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    • 1. 发明授权
    • Transport method and transport apparatus
    • 运输方式和运输设备
    • US08244399B2
    • 2012-08-14
    • US12644615
    • 2009-12-22
    • Hidehiro MaedaKazuya OkamotoYasuaki Tanaka
    • Hidehiro MaedaKazuya OkamotoYasuaki Tanaka
    • G06F7/00G06F19/00H01L21/68H01L23/544B29C65/00G01B11/00
    • H01L21/677H01L21/67092H01L21/67259H01L21/68H01L24/34H01L2924/00014Y10T156/10H01L2224/37099H01L2224/84
    • Provided is a transport method comprising judging whether there is a possibility that misalignment greater than or equal to a threshold value occurs between substrates to be layered that are held by a pair of substrate holders aligned and stacked by an aligning section, the misalignment occurring when the pair of substrate holders is transported from the aligning section to a pressure applying section; and if the judgment indicates that there is the possibility of misalignment, transporting the pair of substrate holders to a region other than the pressure applying section. Whether there is the possibility of misalignment may be judged based on acceleration of the substrate holders. Whether there is the possibility of misalignment may be judged based on acceleration of a transporting section that transports the substrate holders. Whether there is the possibility of misalignment may be judged based on relative positions of the substrate holders. Whether there is the possibility of misalignment may be judged based on relative positions of (i) a transporting section that transports the pair of substrate holders and (ii) one of the pair of substrate holders.
    • 提供了一种传送方法,包括判断是否存在由被对准部对准和堆叠的一对基板保持器保持的要分层的基板之间的大于或等于阈值的偏移的可能性, 一对基板支架从对准部分输送到压力施加部分; 并且如果判断表示存在不对准的可能性,则将一对基板保持器传送到除压力施加部以外的区域。 可以基于基板保持器的加速度判断是否存在未对准的可能性。 可以基于输送基板保持器的输送部的加速度判断是否存在未对准的可能性。 可以基于基板保持器的相对位置来判断是否存在未对准的可能性。 可以基于(i)输送一对基板保持器的输送部和(ii)一对基板保持件中的一个的相对位置来判断是否存在未对准的可能性。
    • 2. 发明申请
    • TRANSPORT METHOD AND TRANSPORT APPARATUS
    • 运输方式和运输工具
    • US20100168908A1
    • 2010-07-01
    • US12644615
    • 2009-12-22
    • Hidehiro MAEDAKazuya OkamotoYasuaki Tanaka
    • Hidehiro MAEDAKazuya OkamotoYasuaki Tanaka
    • H01L21/677G06F7/00
    • H01L21/677H01L21/67092H01L21/67259H01L21/68H01L24/34H01L2924/00014Y10T156/10H01L2224/37099H01L2224/84
    • Provided is a transport method comprising judging whether there is a possibility that misalignment greater than or equal to a threshold value occurs between substrates to be layered that are held by a pair of substrate holders aligned and stacked by an aligning section, the misalignment occurring when the pair of substrate holders is transported from the aligning section to a pressure applying section; and if the judgment indicates that there is the possibility of misalignment, transporting the pair of substrate holders to a region other than the pressure applying section. Whether there is the possibility of misalignment may be judged based on acceleration of the substrate holders. Whether there is the possibility of misalignment may be judged based on acceleration of a transporting section that transports the substrate holders. Whether there is the possibility of misalignment may be judged based on relative positions of the substrate holders. Whether there is the possibility of misalignment may be judged based on relative positions of (i) a transporting section that transports the pair of substrate holders and (ii) one of the pair of substrate holders.
    • 提供了一种传送方法,包括判断是否存在由被对准部对准和堆叠的一对基板保持器保持的要分层的基板之间的大于或等于阈值的偏移的可能性, 一对基板支架从对准部分输送到压力施加部分; 并且如果判断表示存在不对准的可能性,则将一对基板保持器传送到除压力施加部以外的区域。 可以基于基板保持器的加速度判断是否存在未对准的可能性。 可以基于输送基板保持器的输送部的加速度判断是否存在未对准的可能性。 可以基于基板保持器的相对位置来判断是否存在未对准的可能性。 可以基于(i)输送一对基板保持器的输送部和(ii)一对基板保持件中的一个的相对位置来判断是否存在未对准的可能性。
    • 3. 发明申请
    • Transport Method and Transport Apparatus
    • 运输方式和运输设备
    • US20130274915A1
    • 2013-10-17
    • US13916149
    • 2013-06-12
    • Hidehiro MaedaKazuya OkamotoYasuaki Tanaka
    • Hidehiro MaedaKazuya OkamotoYasuaki Tanaka
    • H01L21/677
    • H01L21/677H01L21/67092H01L21/67259H01L21/68H01L24/34H01L2924/00014Y10T156/10H01L2224/37099H01L2224/84
    • Provided is a transport method comprising judging whether there is a possibility that misalignment greater than or equal to a threshold value occurs between substrates to be layered that are held by a pair of substrate holders aligned and stacked by an aligning section, the misalignment occurring when the pair of substrate holders is transported from the aligning section to a pressure applying section; and if the judgment indicates that there is the possibility of misalignment, transporting the pair of substrate holders to a region other than the pressure applying section. Whether there is the possibility of misalignment may be judged based on acceleration of the substrate holders. Whether there is the possibility of misalignment may be judged based on acceleration of a transporting section that transports the substrate holders. Whether there is the possibility of misalignment may be judged based on relative positions of the substrate holders. Whether there is the possibility of misalignment may be judged based on relative positions of (i) a transporting section that transports the pair of substrate holders and (ii) one of the pair of substrate holders.
    • 提供了一种传送方法,包括判断是否存在由被对准部对准和堆叠的一对基板保持器保持的要分层的基板之间的大于或等于阈值的偏移的可能性, 一对基板支架从对准部分输送到压力施加部分; 并且如果判断表示存在不对准的可能性,则将一对基板保持器传送到除压力施加部以外的区域。 可以基于基板保持器的加速度判断是否存在未对准的可能性。 可以基于输送基板保持器的输送部的加速度判断是否存在未对准的可能性。 可以基于基板保持器的相对位置来判断是否存在未对准的可能性。 可以基于(i)输送一对基板保持器的输送部和(ii)一对基板保持件中的一个的相对位置来判断是否存在未对准的可能性。
    • 7. 发明授权
    • Method of depositing titanium nitride thin film and CVD deposition apparatus
    • US06471781B1
    • 2002-10-29
    • US09343702
    • 1999-06-30
    • Ryoki TobeYasuaki TanakaAtsushi SekiguchiHitoshi JimbaSo Won Kim
    • Ryoki TobeYasuaki TanakaAtsushi SekiguchiHitoshi JimbaSo Won Kim
    • C23C1600
    • C23C16/45565C23C16/34C23C16/45502C23C16/45561C23C16/45576H01L21/28568
    • A CVD apparatus for fabricating a titanium nitride thin film is provided. The apparatus comprises an evacuatable reaction vessel having an interior, a pumping apparatus capable of exhausting the reaction vessel and maintaining the interior of the reaction vessel at a prescribed pressure, a gas feeder for introducing a mixed gas into the reaction vessel, a substrate holder in the reaction vessel for holding a substrate to be coated with a titanium nitride thin film, and a heater for heating the substrate. The gas feeder is equipped with the following components: (a) a vaporizer for vaporizing tetrakis(dialkylamino)titanium (TDAAT) from a liquid source material, (b) a first flow controller capable of setting a flow rate of the vaporized TDAAT to any level within a range of 0.004-02 g/min, (c) a second flow controller capable of setting a flow rate of a first carrier gas mixed with the TDAAT to any level within a range of 100-1000 sccm, (d) a third flow controller capable of setting a flow rate of an added gas reactable with the TDAAT to any level within a range of 10-100 sccm, (e) a fourth flow controller capable of setting a flow rate of a second carrier gas being mixed with the added gas to any level within a range of 10-500 sccm, (f) a first supply conduit for mixing the TDAAT and the first carrier gas to create a first mixed gas and guiding the resulting first mixed gas into the reaction vessel, (g) a second supply conduit for mixing the added gas and the second carrier gas to create a second mixed gas and guiding the resulting second mixed gas into the reaction vessel, and (h) a shower head which is provided with a plurality of first nozzles connected to the first supply conduit, and a plurality of second nozzles connected to the second supply conduit, and which is configured such that the first and second mixed gases are fed into the reaction vessel through the nozzles.
    • 8. 发明授权
    • Surface-position setting apparatus
    • 表面位置设定装置
    • US5461237A
    • 1995-10-24
    • US280535
    • 1994-07-26
    • Shinji WakamotoYuji ImaiYasuaki Tanaka
    • Shinji WakamotoYuji ImaiYasuaki Tanaka
    • G03F7/20G03F7/207G03F9/00G01N21/86
    • G03F9/7026G03F7/707G03F7/70716G03F9/7003G03F9/7011G03F9/7034
    • In an apparatus which positions an average plane thereof parallel to a best focus plane of a projection optical system even if there is unevenness on a wafer, a leveling stage is tilted on the basis of detection signal from an auto-leveling system and a surface of a shot area on a wafer is positioned in a predetermined tilt position relative to a focus plane of the projection optical system. While such a position being kept unchanged, a deviation between the focus plane of the projection optical system and the surface of the shot area is detected at each of multi-points. Within the shot area, by the use of auto-focus system, an amount of relative tilt between an average plane of the shot area obtained from plural deviations and the focus plane of the projection optical system is calculated, and by the use of thus calculated amount of tilt and the detection signal of auto-leveling system, the focus plane of the projection optical system is positioned in parallel with the average plane of the shot area.
    • 即使在晶片上存在不均匀性的情况下,平均平面平行于投影光学系统的最佳聚焦平面的装置中,也可以根据来自自动调平系统的检测信号和 晶片上的照射区域相对于投影光学系统的聚焦平面定位在预定的倾斜位置。 当这样的位置保持不变时,在多点处检测出投影光学系统的聚焦平面与拍摄区域的表面之间的偏差。 在拍摄区域内,通过使用自动对焦系统,计算从多个偏差获得的拍摄区域的平均平面与投影光学系统的对焦面之间的相对倾斜量,并且通过使用这样计算 自动调平系统的倾斜量和检测信号,投影光学系统的聚焦平面与拍摄区域的平均平面平行。