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1. 发明申请

US20050112896A1 Multi-bit phase change memory cell and multi-bit phase change memory including the same, method of forming a multi-bit phase change memory, and method of programming a multi-bit phase change memory 失效
标题翻译：包括相同的多位相变存储单元和多位相变存储器，形成多位相变存储器的方法，以及编程多位相变存储器的方法
公开(公告)号：US20050112896A1
公开(公告)日：2005-05-26
申请号：US10718070
申请日：2003-11-20
申请人： Hendrik Hamann , Chung Lam , Michelle Steen , Hon-Sum Wong
发明人： Hendrik Hamann , Chung Lam , Michelle Steen , Hon-Sum Wong
IPC分类号： G11C11/56 , G11C16/02 , H01L21/311 , H01L27/24 , H01L45/00
CPC分类号： H01L45/06 , G11C11/56 , G11C11/5678 , G11C13/0004 , G11C2213/71 , H01L27/2463 , H01L45/1233 , H01L45/144 , H01L45/1675
摘要： A multi-bit phase change memory cell including a stack of a plurality of conductive layers and a plurality of phase change material layers, each of the phase change material layers disposed between a corresponding pair of conductive layers and having electrical resistances that are different from one another.
摘要翻译：一种多位相变存储单元，包括多个导电层和多个相变材料层的堆叠，每个相变材料层设置在相应的一对导电层之间并且具有不同于一个导电层的电阻另一个。

2. 发明申请

US20080057719A1 METHOD AND APPARATUS FOR FABRICATING OR ALTERING MICROSTRUCTURES USING LOCAL CHEMICAL ALTERATIONS 有权
公开(公告)号：US20080057719A1
公开(公告)日：2008-03-06
申请号：US11931242
申请日：2007-10-31
申请人： SUPRATIK GUHA , Hendrik Hamann , Herschel Marchman , Robert Von Gutfeld
发明人： SUPRATIK GUHA , Hendrik Hamann , Herschel Marchman , Robert Von Gutfeld
IPC分类号： H01L21/302
CPC分类号： H01L21/76892 , H01L21/31111 , H01L21/31116 , H01L21/32134 , H01L21/32135 , H01L29/66742 , H01L29/78684 , Y10S977/855 , Y10S977/857 , Y10S977/89 , Y10S977/891 , Y10S977/892
摘要： A method and apparatus for fabricating or altering a microstructure use means for heating to facilitate a local chemical reaction that forms or alters the submicrostructure.

3. 发明申请

US20070098037A1 Techniques for distributing power in electronic circuits and computer systems 失效
标题翻译：在电子电路和计算机系统中分配电力的技术
公开(公告)号：US20070098037A1
公开(公告)日：2007-05-03
申请号：US11264968
申请日：2005-11-02
申请人： Hendrik Hamann , James Lacey , Jamil Wakil , Alan Weger
发明人： Hendrik Hamann , James Lacey , Jamil Wakil , Alan Weger
IPC分类号： G01K3/00
CPC分类号： G01K7/42 , G01K7/425 , G01K2215/00
摘要： Techniques for enhancing thermal design of a system having a number of boundary values are provided. A method for such enhancement includes representing thermal response of the system to the boundary values, obtaining at least one constraining parameter, and determining spatial and/or temporal distribution of the boundary values. The thermal response is represented as a superposition of temperature fields associated with given boundary values. The spatial and/or temporal distribution of the boundary values is determined based on the thermal response represented in the representing step, so as to satisfy the constraining parameter. The boundary values can be, for example, power sources, and the at least one constraining parameter can be, for example, a spatial or temporal location of one of the power sources.
摘要翻译：提供了一种用于增强具有多个边界值的系统的热设计的技术。用于这种增强的方法包括表示系统对边界值的热响应，获得至少一个约束参数，以及确定边界值的空间和/或时间分布。热响应表示为与给定边界值相关联的温度场的叠加。基于代表步骤中表示的热响应来确定边界值的空间和/或时间分布，以满足约束参数。边界值可以是例如电源，并且至少一个约束参数可以是例如电源之一的空间或时间位置。

4. 发明申请

US20060042358A1 METHOD AND APPARATUS FOR DETECTING LEAKS IN A FLUID COOLING SYSTEM 失效
标题翻译：用于检测流体冷却系统中的泄漏的方法和装置
公开(公告)号：US20060042358A1
公开(公告)日：2006-03-02
申请号：US10928396
申请日：2004-08-27
申请人： Robert Von Gutfeld , Hendrik Hamann , Jeffrey Gelorme
发明人： Robert Von Gutfeld , Hendrik Hamann , Jeffrey Gelorme
IPC分类号： G01M3/04
CPC分类号： G01M3/04 , G01M3/188
摘要： One embodiment of the present method and apparatus for detecting leaks in a fluid cooling system enables a user to rapidly detect fluid leaks in the vicinity of a microprocessor chip or other delicate item. In one embodiment, the invention comprises a detector and a border coupled to the detector and disposed peripherally about a protected item (e.g., the microprocessor chip or other delicate item). In one embodiment, the border is a layered structure that is adapted to complete an electrical circuit with the detector when the border comes into contact with fluid.
摘要翻译：用于检测流体冷却系统中的泄漏的本方法和装置的一个实施例使得用户能够快速检测微处理器芯片附近或其它微妙物品的流体泄漏。在一个实施例中，本发明包括检测器和耦合到检测器的边界，并围绕受保护物品（例如，微处理器芯片或其它精细物品）周边设置。在一个实施例中，边界是分层结构，其适于在边界与流体接触时与检测器完成电路。

5. 发明申请

US20050084195A1 Method and apparatus for forming lateral electrical contacts for photonic crystal devices 审中-公开
标题翻译：用于形成光子晶体器件的横向电触点的方法和装置
公开(公告)号：US20050084195A1
公开(公告)日：2005-04-21
申请号：US10686216
申请日：2003-10-15
申请人： Hendrik Hamann , Sharee McNab , Yurii Vlasov
发明人： Hendrik Hamann , Sharee McNab , Yurii Vlasov
IPC分类号： G02B6/122 , G02B6/26 , G02F1/01 , G02F1/025 , G02F1/035 , G02F1/295
CPC分类号： G02F1/011 , B82Y20/00 , G02B6/1225 , G02F1/0147 , G02F1/025 , G02F2201/12 , G02F2202/32
摘要： The present invention is a method an apparatus for forming lateral electrical contacts for photonic crystal based structures. In one embodiment, a photonic crystal structure comprises a substrate having a plurality of apertures formed therethrough, a waveguide formed by “removing” a row of apertures, and a pair of lateral electrical contacts, each spaced a distance away from the waveguide by at least one row of apertures. The optical mode of the waveguide is confined in the lateral direction by the at least one row of apertures. Thus the apertures provide optical isolation for the electrical contacts, which minimizes losses due to absorption of light by the contacts. The contacts may be used to apply voltages for thermo-optic control of the waveguide, for current injection, or for configuring the waveguide as a photodetector, among other applications.
摘要翻译：本发明是一种用于形成基于光子晶体的结构的横向电触头的装置的方法。在一个实施例中，光子晶体结构包括具有穿过其形成的多个孔的衬底，通过“移除”一排孔而形成的波导，以及一对侧向电触点，每个远离波导至少离开波导一排孔。波导的光学模式通过至少一排孔限制在横向上。因此，孔为电触点提供光隔离，这使由触点吸收光引起的损耗最小化。触点可以用于施加用于波导的热光学控制的电压，用于电流注入，或用于将波导配置为光电检测器，以及其他应用。

6. 发明授权

US07684666B2 Method and apparatus for tuning an optical delay line 失效
标题翻译：调整光延迟线的方法和装置
公开(公告)号：US07684666B2
公开(公告)日：2010-03-23
申请号：US11558847
申请日：2006-11-10
申请人： Hendrik Hamann , Yurii A. Vlasov , Fengnian Xia
发明人： Hendrik Hamann , Yurii A. Vlasov , Fengnian Xia
IPC分类号： G02B6/42
CPC分类号： G02B6/12007 , G02B6/2861
摘要： The present invention is a method and an apparatus for tuning an optical delay line. In one embodiment, an optical delay line includes at least one ring resonator in which light is guided or is confined and at least one heater positioned laterally from the ring resonator. The heater produces heat in a localized area, allowing for the tuning of individual delay elements with minimal crosstalk.
摘要翻译：本发明是用于调整光学延迟线的方法和装置。在一个实施例中，光学延迟线包括至少一个环形谐振器，其中光被引导或被限制，并且至少一个加热器从环形谐振器横向定位。加热器在局部区域产生热量，允许以最小的串扰调谐各个延迟元件。

7. 发明申请

US20060097384A1 Method and apparatus for thermal characterization under non-uniform heat load 有权
标题翻译：在不均匀热负荷下热表征的方法和装置
公开(公告)号：US20060097384A1
公开(公告)日：2006-05-11
申请号：US10982575
申请日：2004-11-05
申请人： Hendrik Hamann , Madhusudan Iyengar , James Lacey , Roger Schmidt
发明人： Hendrik Hamann , Madhusudan Iyengar , James Lacey , Roger Schmidt
IPC分类号： H01L23/34
CPC分类号： H01L23/34 , H01L2924/0002 , H01L2924/00
摘要： A method and apparatus for real-time thermal characterization of a fully operating cooling device (1002). A heat source (1004) is applied to one or more areas on a cooling device (1002) to produce non-uniform heating of the cooling device. Infrared (IR) temperature imaging (1006) detects and measures the thermal distribution of the heat source (1004) on the cooling device (1002) to develop a thermal characterization of the cooling device (1002).
摘要翻译：一种用于完全运行的冷却装置（1002）的实时热表征的方法和装置。将热源（1004）施加到冷却装置（1002）上的一个或多个区域，以产生冷却装置的不均匀加热。红外（IR）温度成像（1006）检测并测量冷却装置（1002）上的热源（1004）的热分布，以开发冷却装置（1002）的热表征。

8. 发明授权

US06943444B2 Cooling of surface temperature of a device 有权
标题翻译：设备表面温度的冷却
公开(公告)号：US06943444B2
公开(公告)日：2005-09-13
申请号：US10699122
申请日：2003-10-30
申请人： Robert J. von Gutfeld , Hendrik Hamann , Michael T. Prikas
发明人： Robert J. von Gutfeld , Hendrik Hamann , Michael T. Prikas
IPC分类号： F28F3/04 , H01L23/473 , H01L23/34
CPC分类号： F28F3/04 , F28D2021/0029 , F28F2260/02 , H01L23/473 , H01L2924/0002 , H01L2924/00
摘要： A structure (microduct) for temperature management (e.g., cooling) of the surface temperature of an electronic device (e.g., a microprocessor). In an embodiment of the present invention, the system includes an upper plate , wherein the upper plate has a bottom surface forming the top portion and sides of the microduct structure, and wherein the top surface of a lower wall forms the bottom surface of the microduct structure. The lower wall can be adapted to be coupled to a top surface of device. The microduct structure further includes a coolant that flows through the microduct to provide cooling for a device.
摘要翻译：用于温度管理（例如，冷却）电子设备（例如，微处理器）的表面温度的结构（微量）。在本发明的一个实施例中，该系统包括上板，其中上板具有形成微型结构的顶部和侧面的底表面，并且其中下壁的顶表面形成微量的底表面结构体。下壁可以适于联接到装置的顶表面。微结构结构还包括流过微机的冷却剂，以为装置提供冷却。

9. 发明申请

US20050190496A1 Heating device and magnetic recording head for thermally-assisted recording 失效
标题翻译：加热装置和用于热辅助记录的磁记录头
公开(公告)号：US20050190496A1
公开(公告)日：2005-09-01
申请号：US10791002
申请日：2004-03-01
申请人： Hendrik Hamann , Prakash Kasiraj , Jeffrey Lille , Yves Martin , Chie Poon , Neil Robertson , Jan-Ulrich Thiele , Hemantha Wickramasinghe
发明人： Hendrik Hamann , Prakash Kasiraj , Jeffrey Lille , Yves Martin , Chie Poon , Neil Robertson , Jan-Ulrich Thiele , Hemantha Wickramasinghe
IPC分类号： G11B5/00 , G11B5/127
CPC分类号： G11B5/127 , G11B2005/0005 , G11B2005/0021
摘要： A heating device for a magnetic recording head includes first and second separating layers, the first separating layer having preferably a higher or equal thermal resistance than the first separating layer, and a heater formed between the first and second separating layers. A magnetic recording head for recording on magnetic medium includes a heating device which generates a heat spot on the magnetic medium which is larger than a magnetic track width, and/or heats a portion of the magnetic recording head which is on a leading edge side of a write gap in the magnetic recording head.
摘要翻译：用于磁记录头的加热装置包括第一和第二分离层，第一分离层优选地具有比第一分离层更高或相等的热阻，以及形成在第一和第二分离层之间的加热器。用于在磁介质上记录的磁记录头包括加热装置，该加热装置在磁介质上产生大于磁道宽度的热点，和/或加热位于磁介质的前缘侧的磁记录头的一部分磁记录头中的写入间隙。

10. 发明申请

US20050095858A1 Method and apparatus for fabricating or altering microstructures using local chemical alterations 有权
标题翻译：使用局部化学改变制造或改变微结构的方法和装置
公开(公告)号：US20050095858A1
公开(公告)日：2005-05-05
申请号：US10696771
申请日：2003-10-29
申请人： Supratik Guha , Hendrik Hamann , Herschel Marchman , Robert Von Gutfeld
发明人： Supratik Guha , Hendrik Hamann , Herschel Marchman , Robert Von Gutfeld
IPC分类号： H01L21/302 , H01L21/311 , H01L21/3213 , H01L21/336 , H01L21/461 , H01L21/768 , H01L29/786
CPC分类号： H01L21/76892 , H01L21/31111 , H01L21/31116 , H01L21/32134 , H01L21/32135 , H01L29/66742 , H01L29/78684 , Y10S977/855 , Y10S977/857 , Y10S977/89 , Y10S977/891 , Y10S977/892
摘要： A method and apparatus for fabricating or altering a microstructure use means for heating to facilitate a local chemical reaction that forms or alters the submicrostructure.
摘要翻译：一种用于制造或改变微结构的方法和装置，用于加热以促进形成或改变亚微结构的局部化学反应。

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