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    • 8. 发明申请
    • MICROSCOPE
    • 显微镜
    • US20120243081A1
    • 2012-09-27
    • US13423634
    • 2012-03-19
    • Susumu Honda
    • Susumu Honda
    • G02B21/06
    • G02B21/002G02B7/005G02B7/006G02B21/16G02B26/101
    • A microscope includes: an objective lens radiating laser light and illumination light onto a specimen; a first detection optical system detecting first observation light produced from the specimen when the laser light is radiated; a second detection optical system detecting second observation light produced from the specimen when the illumination light is radiated; optical elements placed so as to be capable of being inserted into or removed from a light path of the first detection optical system or the second detection optical system; a rotating turret selectively switching the optical elements to be inserted into the light path; a storage section storing correction information about a relative misalignment between the first observation light and the second observation light caused when the optical elements are switched; and a control section correcting the relative misalignment between the first observation light and the second observation light based on the correction information.
    • 显微镜包括:物镜,将激光和照明光照射到样本上; 第一检测光学系统,当激光照射时,检测从样本产生的第一观察光; 第二检测光学系统,当照射光照射时,检测从样本产生的第二观察光; 光学元件放置成能够插入或从第一检测光学系统或第二检测光学系统的光路中移除; 旋转转台选择性地切换要插入到光路中的光学元件; 存储部分,其存储关于当所述光学元件被切换时引起的所述第一观察光和所述第二观察光之间的相对未对准的校正信息; 以及控制部,其基于所述校正信息来校正所述第一观察光与所述第二观察光之间的相对未对准。
    • 10. 发明申请
    • Examination Apparatus, Fluoroscopy Apparatus, Examination Method, And Experimental Method
    • 检查装置,荧光检查装置,检查方法和实验方法
    • US20070273877A1
    • 2007-11-29
    • US10594311
    • 2005-03-29
    • Yoshihiro KawanoKeiji ShimizuMinoru SukekawaTsuyoshi MochizukiSusumu HondaKazuhiro Hayashi
    • Yoshihiro KawanoKeiji ShimizuMinoru SukekawaTsuyoshi MochizukiSusumu HondaKazuhiro Hayashi
    • G01J3/30G02B21/36
    • G01N21/6458G02B21/248
    • Even when the magnifying power is reduced, an image can be obtained at high resolution without significantly reducing the numerical aperture, and examination accuracy is improved. There is provided a microscope examination apparatus including a light source for emitting excitation light or illumination light to a specimen placed on a stage; an objective lens opposing the stage and capable of focusing fluorescence or reflected light from the specimen; an image-forming lens for forming an image of the specimen obtained by the objective lens; and an image-capturing unit for capturing the image of the specimen forming by the image-forming lens, wherein a plurality of the objective lenses having different magnifying powers is provided, and an objective-lens switching mechanism for switching among the objective lenses is provided, and wherein a plurality of the image-forming lenses having different magnifying powers is provided, and an image-forming-lens switching mechanism for switching among the image-forming lenses 5a and 5b is provided.
    • 即使放大倍数减小,也能够以高分辨率获得图像,而不会显着降低数值孔径,提高了检查精度。 提供了一种显微镜检查装置,其包括用于向放置在台架上的样本发射激发光或照明光的光源; 与舞台相对并且能够聚焦来自样本的荧光或反射光的物镜; 用于形成由所述物镜获得的所述样本的图像的图像形成透镜; 以及图像捕获单元,用于捕获由图像形成透镜形成的样本的图像,其中提供具有不同放大倍率的多个物镜,并且提供用于在物镜之间切换的物镜切换机构 并且其中提供了具有不同放大倍率的多个图像形成透镜,并且提供了用于在成像透镜5a和5b之间切换的图像形成透镜切换机构。