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    • 7. 发明授权
    • Cleaning robot having exhaust air feedback function
    • 具有排气反馈功能的清洁机器人
    • US08468645B2
    • 2013-06-25
    • US12527360
    • 2007-08-30
    • Byung-Soo KimJae-Young ChoiSe-Won LeeSang-Hee Kim
    • Byung-Soo KimJae-Young ChoiSe-Won LeeSang-Hee Kim
    • A47L9/28
    • A47L5/14A47L2201/00
    • A cleaning robot having an exhaust air feedback function can utilize the vacuum suction force generated by a suction motor as well as spray exhaust air onto the surface to be cleaned by circulating the air using the suction motor, thereby improving foreign material removal efficiency. The cleaning robot includes a suction unit, a suction motor for drawing in foreign materials from the surface to be cleaned, along with air, through the suction unit, a dust collector for capturing the foreign materials, so that the air is exhausted through the suction motor, and an exhaust air feedback unit for feeding the air. The cleaning robot also includes a spray nozzle unit inserted into the suction unit and placed on the leading end of the suction unit, the spray nozzle unit spraying the air fed by the exhaust air feedback unit, to the surface to be cleaned.
    • 具有排气反馈功能的清洁机器人可以利用由抽吸马达产生的真空吸力,并且通过使用抽吸马达循环空气将排气喷射到待清洁的表面上,从而提高异物去除效率。 清洁机器人包括抽吸单元,用于从待清洁表面吸入异物的抽吸马达以及空气通过抽吸单元,用于捕获异物的集尘器,从而通过抽吸排出空气 马达和用于供给空气的排气反馈单元。 清洁机器人还包括插入抽吸单元中的喷嘴单元并且放置在抽吸单元的前端,喷嘴单元将由排气反馈单元供给的空气喷射到待清洁的表面。
    • 8. 发明授权
    • Integrated circuit testing apparatus and method
    • 集成电路测试仪器及方法
    • US08378698B2
    • 2013-02-19
    • US12798605
    • 2010-04-07
    • Jae-Young ChoiChang-Hyun Cho
    • Jae-Young ChoiChang-Hyun Cho
    • G01R31/20
    • G01R31/318511
    • A testing apparatus includes a test controller configured to output a plurality of chip selection signals for selecting chips to be tested from among a plurality of chips, a plurality of first control signals for controlling supply of a power supply voltage to the chips selected by the chip selection signals, and a plurality of second control signals for controlling receiving of test voltages output from the chips supplied with the power supply voltage, and a probe card including one or more test blocks each having a plurality of signal transmitters configured to respectively transfer the power supply voltage to the corresponding chips in response to the different first control signals and respectively apply the test voltages output from the corresponding chips to the test controller in response to the different second control signals.
    • 测试装置包括:测试控制器,被配置为从多个芯片中输出用于选择要测试的芯片的多个芯片选择信号;多个第一控制信号,用于控制向由芯片选择的芯片提供的电源电压 选择信号和多个第二控制信号,用于控制从提供有电源电压的芯片输出的测试电压的接收;以及探针卡,其包括一个或多个测试块,每个测试块具有多个信号发射机,其被配置为分别传输功率 响应于不同的第一控制信号向相应的芯片提供电压,并且响应于不同的第二控制信号分别将从相应芯片输出的测试电压施加到测试控制器。