集和加热沉降的颗粒; 以及分析单元，用于通过第一收集加热单元通过加热分析从颗粒蒸发的物质，分析单元通过管连接到第一收集加热单元。

2. 发明申请

US20150235831A1 ANALYSIS DEVICE AND ANALYSIS METHOD 审中-公开
标题翻译：分析装置和分析方法
公开(公告)号：US20150235831A1
公开(公告)日：2015-08-20
申请号：US14704460
申请日：2015-05-05
申请人： HITACHI, LTD.
发明人： Hisashi Nagano , Yasutaka Suzuki , Hideo Kashima , Yuichiro Hashimoto , Masuyuki Sugiyama , Masakazu Sugaya , Yasunori Doi , Koichi Terada
IPC分类号： H01J49/04
CPC分类号： H01J49/0422 , G01N1/2211 , G01N1/2214 , G01N33/0057 , G01N2001/028 , H01J49/00 , H01J49/0036 , H01J49/04 , H01J49/0459 , H01J49/0468 , Y02A50/25
摘要： Provided is a technique of analyzing particles in real time while collecting and condensing the particles continuously. Gas and/or particles as a detection target substance that are attached to an authentication target 2 are removed by air flow from a blowing region 5. The removed sample is sucked and is condensed and sampled at a sampling region 10, and ions of the sample are generated at an ion source 21 and are then subjected to mass analysis at a mass analysis region 23. Determination of the obtained mass spectrum is made as to the presence or not of a mass spectrum derived from the detection target substance, and a monitor 27 displays a result thereof. Thereby, the detection target substance attached to the authentication target 2 can be detected continuously in real time, promptly and with a less error rate.
摘要翻译：提供了一种在连续收集和冷凝颗粒时实时分析颗粒的技术。作为检测对象物质的作为检测对象物质的气体和/或颗粒被从吹扫区域5的空气流除去。将取出的样品抽吸并在采样区域10被冷凝并取样，并且样品的离子在离子源21处产生，然后在质量分析区域23进行质量分析。对获得的质谱进行测定，确定是否存在从检测目标物质得到的质谱，以及监测器27 显示其结果。因此，可以实时，及时且误码率较小的连续检测附着于认证对象2的检测对象物质。

3. 发明申请

US20140238106A1 ATTACHED MATTER TESTING DEVICE AND TESTING METHOD 有权
标题翻译：附带事项测试设备和测试方法
公开(公告)号：US20140238106A1
公开(公告)日：2014-08-28
申请号：US14349672
申请日：2012-10-02
申请人： Hitachi, Ltd.
发明人： Hideo Kashima , Masakazu Sugaya , Koichi Terada , Yasunori Doi , Yasutaka Suzuki , Hisashi Nagano , Yuichiro Hashimoto , Yasuaki Takada
IPC分类号： G01N33/00
CPC分类号： G01N33/0011 , G01N1/2202 , G01N2001/024 , G01N2001/028
摘要： Provided is a technique to identify a sample substance attached to an inspection target easily and precisely, while improving the rate of operation and reducing the number of persons required for inspection. A trace detecting system includes detection means to detect the size (vertical and horizontal dimensions) of an inspection target, and selects an air nozzle capable of spraying air jet at 15 m/s or more to the surface of the inspection target for air jet spraying.
摘要翻译：提供了一种在提高操作速度并减少检查人员数量的同时，容易且准确地识别附着在检查对象物上的样品物质的技术。轨迹检测系统包括用于检测检查对象的尺寸（垂直和水平尺寸）的检测装置，并且选择能够以15m / s以上喷射空气射流的空气喷嘴到用于喷气喷射的检查对象的表面。

4. 发明授权

US09696288B2 Attached matter testing device and testing method 有权
公开(公告)号：US09696288B2
公开(公告)日：2017-07-04
申请号：US14349672
申请日：2012-10-02
申请人： Hitachi, Ltd.
发明人： Hideo Kashima , Masakazu Sugaya , Koichi Terada , Yasunori Doi , Yasutaka Suzuki , Hisashi Nagano , Yuichiro Hashimoto , Yasuaki Takada
IPC分类号： G01N1/26 , G01N33/00 , G01N1/22 , G01N1/02
CPC分类号： G01N33/0011 , G01N1/2202 , G01N2001/024 , G01N2001/028
摘要： Provided is a technique to identify a sample substance attached to an inspection target easily and precisely, while improving the rate of operation and reducing the number of persons required for inspection. A trace detecting system includes detection means to detect the size (vertical and horizontal dimensions) of an inspection target, and selects an air nozzle capable of spraying air jet at 15 m/s or more to the surface of the inspection target for air jet spraying.

5. 发明授权

US10989632B2 Method for preparing standard sample for gas flow type analysis system 有权
公开(公告)号：US10989632B2
公开(公告)日：2021-04-27
申请号：US15822780
申请日：2017-11-27
申请人： Hitachi, Ltd.
发明人： Yasuaki Takada , Shun Kumano , Masuyuki Sugiyama , Hisashi Nagano , Tatsuo Nojiri , Hiroki Mizuno , Yuichiro Hashimoto
IPC分类号： G01N1/38 , G01N1/40 , G01N1/36 , G01N33/00 , G01N1/28 , G01N1/02 , G01N35/00
摘要： An object of the invention is to improve uniformity of a standard sample used for evaluating a gas flow type analysis system. The invention includes weighing a background into a container; adding a sample solution to the background; drying the sample solution; adding a solvent that can dissolve the sample into the container; and drying the solvent added to the container. The invention is also characterized in that the solvent is an organic solvent, in particular, acetone.

6. 发明授权

US09261437B2 Attached matter inspection device 有权
标题翻译：附件检查装置
公开(公告)号：US09261437B2
公开(公告)日：2016-02-16
申请号：US14422893
申请日：2013-06-12
申请人： Hitachi, Ltd.
发明人： Hideo Kashima , Masakazu Sugaya , Koichi Terada , Yasutaka Suzuki , Hisashi Nagano , Yasuaki Takada , Yuichiro Hashimoto
IPC分类号： H01J49/04 , G01N31/00 , G01N1/22 , G01N1/02
CPC分类号： G01N1/2211 , G01N1/22 , G01N2001/022 , G01N2001/028 , H01J49/0422
摘要： Sample fine particles attached to an inspection object are identified simply and with high accuracy, and an increase in operation rate and a decrease in device size are achieved. The inspection object is transported into a sampling chamber defined by a pair of side walls and an upper wall enclosing a part of a transport route of a transport unit. The inspection object is sprayed with compressed gas from an air nozzle, the peeled sample fine particles are aspirated into a collector, and the sample fine particles are separated from the aspirated gas for analysis. The air nozzle is disposed on one of the side walls defining the sampling chamber. The collector is disposed under the other side wall as a container independent from the sampling chamber.
摘要翻译：通过简单且高精度地识别附着在检查对象物上的微细颗粒，实现运转率的提高和装置尺寸的减小。检查对象被运送到由一对侧壁和封闭运输单元的运输路线的一部分的上壁限定的取样室中。将检查对象从空气喷嘴喷射压缩气体，将剥离后的样品微粒吸入集电体，将样品微粒与抽吸气体分离，进行分析。空气喷嘴设置在限定采样室的一个侧壁上。收集器作为独立于取样室的容器设置在另一侧壁的下面。

7. 发明授权

US09214324B2 Analysis device and analysis method 有权
标题翻译：分析装置及分析方法
公开(公告)号：US09214324B2
公开(公告)日：2015-12-15
申请号：US14704460
申请日：2015-05-05
申请人： HITACHI, LTD.
发明人： Hisashi Nagano , Yasutaka Iida , Hideo Kashima , Yuichiro Hashimoto , Masuyuki Sugiyama , Masakazu Sugaya , Yasunori Doi , Koichi Terada
IPC分类号： G01N1/22 , H01J49/04
CPC分类号： H01J49/0422 , G01N1/2211 , G01N1/2214 , G01N33/0057 , G01N2001/028 , H01J49/00 , H01J49/0036 , H01J49/04 , H01J49/0459 , H01J49/0468 , Y02A50/25
摘要： Provided is a technique of analyzing particles in real time while collecting and condensing the particles continuously. Gas and/or particles as a detection target substance that are attached to an authentication target 2 are removed by air flow from a blowing region 5. The removed sample is sucked and is condensed and sampled at a sampling region 10, and ions of the sample are generated at an ion source 21 and are then subjected to mass analysis at a mass analysis region 23. Determination of the obtained mass spectrum is made as to the presence or not of a mass spectrum derived from the detection target substance, and a monitor 27 displays a result thereof. Thereby, the detection target substance attached to the authentication target 2 can be detected continuously in real time, promptly and with a less error rate.
摘要翻译：提供了一种在连续收集和冷凝颗粒时实时分析颗粒的技术。作为检测对象物质的作为检测对象物质的气体和/或颗粒被从吹扫区域5的空气流除去。将取出的样品抽吸并在采样区域10被冷凝并取样，并且样品的离子在离子源21处产生，然后在质量分析区域23进行质量分析。对获得的质谱进行测定，确定是否存在从检测目标物质得到的质谱，以及监测器27 显示其结果。因此，可以实时，及时且误码率较小的连续检测附着于认证对象2的检测对象物质。

8. 发明授权

US10338028B2 Ion mobility separation device 有权
公开(公告)号：US10338028B2
公开(公告)日：2019-07-02
申请号：US14905484
申请日：2013-07-19
申请人： Hitachi, Ltd.
发明人： Yuichiro Hashimoto , Hideki Hasegawa , Masao Suga , Hiroyuki Satake
IPC分类号： G01N27/62 , G01N33/00 , H01J49/00
摘要： An ion mobility separation device includes: an ion source that generates an ion; a pair of flat-plate electrodes having an introduction opening and a discharge opening for the ion generated by the ion source; a pump for causing the ion introduced via the introduction opening of the pair of flat-plate electrodes to travel toward the discharge opening; a voltage control unit that applies an asymmetric time-varying voltage and a direct-current voltage to the pair of flat-plate electrodes; a plurality of detectors disposed in a direction orthogonal to both an ion travel direction due to the pump and an applied direction of the asymmetric time-varying voltage; and a signal processing unit that processes a signal detected by the plurality of detectors. The voltage control unit performs a total transmission measurement involving application of the voltages to the pair of flat-plate electrodes so as to generate equal fields at least at two different points in the direction orthogonal to both the ion travel direction due to the pump and the applied direction of the asymmetric time-varying voltage. Compared to conventional technology, both high accuracy and high throughput are achieved in an asymmetric field application-type ion mobility separation device.

9. 发明申请

US20150233796A1 ATTACHED MATTER INSPECTION DEVICE 有权
标题翻译：附件检查装置
公开(公告)号：US20150233796A1
公开(公告)日：2015-08-20
申请号：US14422893
申请日：2013-06-12
申请人： Hitachi, Ltd.
发明人： Hideo Kashima , Masakazu Sugaya , Koichi Terada , Yasutaka Suzuki , Hisashi Nagano , Yasuaki Takada , Yuichiro Hashimoto
IPC分类号： G01N1/22 , H01J49/04
CPC分类号： G01N1/2211 , G01N1/22 , G01N2001/022 , G01N2001/028 , H01J49/0422
摘要： Sample fine particles attached to an inspection object are identified simply and with high accuracy, and an increase in operation rate and a decrease in device size are achieved. The inspection object is transported into a sampling chamber defined by a pair of side walls and an upper wall enclosing a part of a transport route of a transport unit. The inspection object is sprayed with compressed gas from an air nozzle, the peeled sample fine particles are aspirated into a collector, and the sample fine particles are separated from the aspirated gas for analysis. The air nozzle is disposed on one of the side walls defining the sampling chamber. The collector is disposed under the other side wall as a container independent from the sampling chamber.
摘要翻译：通过简单且高精度地识别附着在检查对象物上的微细颗粒，实现运转率的提高和装置尺寸的减小。检查对象被运送到由一对侧壁和封闭运输单元的运输路线的一部分的上壁限定的取样室中。将检查对象从空气喷嘴喷射压缩气体，将剥离后的样品微粒吸入集电体，将样品微粒与抽吸气体分离，进行分析。空气喷嘴设置在限定采样室的一个侧壁上。收集器作为独立于取样室的容器设置在另一侧壁的下面。

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