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1. 发明授权

US06868214B1 Optical waveguide, method of fabricating the waveguide, and optical interconnection device using the waveguide 失效
标题翻译：光波导，制造波导的方法以及使用波导的光互连装置
公开(公告)号：US06868214B1
公开(公告)日：2005-03-15
申请号：US09626740
申请日：2000-07-26
申请人： Hajime Sakata , Takayuki Yagi , Toshihiko Ouchi
发明人： Hajime Sakata , Takayuki Yagi , Toshihiko Ouchi
IPC分类号： H01S5/026 , C25D5/02 , C25D7/12 , G02B6/122 , G02B6/13 , G02B6/138 , G02B6/42 , G02B6/43 , G02B6/22
CPC分类号： G02B6/43 , G02B6/138 , G02B6/4214
摘要： An optical waveguide includes a partial cylindrical portion, and a plurality of end portions. The partial cylindrical portion has an elongated profile, and is formed of a material transparent to light propagating along the partial cylindrical portion. The end portion has an approximately partial spherical profile, smoothly joins the partial cylindrical portion, and is formed of the same material as the material of the partial cylindrical portion, so that the light propagates along the partial cylindrical portion and the end portions while repeating total reflections at a boundary surface contouring the partial cylindrical portion and the end portions.
摘要翻译：光波导包括部分圆柱形部分和多个端部部分。部分圆柱形部分具有细长轮廓，并且由对沿着部分圆柱形部分传播的光透明的材料形成。端部具有近似部分的球形轮廓，平滑地接合部分圆柱形部分，并且由与部分圆柱形部分的材料相同的材料形成，使得光沿着部分圆柱形部分和端部部分传播，同时重复总计在局部圆柱形部分和端部部分的边界表面上的反射。

2. 发明授权

US06932516B2 Surface optical device apparatus, method of fabricating the same, and apparatus using the same 失效
标题翻译：表面光学器件装置及其制造方法以及使用其的装置
公开(公告)号：US06932516B2
公开(公告)日：2005-08-23
申请号：US09903709
申请日：2001-07-13
申请人： Toshihiko Ouchi , Hajime Sakata , Futoshi Hirose , Aya Imada
发明人： Toshihiko Ouchi , Hajime Sakata , Futoshi Hirose , Aya Imada
IPC分类号： G02B6/42 , G02B6/36
CPC分类号： G02B6/4249
摘要： A surface optical device apparatus includes a surface optical device capable of emitting or receiving light through a surface thereof and a thick layer formed of a radiation-curable or electron-beam-curable material, such as a polymerizable resist. In the thick layer, a guide hole for inserting an end portion of a light-transmission member, such as an optical fiber, and a plastic optical fiber with a flat end face or a lens-shaped end face, therein is formed at a position corresponding to the surface of the surface optical device such that the surface optical device can be optically coupled to the light-transmission member inserted in the guide hole. The guide hole is formed in the thick layer by performing a patterning on the thick layer using photolithography to selectively harden the thick layer and developing the thick layer.
摘要翻译：表面光学器件装置包括能够通过其表面发射或接收光的表面光学器件以及由可聚合抗蚀剂等可辐射固化或电子束固化材料形成的厚层。在厚层中，形成用于插入诸如光纤的光传输构件的端部的引导孔和具有平坦端面或透镜形端面的塑料光纤，位于对应于表面光学装置的表面，使得表面光学装置可以光学耦合到插入导向孔中的光传输构件。通过使用光刻法在厚层上进行图案化以选择性地硬化厚层并显影厚层，在厚层中形成引导孔。

3. 发明授权

US5701325A Compound semiconductor device and fabrication method of producing the compound semiconductor device 失效
标题翻译：化合物半导体器件及其制造方法
公开(公告)号：US5701325A
公开(公告)日：1997-12-23
申请号：US731682
申请日：1996-10-16
申请人： Toshihiko Ouchi , Hajime Sakata , Noriaki Ohguri , Mamoru Uchida
发明人： Toshihiko Ouchi , Hajime Sakata , Noriaki Ohguri , Mamoru Uchida
IPC分类号： H01L33/06 , H01L33/10 , H01L33/22 , H01L33/30 , H01L33/40 , H01S5/00 , H01S5/042 , H01S5/10 , H01S5/12 , H01S3/08 , H01L21/20 , H01S3/18
CPC分类号： H01S5/12 , H01S5/1035 , H01S5/1203 , H01S5/1225 , H01S5/1231
摘要： An improved compound semiconductor device, such as a distributed Bragg reflection type or distributed feedback type laser device, having regions with and regions without a diffraction grating. The device is fabricated without exhibiting surface irregularities by growing a first epitaxial layer on a semiconductor substrate, forming a fine uneven structure on the surface of the first epitaxial layer and growing a second epitaxial layer on the fine uneven structure. The fine uneven structure has a surface shape which exposes crystal orientations that facilitate subsequent epitaxial growth. In one embodiment, portions of the fine uneven structure are formed as a diffraction grating while other portions are formed insufficiently uneven to have a diffraction effect for any usable light wavelength. The fine uneven structure may suitably be shallow, have a short pitch or be provided at a slant to the light propagation direction, in order to preclude a diffraction effect.
摘要翻译：改进的化合物半导体器件，例如分布式布拉格反射型或分布式反射型激光器件，其具有区域和不具有衍射光栅的区域。通过在半导体衬底上生长第一外延层，在第一外延层的表面上形成微小的不均匀结构，并在第一外延层上生长第二外延层，制造器件而不会出现表面凹凸。精细的不均匀结构具有暴露促进随后的外延生长的晶体取向的表面形状。在一个实施例中，微细凹凸结构的一部分形成为衍射光栅，而其它部分形成得不充分地不均匀以具有任何可用光波长的衍射效应。为了防止衍射效应，微细凹凸结构可以适当地浅，具有短的间距或者以光传播方向倾斜地设置。

4. 发明授权

US5349598A Optical semiconductor apparatus, a method of driving the same and an optical transmission system using the same 失效
标题翻译：光半导体装置，其驱动方法以及使用其的光传输系统
公开(公告)号：US5349598A
公开(公告)日：1994-09-20
申请号：US11211
申请日：1993-01-29
申请人： Toshihiko Ouchi , Hajime Sakata
发明人： Toshihiko Ouchi , Hajime Sakata
IPC分类号： G02B6/122 , G02F1/313 , G02F2/00 , H01L27/15 , H01S5/00 , H01S5/026 , H01S5/06 , H01S5/0625 , H01S5/10 , H01S5/12 , H01S5/40 , H01S5/50 , H04B10/07 , H04B10/275 , H04B10/278 , H04B10/29 , H04B10/40 , H04B10/50 , H04B10/548 , H04B10/572 , H04B10/60 , H04B10/64 , H01S3/19
CPC分类号： H01S5/1032 , H01S5/0264 , G02F2/002 , H01S5/026 , H01S5/06256 , H01S5/1035 , H01S5/1215 , H01S5/5045
摘要： An optical semiconductor apparatus includes at least two upper and lower light waveguides. The waveguides are formed in a direction of semiconductor layers layered on a substrate and have a predetermined coupling degree therebetween. At least one semiconductor laser and at least one photodetector are respectively arranged in any one of the light waveguides. A grating may be formed in or in the vicinity of any one of the light waveguides to attain a wavelength-sensitivity in the coupling between the upper and lower light waveguides. The coupling degree may be controlled by a voltage applied to a part of the waveguides. An incident light entering one of the waveguides can be coupled to a local oscillation light emitted from the semiconductor laser to generate a beat signal therebetween. The beat signal can be detected by the photodetector.
摘要翻译：光学半导体装置包括至少两个上和下光波导。波导沿着层叠在基板上的半导体层的方向形成，并且在它们之间具有预定的耦合度。至少一个半导体激光器和至少一个光电检测器分别布置在任何一个光波导中。光栅可以形成在任何一个光波导中或附近，以在上和下光波导之间的耦合中获得波长灵敏度。耦合度可以通过施加到一部分波导的电压来控制。入射到波导中的一个的入射光可以耦合到从半导体激光器发射的本地振荡光，以在它们之间产生拍频信号。拍摄信号可以由光电检测器检测。

5. 发明授权

US08344324B2 Inspection apparatus and inspection method using electromagnetic wave 失效
标题翻译：检验仪器和检验方法采用电磁波
公开(公告)号：US08344324B2
公开(公告)日：2013-01-01
申请号：US12682248
申请日：2008-11-27
申请人： Shintaro Kasai , Toshihiko Ouchi , Takeaki Itsuji
发明人： Shintaro Kasai , Toshihiko Ouchi , Takeaki Itsuji
IPC分类号： G01N21/35
CPC分类号： G01N21/3586 , G01N21/7703
摘要： An apparatus for acquiring information on a time waveform of a terahertz wave is comprised of a terahertz wave-generating unit, a waveform information-detecting unit, and a delay unit for changing the time after the terahertz wave is generated in the generating unit until it is detected as waveform information of the terahertz wave in the detecting unit, wherein the delay unit is configured so as to change a propagating distance of the terahertz wave generated by the generating unit, and associates waveform information of the terahertz wave, which is detected in the detecting unit, and the propagating distance every terahertz wave generated by the generating unit.
摘要翻译：用于获取关于太赫兹波的时间波形的信息的装置包括太赫兹波发生单元，波形信息检测单元和延迟单元，用于在生成单元中产生太赫兹波之后的时间改变直到它被检测为检测单元中的太赫兹波的波形信息，其中延迟单元被配置为改变由发生单元产生的太赫兹波的传播距离，并且将在该波长信号中检测到的太赫兹波的波形信息相关联检测单元和由发生单元产生的每太赫兹波的传播距离。

6. 发明申请

US20120108004A1 PHOTO-SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME 有权
标题翻译：照相半导体器件及其制造方法
公开(公告)号：US20120108004A1
公开(公告)日：2012-05-03
申请号：US13342304
申请日：2012-01-03
申请人： Toshihiko Ouchi
发明人： Toshihiko Ouchi
IPC分类号： H01L31/18
CPC分类号： H01L31/09 , G01J3/0256 , G01J3/42 , G01N21/3581 , H01L31/022408 , H01L31/0232 , H01L31/02325 , H01L31/101 , H01L33/36 , H01L2224/16225 , H01L2224/32225 , H01L2224/73204 , H01L2924/00
摘要： A method of manufacturing photo-semiconductor device that has a photoconductive semiconductor film provided with electrodes and formed on a second substrate, the semiconductor film being formed by epitaxial growth on a first semiconductor substrate different from the second substrate, the second substrate being also provided with electrodes, the electrodes of the second substrate and the electrodes of the photoconductive semiconductor film being held in contact with each other.
摘要翻译：一种制造光电半导体器件的方法，所述光电半导体器件具有设置有电极并形成在第二衬底上的光导半导体膜，所述半导体膜通过在与所述第二衬底不同的第一半导体衬底上外延生长而形成，所述第二衬底还设置有电极，第二基板的电极和光电导半导体膜的电极保持彼此接触。

7. 发明授权

US07963168B2 Inspection apparatus and inspection method using electromagnetic wave 有权
标题翻译：检验仪器和检验方法采用电磁波
公开(公告)号：US07963168B2
公开(公告)日：2011-06-21
申请号：US12196084
申请日：2008-08-21
申请人： Toshihiko Ouchi
发明人： Toshihiko Ouchi
IPC分类号： G01N21/31 , G01J1/42
CPC分类号： G01N21/3581 , G01N21/8806 , G01N21/94 , G01N21/9508
摘要： The present invention is to provide inspection apparatus and method of being able to acquire electromagnetic wave response information of an inspection object at high speed as average information using an electromagnetic wave. An inspection apparatus using an electromagnetic wave 2 includes an electromagnetic wave generation and irradiation unit 9 which generates an electromagnetic wave and irradiates the electromagnetic wave on an inspection object 11, and an electromagnetic wave detection unit 10 having a plurality of detection units. The plurality of detection units is arranged so as to detect the electromagnetic wave which is irradiated by the electromagnetic wave generation and irradiation unit and is transmitted or reflected with interacting with different sites of the inspection object 11, and is constructed so as to detect the electromagnetic wave from the different sites in different detection time or detection frequencies respectively. The inspection apparatus acquires electromagnetic wave response information on the inspection object 11 based on detection signals from the plurality of detection units.
摘要翻译：本发明提供一种检测装置和方法，能够使用电磁波作为平均信息以高速度获取检查对象的电磁波响应信息。使用电磁波2的检查装置包括产生电磁波并将电磁波照射在检查对象11上的电磁波产生和照射单元9以及具有多个检测单元的电磁波检测单元10。多个检测单元被布置为检测由电磁波产生和照射单元照射的电磁波，并且与检查对象11的不同位置相互作用而被透射或反射，并且被构造成检测电磁波来自不同地点的波浪分别在不同的检测时间或检测频率。检查装置基于来自多个检测单元的检测信号，获取关于检查对象11的电磁波响应信息。

8. 发明授权

US07947942B2 Photoconductive element and sensor device 有权
标题翻译：光电元件和传感器装置
公开(公告)号：US07947942B2
公开(公告)日：2011-05-24
申请号：US12612798
申请日：2009-11-05
申请人： Toshihiko Ouchi
发明人： Toshihiko Ouchi
IPC分类号： G01N21/01 , H01S1/02 , H01S5/12
CPC分类号： G01J3/42 , G01N21/3581 , H01S1/02
摘要： There is provided a photoconductive element capable of generating and detecting broadband electromagnetic waves such as terahertz waves at a comparatively high efficiency by decreasing or avoiding the absorption of electromagnetic waves into a substrate. A photoconductive element 1 includes a photoconductive film 5 exhibiting conductivity by the radiation of light, a substrate 6 holding the photoconductive film and a thin film sandwiched between the photoconductive film 5 and the substrate 6, the thin film being different in composition from the photoconductive film 5 and the substrate 6. The photoconductive film 5 is provided with an antenna 7 having a gap portion 2 and an electrode 4 electrically connectable to the antenna 7. At least a part of the photoconductive film where the gap portion 2 of the antenna 7 is located is single crystal. The substrate 6 has an opening portion 3 at a part corresponding to a part of the photoconductive film 5 where the gap portion 2 of the antenna 7 is located.
摘要翻译：提供了一种光电元件，其能够通过减少或避免电磁波吸收到衬底中，以相当高的效率产生和检测诸如太赫兹波的宽带电磁波。光电导元件1包括通过照射光而显示导电性的光电导膜5，保持光电导膜的基板6和夹在光电导膜5和基板6之间的薄膜，该薄膜的组成与光导膜不同光电导膜5设置有具有间隙部分2的天线7和可与天线7电连接的电极4.至少一部分天线7的间隙部分2的光电导膜是位于单晶。基板6在对应于天线7的间隙部分2所在的光电导膜5的一部分的部分处具有开口部分3。

9. 发明授权

US07933305B2 Device for generating or detecting electromagnetic radiation, and fabrication method of the same 有权
标题翻译：用于产生或检测电磁辐射的装置及其制造方法
公开(公告)号：US07933305B2
公开(公告)日：2011-04-26
申请号：US11376203
申请日：2006-03-16
申请人： Toshihiko Ouchi , Ryota Sekiguchi
发明人： Toshihiko Ouchi , Ryota Sekiguchi
IPC分类号： H01S3/08
CPC分类号： H01L31/035236 , B82Y20/00 , G01N21/3581 , H01L31/0232 , H01L31/03046 , H01S1/02 , H01S5/18305 , H01S5/18308 , H01S5/18388 , H01S5/2213 , H01S5/2275 , H01S5/3401 , H01S2302/02 , Y02E10/544
摘要： A device for generating or detecting electromagnetic radiation includes a substrate, a gain medium provided on the substrate, a plurality of reflectors for confining electromagnetic radiation at a predetermined frequency range and substantially perpendicular to a face of the substrate, and spacer means for spacing the reflectors from each other at a predetermined distance, with the gain medium being sandwiched between the reflectors. The gain medium has a quantum well structure formed of a semiconductor material, and gives a gain to electromagnetic radiation by transitioning between subbands created in at least a quantum well in the quantum well structure. The spacer means is formed of a material different from a material of the gain medium.
摘要翻译：用于产生或检测电磁辐射的装置包括基板，设置在基板上的增益介质，用于限制预定频率范围内并基本上垂直于基板的面的电磁辐射的多个反射器，以及用于间隔反射器彼此间隔预定距离，增益介质夹在反射器之间。增益介质具有由半导体材料形成的量子阱结构，并且通过在量子阱结构中的至少一个量子阱中产生的子带之间的过渡来给予电磁辐射的增益。间隔装置由不同于增益介质的材料的材料形成。

10. 发明申请

US20100252738A1 INSPECTION APPARATUS AND INSPECTION METHOD USING ELECTROMAGNETIC WAVE 失效
标题翻译：使用电磁波的检查装置和检查方法
公开(公告)号：US20100252738A1
公开(公告)日：2010-10-07
申请号：US12682248
申请日：2008-11-27
申请人： Shintaro Kasai , Toshihiko Ouchi , Takeaki Itsuji
发明人： Shintaro Kasai , Toshihiko Ouchi , Takeaki Itsuji
IPC分类号： G01N21/35 , G01N21/17
CPC分类号： G01N21/3586 , G01N21/7703
摘要： An apparatus for acquiring information on a time waveform of a terahertz wave is comprised of a terahertz wave-generating unit, a waveform information-detecting unit, and a delay unit for changing the time after the terahertz wave is generated in the generating unit until it is detected as waveform information of the terahertz wave in the detecting unit, wherein the delay unit is configured so as to change a propagating distance of the terahertz wave generated by the generating unit, and associates waveform information of the terahertz wave, which is detected in the detecting unit, and the propagating distance every terahertz wave generated by the generating unit.
摘要翻译：用于获取关于太赫兹波的时间波形的信息的装置包括太赫兹波发生单元，波形信息检测单元和延迟单元，用于在生成单元中产生太赫兹波之后的时间改变直到它被检测为检测单元中的太赫兹波的波形信息，其中延迟单元被配置为改变由发生单元产生的太赫兹波的传播距离，并且将在该波长信号中检测到的太赫兹波的波形信息相关联检测单元和由发生单元产生的每太赫兹波的传播距离。

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