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1. 发明授权

US4005396A Digital displacement sensor with zigzag coils 失效
标题翻译：具有锯齿形线圈的数字位移传感器
公开(公告)号：US4005396A
公开(公告)日：1977-01-25
申请号：US524867
申请日：1974-11-18
申请人： Hideo Fujiwara , Yukio Ichinose , Kazuo Ichino , Isamu Orita , Yasutaro Uesaka , Michiyasu Itoh , Hisashi Thuruoka
发明人： Hideo Fujiwara , Yukio Ichinose , Kazuo Ichino , Isamu Orita , Yasutaro Uesaka , Michiyasu Itoh , Hisashi Thuruoka
IPC分类号： G01D5/20 , H03M1/00 , G08C9/04 , G08C19/28
CPC分类号： G01D5/2073 , H03M1/26
摘要： A digital displacement sensor includes a plurality of zigzag coils provided with projecting or convex portions having different pitches and arranged on the surface of a flat plate. A magnetic head consisting of a magnetic body and a coil is wound around part of the magnetic body, the magnetic head being supported so as to be moved, while maintaining a given gap from the surface of the flat plate, whereby a digital signal corresponding to the displacement of the magnetic head is sensed by means of a plurality of zigzag coils.
摘要翻译：数字位移传感器包括设置有具有不同间距的凸起部分并且布置在平板的表面上的多个Z字形线圈。由磁体和线圈构成的磁头缠绕在磁体的一部分上，磁头被支撑以便移动，同时保持与平板的表面给定的间隙，由此对应于通过多个之字形线圈来检测磁头的位移。

2. 发明授权

US4031496A Variable inductor 失效
标题翻译：可变电感
公开(公告)号：US4031496A
公开(公告)日：1977-06-21
申请号：US485626
申请日：1974-07-03
申请人： Hideo Fujiwara , Yukio Ichinose , Satoshi Taniguchi , Tsutomu Kobayashi , Kazuo Ichino , Michiyasu Itoh , Yasutaro Uesaka , Fumiyuki Inose , Sadayasu Ueno
发明人： Hideo Fujiwara , Yukio Ichinose , Satoshi Taniguchi , Tsutomu Kobayashi , Kazuo Ichino , Michiyasu Itoh , Yasutaro Uesaka , Fumiyuki Inose , Sadayasu Ueno
IPC分类号： G01D5/20 , G01D5/22 , H01F21/06 , H01F29/10
CPC分类号： H01F21/06 , G01D5/2046 , G01D5/2258 , H01F29/10
摘要： A variable inductor wherein two closed magnetic circuits each having a predetermined gap in one place are constructed of a movable magnetic core and a fixed magnetic core. When the movable magnetic core is moved, the opposite area between both the magnetic cores in one of the closed magnetic circuits increases, while the opposite area between both the magnetic cores in the other closed magnetic circuit decreases. Thus, the inductances of coils wound around parts of the respective closed magnetic circuits vary complementarily.
摘要翻译：一种可变电感器，其中在一个位置具有预定间隙的两个闭合磁路由可移动磁芯和固定磁芯构成。当可移动磁芯移动时，一个闭合磁路中的两个磁芯之间的相对区域增加，而另一个闭合磁路中的两个磁芯之间的相对区域减小。因此，缠绕在各个闭合磁路的一部分上的线圈的电感互补地变化。

3. 发明授权

US4219730A Charge-particle energy analyzer 失效
标题翻译：电荷粒子能量分析仪
公开(公告)号：US4219730A
公开(公告)日：1980-08-26
申请号：US936928
申请日：1978-08-25
申请人： Isao Ishikawa , Yoshitaka Goto , Michiyasu Itoh
发明人： Isao Ishikawa , Yoshitaka Goto , Michiyasu Itoh
IPC分类号： G01N23/227 , G01N23/225 , G01Q30/02 , G01Q90/00 , G01T1/36 , G21K1/087 , H01J37/256 , H01J49/44 , H01J49/48 , H01J39/00
CPC分类号： H01J37/256 , G01N23/225 , G21K1/087 , H01J49/482
摘要： A charged-particle energy analyzer having means for irradiating a sample with a primary electron beam, deflecting electrode means which focus charged particle flux emitted from the sample onto a center axis of the primary electron beam or onto an identical circumference with its center on the axis, a slit disposed at the focus point of the charged particles, an energy analyzer whose object point lies at the focus point, a detector for detecting the charged particles analyzed by the energy analyzer, and charged particle flux deflecting means provided between the sample and the detector, for shielding by one part of the charged particle flux focused in a true circular form, to thereby make it possible not only to set a wide accepted solid angle for signals but also to get an information as to the concave or convex surface condition of the sample at the measured portion.
摘要翻译：一种带电粒子能量分析仪，其具有用于用一次电子束照射样品的装置，将从样品发射的带电粒子通量聚焦到一次电子束的中心轴上的偏转电极装置或与其一致的圆周上的中心在轴上的偏转电极装置设置在带电粒子的聚焦点的狭缝，物点在焦点处的能量分析器，用于检测由能量分析器分析的带电粒子的检测器，以及设置在样品和样品之间的带电粒子通量偏转装置检测器，用于通过以真圆形形式聚焦的一部分带电粒子通量进行屏蔽，从而不仅能够为信号设置广泛接受的立体角，而且可以获得关于凹面或凸面状况的信息在测量部分的样品。

4. 发明授权

US4939030A Film for retaining freshness of vegetables and fruits 失效
标题翻译：保留蔬菜和水果新鲜的电影
公开(公告)号：US4939030A
公开(公告)日：1990-07-03
申请号：US395040
申请日：1989-08-17
申请人： Shoichi Tsuji , Hazime Musika , Michiyasu Itoh , Junko Hayakawa , Eiji Miyashita
发明人： Shoichi Tsuji , Hazime Musika , Michiyasu Itoh , Junko Hayakawa , Eiji Miyashita
IPC分类号： A23L3/3418 , B32B5/22
CPC分类号： A23L3/3418 , B32B5/22 , Y10S428/913 , Y10T428/1352 , Y10T428/1376 , Y10T428/249978 , Y10T428/24998
摘要： Provided is a film for retaining freshness of vegetables and fruits which comprises a synthetic resin film, a microporous resin film and a water-absorbing layer interposed between both said films, said microporous resin film having a maximum pore diameter not larger than 30 microns and a moisture permeability not lower than 100 g/m.sup.2 /24 hr.

5. 发明授权

US4135088A Charged-particle analyzer 失效
标题翻译：充电粒子分析仪
公开(公告)号：US4135088A
公开(公告)日：1979-01-16
申请号：US810970
申请日：1977-06-28
申请人： Isao Ishikawa , Michiyasu Itoh , Katsuhisa Usami
发明人： Isao Ishikawa , Michiyasu Itoh , Katsuhisa Usami
IPC分类号： G01N23/227 , G01N23/225 , G05B7/02 , H01J49/44 , H01J49/48 , H01J39/00
CPC分类号： G01N23/225 , H01J49/482 , H01J2237/05
摘要： A charged-particle beam correction arrangement for a charged-particle analyzer having deflecting electrodes which focus charged particles emitted from a sample onto a center axis, an extension thereof, or onto an identical circumference with its center on the axis, a slit which is disposed at the focus point, and an energy analyzer whose object point lies at the focus point. The charged-particle beam correction arrangement is disposed axially symmetrically in the vicinity of the path of the charged particles between the sample and the slit to correct a deformation in the focusing of the charged-particle beam. BACKGROUND OF THE INVENTIONThe present invention relates to a charged-particle analyzer.For the analysis of a feeble electron beam of low energy, such as Auger electrons and photoelectrons in the surface analysis, it is important to efficiently utilize the electrons emitted from a sample. Accordingly, it is necessary that the accepted solid angle (= the solid angle of electron rays entering an analyzing system/the entire solid angle of electron rays emitted from a sample) be wide.As an optimum structure based on such requirement, an analyzing equipment shown in FIG. 1 has been proposed (Japanese Patent Application No. 12283/76). The feature of this equipment is that a deflecting system consisting of two inner and outer electrodes is arranged axially symmetrically around a sample and that signals emitted from the sample and entering the deflecting system are caused to depict a greatly curved track, whereupon they are focused on the center axis of the equipment or a circumference with its center on the axis again. Further, at a stage succeeding the deflecting system, an analyzing system is arranged in such electrooptical relation that the point of the above focusing is considered as the emission point of the signals. Thus, an energy analysis of photo-electrons, Auger electrons, etc. is carried out.FIG. 1 is a constructional view showing the prior art equipment described above including an electron gun. An electron beam 2 produced from the electron gun is focused by a focusing lens 3, and irradiates a sample 4. Charged particles 5, such as Auger electrons, are emitted from the irradiated point P of the sample 4 in substantially the COS-Law spacial distribution. Among the charged particles, rays of electrons are surrounded by two cones whose vertexes are the point P and whose half vertical angles are .theta. + a and .theta. - a, which rays enter between deflecting electrodes 6 and 7. The deflecting electrodes 6 and 7 are disposed axially symmetrically and are L-shaped in section so as to form a double electrode system.Within the deflecting electrode system, the rays of electrons depict greatly curved tracks owing to a deflecting electric field. Further, the rays of electrons have the tracks corrected by an auxiliary electrode 8 and are converged in the first order of the angle a onto a slit 9 situated at a stage succeeding the auxiliary electrode 8. After passing through the slit 9, the rays travel so as to cross on the axis of the equipment. They are subjected then to the energy analysis by a cylindrical mirror type analyzer 10 arranged after the slit 9 with only electrons having certain specific energy being converged onto a detection slit 9' which is placed on the axis, signals being detected by a detector 11 which is disposed behind the detecting slit 9'.The energy analysis of the charged particles 5 emitted from the sample becomes possible in such a way that voltages to be applied to the deflecting electrodes 6, 7, the auxiliary electrode 8, and the electrode of the cylindrical mirror type analyzer 10 are appropriately selected with divider resistances 12, 13 and 14 connected to a power source 20 and then scanned at a fixed ratio.When it is desired to have a high sensitivity of analysis utilizing the aforedescribed analyzing system, the signal obtained from the sample must of course be received at the widest possible accepted solid angle as stated above. Additionally, the loss of signal between the deflecting system and the slit must be confined to a minimum. To this end, it is necessary that the rays of electrons at the time when they pass through the slit 9 have the best possible circularity so as to reduce the amount to which the rays are intercepted by the end face of the slit 9.In this respect, a glass plate coated with a phosphor was placed at the position of the slit 9 in the aforedescribed equipment, and the shape of the rays of electrons focused on this point was directly observed. It was determined that the rays of electrons were not truly circular, but rather often presented a ring shape deformed in one direction or a shape having a long tail at a certain part.The cause therefor was studied, and has been revealed to be a kind of electrooptical astigmatism attributed to the fact that the electrodes were not fixed coaxially or that the parallelism of each electrode was not maintained. Therefore, in constructing the equipment, careful attention was pair to the finish precision of the electrodes and the assembling was carefully executed. While considerable improvements were thus effected, it has been determined that a satisfactory result has not been attained.SUMMARY OF THE INVENTIONAn object of the present invention is to provide an improved charged-particle analyzer.Another object of the present invention is to provide a charged-particle analyzer which makes it possible to set a wide accepted solid angle for signals and to attach a sample of large area without greatly decreasing the accepted solid angle.These and other objects are attained by a charged-particle analyzer having an irradiation device for irradiating a sample with a primary beam, a deflecting electrode system for focusing charged particles emitted from the sample onto the center axis of the primary beam or an extension thereof or onto an identical circumference with its center located on the axis or the extension, a slit which is disposed at the focus point of the charged particles, an energy analyzing system whose object point lies at the focus point, a detector for detecting the charged particles analyzed by the energy analyzing system, and a charged-particle beam correction arrangement disposed axially symmetrically in the vicinity of the path of the charged particles between the sample and the slit.

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