会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 5. 发明申请
    • LITHOGRAPHIC APPARATUS
    • LITHOGRAPHIC设备
    • US20110317141A1
    • 2011-12-29
    • US13115334
    • 2011-05-25
    • Doede Frans KUIPERHans BUTLER
    • Doede Frans KUIPERHans BUTLER
    • G03B27/54
    • G03F7/70775G03F7/70716G03F7/7085
    • A lithographic apparatus includes an illumination system configured to condition a radiation beam; a support constructed to support a patterning device, the device being capable of imparting the beam with a pattern in its cross-section to form a patterned radiation beam; a substrate table constructed to hold a substrate; a stage system to position the table relative to a reference structure; a projection system configured to project the patterned radiation beam onto a target portion of the substrate; an optical measurement system including a sensor part and an optical part, the optical part being configured to optically interact with the patterned radiation beam and to transmit a result from the interaction as output to the sensor part, wherein the optical part is arranged on the table, and the sensor part is arranged on the stage system or the reference structure.
    • 光刻设备包括被配置为调节辐射束的照明系统; 构造为支撑图案形成装置的支撑件,所述装置能够在其横截面中赋予所述梁的图案以形成图案化的辐射束; 构造成保持基板的基板台; 一个用于将表相对于参考结构定位的阶段系统; 投影系统,被配置为将所述图案化的辐射束投影到所述基板的目标部分上; 包括传感器部分和光学部件的光学测量系统,所述光学部件被配置为与所述图案化的辐射束光学相互作用并且将所述相互作用的结果作为输出传输到所述传感器部分,其中所述光学部件布置在所述台面上 并且传感器部分布置在平台系统或参考结构上。
    • 9. 发明申请
    • LITHOGRAPHIC APPARATUS AND METHOD FOR MEASURING A POSITION
    • 平面设备和测量位置的方法
    • US20110216300A1
    • 2011-09-08
    • US13022498
    • 2011-02-07
    • Hans BUTLEREngelbertus Antonius Fransiscus VAN DER PASCH
    • Hans BUTLEREngelbertus Antonius Fransiscus VAN DER PASCH
    • G03B27/58G01B11/14
    • G01B11/14G03B27/58G03F7/70775
    • A lithographic apparatus includes a support configured to hold an object, the support being moveable relative to a reference structure in a direction; a first position measurement system configured to provide a first measurement signal in a first frequency range, the first measurement signal representative of a position of the support relative to the reference structure in the direction; a second position measurement system configured to provide a second measurement signal in a second frequency range, the second measurement signal representative of the position of the support relative to the reference structure in the direction; and a processor configured to (a) filter the first measurement signal so as to attenuate a signal component having a frequency in the second frequency range, (b) filter the second measurement signal so as to attenuate a signal component having a frequency in the first frequency range, and (c) combine the filtered first measurement signal and the filtered second measurement signal into a combined measurement signal representative of the position of the support relative to the reference structure in the direction.
    • 光刻设备包括被配置为保持物体的支撑件,所述支撑件可相对于参考结构在一个方向上移动; 第一位置测量系统,被配置为在第一频率范围内提供第一测量信号,所述第一测量信号表示所述支撑件相对于所述参考结构在所述方向上的位置; 第二位置测量系统,被配置为在第二频率范围内提供第二测量信号,所述第二测量信号表示所述支撑件相对于所述参考结构在所述方向上的位置; 以及处理器,其被配置为(a)对所述第一测量信号进行滤波,以便衰减具有在所述第二频率范围内的频率的信号分量,(b)滤除所述第二测量信号,以便衰减具有所述第一频率的信号分量 频率范围,以及(c)将滤波的第一测量信号和滤波的第二测量信号组合成表示支撑件相对于参考结构在该方向上的位置的组合测量信号。