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    • 1. 发明授权
    • Compliant conductive nano-particle electrical interconnect
    • 符合导电纳米颗粒电气互连
    • US08704377B2
    • 2014-04-22
    • US13969953
    • 2013-08-19
    • HSIO Technologies, LLC
    • James Rathburn
    • H01L23/48
    • H01L23/48B82Y10/00H01R23/722H05K1/0231H05K1/113H05K1/141H05K3/32H05K3/3436H05K3/4038H05K3/4069H05K7/1069H05K7/1092H05K2201/049Y10T29/4913Y10T29/49147
    • An electrical interconnect providing an interconnect between contacts on an IC device and contact pads on a printed circuit board (PCB). The electrical interconnect includes a resilient substrate with a plurality of through holes extending from a first surface to a second surface. A resilient material is located in the through holes. The resilient material includes an opening extending from the first surface to the second surface. A plurality of discrete, free-flowing conductive nano-particles are located in the openings of the resilient material. The conductive particles are substantially free of non-conductive materials. A plurality of first contact members are located in the through holes adjacent the first surface and a plurality of second contact members are located in the through holes adjacent the second surface. The first and second contact members are electrically coupled to the nano-particles.
    • 提供IC器件上的触点与印刷电路板(PCB)上的接触焊盘之间的互连的电互连。 电互连包括具有从第一表面延伸到第二表面的多个通孔的弹性基底。 弹性材料位于通孔中。 弹性材料包括从第一表面延伸到第二表面的开口。 多个离散的自由流动的导电纳米颗粒位于弹性材料的开口中。 导电颗粒基本上不含非导电材料。 多个第一接触构件位于邻近第一表面的通孔中,并且多个第二接触构件位于与第二表面相邻的通孔中。 第一和第二接触构件电耦合到纳米颗粒。