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1. 发明授权

US11644545B2 Distance measuring device, distance measuring method, and three-dimensional shape measuring apparatus 有权
公开(公告)号：US11644545B2
公开(公告)日：2023-05-09
申请号：US16507124
申请日：2019-07-10
申请人： HITACHI, LTD.
发明人： Kenji Maruno , Masahiro Watanabe , Yuta Urano , Tatsuo Hariyama , Atsushi Taniguchi
IPC分类号： G01S7/484 , G01S17/10 , G02B27/28
CPC分类号： G01S7/484 , G01S17/10 , G02B27/286
摘要： A distance measuring device includes a light emitting unit that outputs a measurement light, a first polarization state control unit that controls a polarization state of the measurement light output from the light emitting unit, a second polarization state control unit that controls the polarization state of the measurement light of which a polarization state is controlled by the first polarization state control unit, and an optical path switching element that selects an emission direction of the measurement light of which a polarization state is controlled by the second polarization state control unit, in which the second polarization state control unit controls the polarization state of the measurement light so that the measurement lights are emitted from the optical path switching element in a plurality of the emission directions, and the optical path switching element receives a reflected light obtained by reflecting the emitted measurement light by an object.

2. 发明授权

US11421976B2 Shape measurement system, probe tip unit, and shape measurement method 有权
公开(公告)号：US11421976B2
公开(公告)日：2022-08-23
申请号：US17338207
申请日：2021-06-03
申请人： HITACHI, LTD.
发明人： Tatsuo Hariyama , Masahiro Watanabe , Atsushi Taniguchi , Kenji Maruno
IPC分类号： G01B9/02 , G01B9/02015
摘要： Provided is a shape measurement system in order to perform three-dimensional measurement corresponding to a measurement object having various shapes, which includes a measurement probe, a probe tip, and a processor. The probe tip includes an optical element that is configured to irradiate an object with measurement light and a cylindrical unit that is configured to lock the optical element. The processor is configured to calculate an optical path length from the optical element to an object based on reflected light of the measurement light with which the object is irradiated; and calculate a three-dimensional shape of the object based on the input information and the optical path length.

3. 发明授权

US11054242B2 Shape measurement system, probe tip unit, and shape measurement method 有权
公开(公告)号：US11054242B2
公开(公告)日：2021-07-06
申请号：US16694390
申请日：2019-11-25
申请人： HITACHI, LTD.
发明人： Tatsuo Hariyama , Masahiro Watanabe , Atsushi Taniguchi , Kenji Maruno
IPC分类号： G01B9/02
摘要： Provided is a shape measurement system in order to perform three-dimensional measurement corresponding to a measurement object having various shapes, which includes a measurement probe, a probe tip unit, and a calculation unit. The probe tip unit includes an optical element that is configured to irradiate an object with measurement light, a fixing mechanism that is configured to fix to the measurement probe so as to be detachable and replaceable, and a cylindrical unit that is configured to lock the optical element and is provided with the fixing mechanism.

4. 发明授权

US09541380B2 Shape measuring method and device 有权
标题翻译：形状测量方法和装置
公开(公告)号：US09541380B2
公开(公告)日：2017-01-10
申请号：US14433000
申请日：2013-10-02
申请人： HITACHI, LTD.
发明人： Hiroaki Kasai , Tatsuo Hariyama , Masahiro Watanabe
IPC分类号： G01B11/02 , G01B11/14 , G01B11/12 , G01B11/24 , G01C3/08 , G01S17/08 , G01S17/42 , G01S17/88 , G01S17/89 , G01S7/481
CPC分类号： G01B11/14 , G01B11/12 , G01B11/24 , G01B11/2441 , G01C3/08 , G01S7/4812 , G01S7/4813 , G01S7/4818 , G01S17/08 , G01S17/42 , G01S17/88 , G01S17/89
摘要： The purpose of the present invention is to provide a shape inspection device that improves, without making the device larger, durability and measurement precision by measuring a plurality of points with a single distance sensor. The present invention provides a shape measuring device that measures the shape of an object to be measured and that comprises: a distance sensor that calculates the distance to the object to be measure by irradiating a measurement light toward the object to be measured and detecting the reflected light from the object to be measured; a separating unit that separates the measurement light from the distance sensor into a plurality of measurement light rays to be irradiated onto a plurality of measuring points; and a selecting unit that selects, from the plurality of measurement light beams separated by the separating unit, the measurement light to irradiate the object to be measured.
摘要翻译：本发明的目的是提供一种形状检查装置，其通过用单个距离传感器测量多个点来改善而不使装置更大，耐久性和测量精度。本发明提供了一种测量待测物体的形状的形状测量装置，包括：距离传感器，其通过向测量对象照射测量光并计算被反射物体的距离来计算要测量的物体的距离来自待测物体的光; 分离单元，其将来自距离传感器的测量光分离成多个待照射到多个测量点上的测量光; 以及选择单元，其从由分离单元分离的多个测量光束中选择测量光以照射被测量物体。

5. 发明授权

US10900773B2 Distance measuring device and three-dimensional shape measuring apparatus 有权
公开(公告)号：US10900773B2
公开(公告)日：2021-01-26
申请号：US16484844
申请日：2018-05-22
申请人： Hitachi, Ltd.
发明人： Masahiro Watanabe , Tatsuo Hariyama , Atsushi Taniguchi , Kenji Maruno
IPC分类号： G01B11/24 , G01C3/08
摘要： An object is to provide a technology capable of realizing miniaturizing of a measurement unit in a distance measuring device. The distance measuring device including a light emitting unit that outputs measurement light, a polarization state control unit that controls polarization of the measurement light output from the light emitting unit, and an optical path switching element that selectively emits the measurement light controlled by the polarization state control unit, in which the polarization state control unit controls the polarization so as to emit the measurement light in a plurality of directions from the optical path switching element, and the optical path switching element receives reflected light with respect to an object of the measurement light emitted from the optical path switching element, the reflected light being used to measure a distance to the object.

6. 发明授权

US09733066B2 Shape measuring method and device 有权
公开(公告)号：US09733066B2
公开(公告)日：2017-08-15
申请号：US14898661
申请日：2014-04-28
申请人： Hitachi, Ltd.
发明人： Hiroaki Kasai , Tatsuo Hariyama , Masahiro Watanabe
IPC分类号： G01B11/30 , G01B11/02 , G01B11/12 , G01B11/24
CPC分类号： G01B11/026 , G01B11/12 , G01B11/24
摘要： The purpose of the present invention is to provide a shape measuring device and method, wherein the separation of light from one distance sensor increases measurement precision without increasing the size of the device. The present invention provides “a shape measuring device comprising: a distance sensor that radiates a laser toward a measurement target and detects the reflected light so as to calculate the distance to a measurement point; a separation unit that separates the light from the distance sensor into a plurality of light rays; a rotation unit that rotates the distance sensor and the measurement target relative to each other; and a data processing unit that integrates measurement results obtained from the distance sensor for the distances to a plurality of measurement points.”

7. 发明授权

US11635295B2 Shape measuring system and shape measuring method 有权
公开(公告)号：US11635295B2
公开(公告)日：2023-04-25
申请号：US17426203
申请日：2020-02-13
申请人： Hitachi, Ltd.
发明人： Tatsuo Hariyama , Masahiro Watanabe , Atsushi Taniguchi , Kenji Maruno , Akio Yazaki
IPC分类号： G01B11/24 , G01B11/14 , G01B9/02091
摘要： A shape of an object is measured with a high degree of accuracy. A shape measurement system comprises: a distance measuring head for irradiating an object with light and receiving light reflected from the object; a distance measuring device for generating a distance detection waveform on the basis of the reflected light; and a control device for analyzing the distance detection waveform and calculating a measured distance value to the object. The shape measurement system is characterized in that the control device calculates a feature amount of the distance detection waveform and performs at least one of a process of correcting an error in the measured distance value by substituting the feature amount into a correction formula and a process of performing a confidence weighting of an error in the measured distance value by substituting the feature amount into a confidence weighting formula.

8. 发明授权

US10436572B2 Three-dimensional shape measuring apparatus, three-dimensional shape measuring probe 有权
公开(公告)号：US10436572B2
公开(公告)日：2019-10-08
申请号：US15747789
申请日：2016-03-30
申请人： Hitachi, Ltd.
发明人： Masahiro Watanabe , Tatsuo Hariyama , Masayuki Kobayashi
IPC分类号： G01B11/00 , G01B9/02 , G01B11/24 , G01B11/26
摘要： An object of the present invention is to provide a compact and highly-accurate three-dimensional shape measurement apparatus. The three-dimensional shape measurement apparatus according to the present invention causes a part of a measurement light to proceed in a direction which is different from a direction with respect to a subject as an angle measurement light, and detects a rotation angle using the angle measurement light.

9. 发明申请

US20150241206A1 SHAPE MEASURING METHOD AND DEVICE 有权
标题翻译：形状测量方法和设备
公开(公告)号：US20150241206A1
公开(公告)日：2015-08-27
申请号：US14433000
申请日：2013-10-02
申请人： HITACHI, LTD.
发明人： Hiroaki Kasai , Tatsuo Hariyama , Masahiro Watanabe
IPC分类号： G01B11/14 , G01B11/24
CPC分类号： G01B11/14 , G01B11/12 , G01B11/24 , G01B11/2441 , G01C3/08 , G01S7/4812 , G01S7/4813 , G01S7/4818 , G01S17/08 , G01S17/42 , G01S17/88 , G01S17/89
摘要： The purpose of the present invention is to provide a shape inspection device that improves, without making the device larger, durability and measurement precision by measuring a plurality of points with a single distance sensor. The present invention provides a shape measuring device that measures the shape of an object to be measured and that comprises: a distance sensor that calculates the distance to the object to be measure by irradiating a measurement light toward the object to be measured and detecting the reflected light from the object to be measured; a separating unit that separates the measurement light from the distance sensor into a plurality of measurement light rays to be irradiated onto a plurality of measuring points; and a selecting unit that selects, from the plurality of measurement light beams separated by the separating unit, the measurement light to irradiate the object to be measured.
摘要翻译：本发明的目的是提供一种形状检查装置，其通过用单个距离传感器测量多个点来改善而不使装置更大，耐久性和测量精度。本发明提供了一种测量待测物体的形状的形状测量装置，包括：距离传感器，其通过向测量对象照射测量光并计算被反射物体的距离来计算要测量的物体的距离来自待测物体的光; 分离单元，其将来自距离传感器的测量光分离成多个待照射到多个测量点上的测量光; 以及选择单元，其从由分离单元分离的多个测量光束中选择测量光以照射被测量物体。

10. 发明授权

US09062965B2 Multi-point measuring apparatus and method of FBG sensor having multiple delaying fibers 有权
标题翻译：具有多个延迟光纤的FBG传感器的多点测量装置和方法
公开(公告)号：US09062965B2
公开(公告)日：2015-06-23
申请号：US13655998
申请日：2012-10-19
申请人： Hitachi, Ltd.
发明人： Minoru Yoshida , Masahiro Watanabe , Tatsuo Hariyama
IPC分类号： G01B11/16 , G01D5/353
CPC分类号： G01B11/165 , G01D5/35303 , G01D5/35316 , G01D5/35387 , G01D5/3539
摘要： A multi-point measuring apparatus of FBG sensor has an optical fiber, a wide-band wavelength light source, a light-source side light modulator for controlling time of a light entering into the optical fiber, among lights from this light source, a detector side light modulator for controlling time, during which a reflection light from a diffraction grating of the optical fiber penetrates through, a wavelength shift amount calculator for processing a signal obtained through detection of the reflection light from this light modulator, a temperature/distortion calculator for calculating an amount of deformation of a target to be measured from a result of this calculator, and a display portion for displaying information relating to the amount of deformation of this target to be measured.
摘要翻译： FBG传感器的多点测量装置具有光纤，宽带波长光源，用于控制进入光纤的光的时间的光源侧光调制器，来自该光源的光，检测器用于控制来自光纤的衍射光栅的反射光穿透的时间的波长偏移量计算器，用于处理通过来自该光调制器的反射光的检测而获得的信号的波长偏移量计算器，温度/失真计算器从该计算器的结果计算要测量的目标的变形量，以及用于显示与该待测对象的变形量有关的信息的显示部。

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