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1. 发明授权

US11421976B2 Shape measurement system, probe tip unit, and shape measurement method 有权
公开(公告)号：US11421976B2
公开(公告)日：2022-08-23
申请号：US17338207
申请日：2021-06-03
申请人： HITACHI, LTD.
发明人： Tatsuo Hariyama , Masahiro Watanabe , Atsushi Taniguchi , Kenji Maruno
IPC分类号： G01B9/02 , G01B9/02015
摘要： Provided is a shape measurement system in order to perform three-dimensional measurement corresponding to a measurement object having various shapes, which includes a measurement probe, a probe tip, and a processor. The probe tip includes an optical element that is configured to irradiate an object with measurement light and a cylindrical unit that is configured to lock the optical element. The processor is configured to calculate an optical path length from the optical element to an object based on reflected light of the measurement light with which the object is irradiated; and calculate a three-dimensional shape of the object based on the input information and the optical path length.

2. 发明授权

US10900773B2 Distance measuring device and three-dimensional shape measuring apparatus 有权
公开(公告)号：US10900773B2
公开(公告)日：2021-01-26
申请号：US16484844
申请日：2018-05-22
申请人： Hitachi, Ltd.
发明人： Masahiro Watanabe , Tatsuo Hariyama , Atsushi Taniguchi , Kenji Maruno
IPC分类号： G01B11/24 , G01C3/08
摘要： An object is to provide a technology capable of realizing miniaturizing of a measurement unit in a distance measuring device. The distance measuring device including a light emitting unit that outputs measurement light, a polarization state control unit that controls polarization of the measurement light output from the light emitting unit, and an optical path switching element that selectively emits the measurement light controlled by the polarization state control unit, in which the polarization state control unit controls the polarization so as to emit the measurement light in a plurality of directions from the optical path switching element, and the optical path switching element receives reflected light with respect to an object of the measurement light emitted from the optical path switching element, the reflected light being used to measure a distance to the object.

3. 发明授权

US10794687B2 Shape measurement system and shape measurement method 有权
公开(公告)号：US10794687B2
公开(公告)日：2020-10-06
申请号：US15928693
申请日：2018-03-22
申请人： Hitachi, Ltd.
发明人： Atsushi Taniguchi , Masahiro Watanabe
IPC分类号： G01B11/24 , G06T7/62 , G06T7/00 , G06T7/579 , G01N21/954
摘要： Provided are a system and a method capable of accurately measuring consecutive shapes of a measurement target even when an imaging means, which captures images of the shape of the measurement target, is moved along the measurement target while irradiating the measurement target with light. The present invention comprises a light source, an irradiating body which irradiates the measurement object with light from the light source, an imaging body which captures images of the measurement object based on the light from the irradiating body with which the measurement object was irradiated, a moving mechanism which causes the irradiating body and the imaging body to move along the measurement object, and a processing unit which executes data processing for measuring the shape of the measurement object based on images of the measurement object, wherein the imaging body incorporates an image of the measurement object at each predetermined timing upon moving along the measurement object, and wherein processing unit determines a cross section shape of the measurement object and a moving mode of the moving mechanism based on images of the measurement object, and measures the shape of the measurement object based on the cross section shape and the moving mode.

4. 发明授权

US11054242B2 Shape measurement system, probe tip unit, and shape measurement method 有权
公开(公告)号：US11054242B2
公开(公告)日：2021-07-06
申请号：US16694390
申请日：2019-11-25
申请人： HITACHI, LTD.
发明人： Tatsuo Hariyama , Masahiro Watanabe , Atsushi Taniguchi , Kenji Maruno
IPC分类号： G01B9/02
摘要： Provided is a shape measurement system in order to perform three-dimensional measurement corresponding to a measurement object having various shapes, which includes a measurement probe, a probe tip unit, and a calculation unit. The probe tip unit includes an optical element that is configured to irradiate an object with measurement light, a fixing mechanism that is configured to fix to the measurement probe so as to be detachable and replaceable, and a cylindrical unit that is configured to lock the optical element and is provided with the fixing mechanism.

5. 发明授权

US11635295B2 Shape measuring system and shape measuring method 有权
公开(公告)号：US11635295B2
公开(公告)日：2023-04-25
申请号：US17426203
申请日：2020-02-13
申请人： Hitachi, Ltd.
发明人： Tatsuo Hariyama , Masahiro Watanabe , Atsushi Taniguchi , Kenji Maruno , Akio Yazaki
IPC分类号： G01B11/24 , G01B11/14 , G01B9/02091
摘要： A shape of an object is measured with a high degree of accuracy. A shape measurement system comprises: a distance measuring head for irradiating an object with light and receiving light reflected from the object; a distance measuring device for generating a distance detection waveform on the basis of the reflected light; and a control device for analyzing the distance detection waveform and calculating a measured distance value to the object. The shape measurement system is characterized in that the control device calculates a feature amount of the distance detection waveform and performs at least one of a process of correcting an error in the measured distance value by substituting the feature amount into a correction formula and a process of performing a confidence weighting of an error in the measured distance value by substituting the feature amount into a confidence weighting formula.

6. 发明授权

US11644545B2 Distance measuring device, distance measuring method, and three-dimensional shape measuring apparatus 有权
公开(公告)号：US11644545B2
公开(公告)日：2023-05-09
申请号：US16507124
申请日：2019-07-10
申请人： HITACHI, LTD.
发明人： Kenji Maruno , Masahiro Watanabe , Yuta Urano , Tatsuo Hariyama , Atsushi Taniguchi
IPC分类号： G01S7/484 , G01S17/10 , G02B27/28
CPC分类号： G01S7/484 , G01S17/10 , G02B27/286
摘要： A distance measuring device includes a light emitting unit that outputs a measurement light, a first polarization state control unit that controls a polarization state of the measurement light output from the light emitting unit, a second polarization state control unit that controls the polarization state of the measurement light of which a polarization state is controlled by the first polarization state control unit, and an optical path switching element that selects an emission direction of the measurement light of which a polarization state is controlled by the second polarization state control unit, in which the second polarization state control unit controls the polarization state of the measurement light so that the measurement lights are emitted from the optical path switching element in a plurality of the emission directions, and the optical path switching element receives a reflected light obtained by reflecting the emitted measurement light by an object.

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