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    • 2. 发明授权
    • Logic circuit
    • 逻辑电路
    • US4774620A
    • 1988-09-27
    • US98768
    • 1987-09-17
    • Hiromu EnomotoYasushi YasudaMasao KumagaiAkinori Tahara
    • Hiromu EnomotoYasushi YasudaMasao KumagaiAkinori Tahara
    • H03K19/088H03K17/082H03K17/60H03K19/003H02H3/20
    • H03K19/00307H03K17/0826
    • A logic circuit which reduces occurrence of breakdown of the pull-down transistor and pull-up transistor in the output stage when a high voltage is applied to the power supply line and ensures high voltage resistance. The logic circuit controls a pull-up transistor provided between a first power supply and an output terminal which turns ON and OFF in accordance with a collector voltage of a phase splitter transistor and controls the pull-down transistor provided between the second power supply and output terminal with an emitter voltage. Breakdown of the pull-down and pull-up transistors can be reduced and a high voltage resistance ensured by providing a protection circuit which discharges the base of the pull-down transistor and turns OFF the pull-down transistor by detecting when a voltage difference between the first power supply and the second power supply exceeds a specified value.
    • 一种逻辑电路,当向电源线施加高电压并且确保高电压电阻时,减小输出级中的下拉晶体管和上拉晶体管的击穿的发生。 所述逻辑电路控制设置在第一电源和输出端之间的上拉晶体管,所述上拉晶体管根据分相晶体管的集电极电压而导通和截止,并控制所述第二电源和输出端之间提供的下拉晶体管 端子具有发射极电压。 可以减小下拉和上拉晶体管的故障,并通过提供一个保护电路来确保高电压电阻,该保护电路对下拉晶体管的基极进行放电,并通过检测下拉晶体管的电压差 第一电源和第二电源超过规定值。
    • 8. 发明授权
    • Semiconductor device
    • 半导体器件
    • US4680600A
    • 1987-07-14
    • US921811
    • 1986-10-21
    • Akinori TaharaHiromu EnomotoYasushi Yasuda
    • Akinori TaharaHiromu EnomotoYasushi Yasuda
    • H01L27/04H01L21/822H01L23/60H01L27/02H01L29/861H03K19/003H01L29/56H01L29/90
    • H01L27/0248H03K19/00307
    • A semiconductor device such as a TTL-type integrated circuit device which has an input protection circuit for each inner circuit, e.g., each TT logic gate. The input protection circuit is formed on a semiconductor substrate of a first conductivity type, and includes a first impurity region having a second conductivity type connected to an external terminal and an island-shape formed on the semiconductor substrate surrounded by an isolation region having the first conductivity type. The device also includes a clamp diode formed on an electrode layer contacting with the first impurity region. The device further includes a PN junction type protection diode formed on a second impurity region having the first conductivity type; the protection diode crosses the first impurity region between the clamp diode and a portion of the first impurity region connected to the external terminal and reaches the isolation region. The reverse withstand voltage of the PN junction type protection diode is smaller than that of the clamp diode, thereby preventing excessive reverse current flow and avoiding permanent destruction of the clamp diode.
    • 诸如TTL型集成电路器件的半导体器件,其具有用于每个内部电路的输入保护电路,例如每个TT逻辑门。 输入保护电路形成在第一导电类型的半导体衬底上,并且包括具有连接到外部端子的第二导电类型的第一杂质区域和在由具有第一导电类型的隔离区域包围的半导体衬底上形成的岛状 导电类型。 该器件还包括形成在与第一杂质区接触的电极层上的钳位二极管。 该器件还包括形成在具有第一导电类型的第二杂质区上的PN结型保护二极管; 保护二极管穿过钳位二极管与连接到外部端子的第一杂质区域的一部分之间的第一杂质区域并到达隔离区域。 PN结型保护二极管的反向耐压小于钳位二极管的反向耐压,从而防止过大的反向电流流动,并避免钳位二极管的永久性破坏。