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    • 6. 发明授权
    • Austenitic heat resistant alloy
    • 奥氏体耐热合金
    • US08313591B2
    • 2012-11-20
    • US12647028
    • 2009-12-24
    • Hiroyuki HirataAtsuro IsedaHirokazu OkadaHiroyuki SembaKaori KawanoOsamu Miyahara
    • Hiroyuki HirataAtsuro IsedaHirokazu OkadaHiroyuki SembaKaori KawanoOsamu Miyahara
    • C22C30/00C22C19/05
    • C22C38/44C21D6/001C21D6/002C21D6/004C22C38/001C22C38/002C22C38/008C22C38/02C22C38/04C22C38/06C22C38/50C22C38/52C22C38/54F22B37/04
    • An austenitic heat resistant alloy, which contains, by mass percent, C≦0.15%, Si≦2%, Mn≦3%, Ni: 40 to 80%, Cr: 15 to 40%, W and Mo: 1 to 15% in total content, Ti≦3%, Al≦3%, N≦0.03%, O≦0.03%, with the balance being Fe and impurities, and among the impurities P≦0.04%, S≦0.03%, Sn≦0.1%, As≦0.01%, Zn≦0.01%, Pb≦0.01% and Sb≦0.01%, and satisfies the conditions [P1=S+{(P+Sn)/2}+{(As+Zn+Pb+Sb)/5}≦0.050], [0.2≦P2=Ti+2Al≦7.5−10×P1], [P2≦9.0−100×O] and [N≦0.002×P2+0.019] can prevent both the liquation crack in the HAZ and the brittle crack in the HAZ and also can prevent defects due to welding fabricability, which occur during welding fabrication, and moreover has excellent creep strength at high temperatures. Therefore, the alloy can be used suitably as a material for constructing high temperature machines and equipment, such as power generating boilers, plants for the chemical industry and so on. The ally may contain a specific amount or amounts of one or more elements selected from Co, B, Ta, Hf, Nb, Zr, Ca, Mg, Y, La, Ce and Nd.
    • 一种奥氏体耐热合金,以质量%计含有0.15%,Si&NlE; 2%,Mn&NlE; 3%,Ni:40〜80%,Cr:15〜40%,W和Mo:1〜15% 在总含量中,Ti&NlE; 3%,Al&NlE; 3%,N& NlE; 0.03%,O&NlE; 0.03%,余量为Fe和杂质,杂质P< L; 0.04%,S&NlE; 0.03%,Sn& ,As / nlE; 0.01%,Zn和nlE; 0.01%,Pb和nlE; 0.01%和Sb≦̸ 0.01%,满足条件[P1 = S + {(P + Sn)/ 2} + {(As + Zn + Pb + Sb)/ 5}≦̸ 0.050],[0.2≦̸ P2 = Ti + 2Al≦̸ 7.5-10×P1],[P2≦̸ 9.0-100×O]和[N< lE; 0.002×P2 + 0.019]可以防止液化裂纹 HAZ和HAZ中的脆性裂纹,并且还可以防止在焊接制造期间发生的焊接可制造性的缺陷,并且还在高温下具有优异的蠕变强度。 因此,该合金可以适当地用作构成发电锅炉,化工工业用等的高温机器和设备的材料。 盟友可以含有一定量或数量的选自Co,B,Ta,Hf,Nb,Zr,Ca,Mg,Y,La,Ce和Nd中的一种或多种元素。
    • 9. 发明授权
    • Surface inspection apparatus
    • 表面检查装置
    • US07432700B2
    • 2008-10-07
    • US10999021
    • 2004-11-29
    • Hiroyuki Hirata
    • Hiroyuki Hirata
    • G01R31/00
    • H01L21/67288H01L21/68728
    • A surface inspection apparatus, comprising a wafer table rotated by a motor, a pair of clamp arms rotatably mounted with respect to the wafer table, pushing means for pushing the clamp arms so as to rotate in the direction toward the center, positioning seats in arcuate shape mounted on the wafer table where a peripheral portion of a wafer is placed, and clamp pawls in arcuate shape coming into contact with a peripheral edge of the wafer, wherein the clamp arms are rotated around positions which are different from the rotation center of the motor, the clamp pawls are separated from the positioning seats when the clamp arm is rotated on a position opposite to the center, and the peripheral edge of the wafer is clamped between the positioning seats and the clamp pawls when the clamp arm is in clamping condition.
    • 一种表面检查装置,包括由电动机旋转的晶片台,相对于晶片台可旋转地安装的一对夹臂,用于推动夹持臂以朝向中心的方向旋转的推动装置,将座椅定位在弓形 形状安装在晶片台上,其中放置晶片的周边部分,并且夹具与弓形周边边缘接触的弓形形状,其中夹持臂围绕与晶片的旋转中心不同的位置旋转 电动机时,当夹臂在与中心相反的位置旋转时,夹爪与定位座分开,并且当夹臂处于夹紧状态时,晶片的周边边缘夹在定位座和夹爪之间 。