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1. 发明申请

US20160161428A1 X-RAY FLUORESCENCE ANALYZER 有权
标题翻译： X射线荧光分析仪
公开(公告)号：US20160161428A1
公开(公告)日：2016-06-09
申请号：US14956370
申请日：2015-12-01
申请人： HITACHI HIGH-TECH SCIENCE CORPORATION
发明人： Toshiyuki TAKAHARA , Hiroyuki NODA , Ai MASUDA
IPC分类号： G01N23/223 , G21F3/00
CPC分类号： G01N23/223 , G01N2223/076 , G01N2223/30 , G01N2223/6113 , G21F3/00
摘要： An X-ray fluorescence analyzer includes: a sample stage having a mounting surface on which a sample on which a sample is mounted is mounted; an X-ray source configured to irradiate the sample with primary X-rays and disposed immediately above an irradiation position of the sample; a detector configured to detect fluorescent X-rays emitted from the sample irradiated with the primary X-rays; and a shielding container configured to accommodate the sample stage, the X-ray source, and the detector and includes: a sample chamber configured to accommodate the sample stage; and a door provided at a top of the sample chamber and configured to open and close at least a front half of the sample chamber, wherein the X-ray source and the detector are disposed at a rear half of the sample chamber.
摘要翻译： X射线荧光分析仪包括：样品台，其具有安装表面，其上安装有样品的样品; X射线源，被配置为将样品照射到初级X射线并且立即设置在样品的照射位置的正上方; 检测器，被配置为检测从所述主X射线照射的样品发射的荧光X射线; 以及屏蔽容器，其构造成容纳所述样品台，所述X射线源和所述检测器，并且包括：样本室，其被配置为容纳所述样品台; 以及设置在样品室顶部并构造成打开和关闭样品室的至少前半部分的门，其中X射线源和检测器设置在样品室的后半部分。

2. 发明申请

US20150362445A1 X-RAY FLUORESCENCE ANALYZER 有权
标题翻译： X射线荧光分析仪
公开(公告)号：US20150362445A1
公开(公告)日：2015-12-17
申请号：US14735393
申请日：2015-06-10
申请人： HITACHI HIGH-TECH SCIENCE CORPORATION
发明人： Haruo TAKAHASHI , Ryusuke HIROSE , Isao YAGI , Toshiyuki TAKAHARA
IPC分类号： G01N23/223 , G01N35/00 , G21K1/02 , G01N23/22
CPC分类号： G01N23/223 , G01N35/00693 , G21K1/067
摘要： An X-ray fluorescence analyzer includes: a measurement device having: an X-ray source that emits an X-ray; an irradiation area restricting member that restricts an area of a measurement sample to be irradiated with the X-ray as a primary X-ray; and a detector that detects a secondary X-ray generated from the measurement sample. The analyzer further includes: a sample stage that holds and moves the measurement sample between a measurement position at which the measurement sample is irradiated with the primary X-ray to detect the secondary X-ray by the detector and a first retracted position at which the measurement sample is retracted from the measurement position; and a calibration sample moving mechanism that holds a calibration sample for calibrating the measurement device and moves the calibration sample between the measurement position and a second retracted position at which the calibration sample is retracted from the measurement position.
摘要翻译：一种X射线荧光分析装置，具备：具有X射线源的X射线源的测定装置，照射区域限制构件，其限制要用X射线照射的测量样本的面积作为主X射线; 以及检测器，其检测从测量样品产生的次级X射线。分析装置还包括：样本台，其将测量样本保持并移动到测量样本被照射的测量位置与主X射线之间以检测由检测器检测次级X射线;以及第一缩回位置，测量样品从测量位置缩回; 以及校准样品移动机构，其保持用于校准测量装置的校准样品，并且使测量位置与校准样品从测量位置缩回的第二缩回位置之间移动校准样品。

3. 发明申请

US20220291152A1 INSPECTION METHOD AND INSPECTION DEVICE FOR MEMBRANE ELECTRODE ASSEMBLY 有权
公开(公告)号：US20220291152A1
公开(公告)日：2022-09-15
申请号：US17670910
申请日：2022-02-14
申请人： TOYOTA JIDOSHA KABUSHIKI KAISHA , c/o HITACHI HIGH-TECH SCIENCE CORPORATION
发明人： Shinya TAKESHITA , Toshiyuki TAKAHARA
IPC分类号： G01N23/18 , G01N23/04 , G01N23/083 , G01B15/02
摘要： An inspection method of a membrane electrode assembly includes a first process of acquiring an X-ray transmission image of the membrane electrode assembly, a second process of identifying a luminance-reduced region having a luminance lower than a luminance of a surrounding region in the X-ray transmission image acquired in the first process, a third process of correcting the luminance of the luminance-reduced region identified in the second process, in accordance with a planar size of the luminance-reduced region, based on a correlation between a planar size of a foreign matter in the membrane electrode assembly and change in luminance due to diffraction of X-rays, and a fourth process of finding a thickness of the foreign matter in the membrane electrode assembly based on the luminance corrected in the third process.

4. 发明申请

US20160146745A1 X-RAY FLUORESCENCE ANALYZER AND X-RAY FLUORESCENCE ANALYZING METHOD 有权
标题翻译： X射线荧光分析仪和X射线荧光分析方法
公开(公告)号：US20160146745A1
公开(公告)日：2016-05-26
申请号：US14948297
申请日：2015-11-21
申请人： HITACHI HIGH-TECH SCIENCE CORPORATION
发明人： Toshiyuki TAKAHARA
IPC分类号： G01N23/223 , H01J35/16 , G01N23/22
CPC分类号： G01N23/223 , G01N2223/076 , H01J35/16
摘要： An X-ray fluorescence analyzer includes: a sample stage; an X-ray source; a detector; an X stage; a Y stage; a θ stage; and a shielding container, wherein the irradiation position with primary X-rays is set at an offset position from a movement center of the X stage and the Y stage, wherein an irradiation area that is irradiatable with the primary X-rays is set to a selected segmented area from among segmented areas that are defined by segmenting the surface of the sample into four parts with a virtual segment lines in the X direction and the Y direction passing through the movement center, and wherein the θ stage is configured to switch the selected segmented area into any one of the segmented areas by rotating the sample stage by every 90 degrees.
摘要翻译： X射线荧光分析仪包括：样品台; X射线源; 检测器 X阶段一个Y阶段 a＆thetas; 阶段; 以及屏蔽容器，其中，具有初级X射线的照射位置设定在与X级和Y级的移动中心的偏移位置，其中可以将主X射线照射的照射区域设定为通过将样本的表面分割为四个部分，通过在X方向上的虚拟分段线和穿过运动中心的Y方向来定义分割区域中的选定的分割区域，舞台被配置为通过将样品台旋转90度来将所选择的分割区域切换成任何一个分割区域。

5. 发明公开

US20240297316A1 HYDROGEN IMPURITY TESTING SYSTEM AND HYDROGEN IMPURITY TESTING METHOD 审中-公开
公开(公告)号：US20240297316A1
公开(公告)日：2024-09-05
申请号：US18584812
申请日：2024-02-22
申请人： HITACHI HIGH-TECH SCIENCE CORPORATION
发明人： Yoshitaka SASAGO , Daisuke RYUZAKI , Naoki SUZUKI , Toshiyuki TAKAHARA , Yoshiki MATOBA
IPC分类号： H01M8/0444 , G01N27/00
CPC分类号： H01M8/0444 , G01N27/002
摘要： The highly reliable hydrogen impurity testing system includes a sensor unit installed in an atmosphere with highly concentrated hydrogen containing toxic impurities, a heater unit capable of heating the sensor unit, and a system controller controlling the sensor unit and the heater unit. The heater unit includes a semiconductor substrate, an impurity layer of a first conductive type, a metal oxide layer, and a metal electrode layer capable of adsorbing toxic impurities being present on the surface of the metal oxide layer. The system controller detects the concentration of the toxic impurities by measuring the change in work function of the metal electrode layer according to the type and concentration of the toxic impurities, and performs a refreshing operation of desorbing the toxic impurities adsorbed on the metal electrode layer by heating the metal electrode layer with the heater unit based on the result of detection.

6. 发明公开

US20230384247A1 X-RAY INSPECTION APPARATUS AND METHOD OF INSPECTION WITH X-RAYS 审中-公开
公开(公告)号：US20230384247A1
公开(公告)日：2023-11-30
申请号：US18137910
申请日：2023-04-21
申请人： HITACHI HIGH-TECH SCIENCE CORPORATION
发明人： Toshiyuki TAKAHARA , Tsuneo SATO , Satoshi MATSUBARA , Yuta SEKI , Kazuya IWATA
IPC分类号： G01N23/083 , G01N23/18
CPC分类号： G01N23/083 , G01N23/18 , G01N2223/313
摘要： Proposed are an X-ray inspection apparatus and a method of inspection with X-rays in which even in a sample having coated portion and uncoated portion of the cathode material, the inspection of foreign objects in the both portions can be simultaneously performed under the same conditions. The X-ray inspection apparatus includes an X-ray source (2) that irradiates the sample (S) with X-rays (X1), an X-ray detection unit (3) which is installed at a side opposite to the X-ray source with respect to the sample and detects the X-rays that passed through the sample, and a filter (4) installed between the X-ray source and the X-ray detection unit, wherein the sample has a region with a large amount of X-ray absorption and a region with a small amount of X-ray absorption.

7. 发明公开

US20230384246A1 X-RAY INSPECTION APPARATUS AND METHOD OF INSPECTION WITH X-RAYS 审中-公开
公开(公告)号：US20230384246A1
公开(公告)日：2023-11-30
申请号：US18137901
申请日：2023-04-21
申请人： HITACHI HIGH-TECH SCIENCE CORPORATION
发明人： Toshiyuki TAKAHARA , Tsuneo SATO , Satoshi MATSUBARA , Yuta SEKI , Kazuya IWATA
IPC分类号： G01N23/083 , G01N23/04 , G01N23/18
CPC分类号： G01N23/083 , G01N23/04 , G01N23/18 , G01N2223/33
摘要： Proposed are an X-ray inspection apparatus and a method of inspection with X-rays in which foreign objects in even a sample in which bending, sagging, or curving may occur can be inspected accurately. The X-ray inspection apparatus includes an X-ray source (2) which irradiates a sample with an X-ray, an X-ray detection unit (3) that is installed on a side opposite to the X-ray source with respect to the sample and detects the X-ray that passed through the sample, and a sample support mechanism (14) that supports the sample, wherein the sample is flexible and has a shape of a film, and the sample support mechanism has a support body (4) through which the X-ray is capable of passing and which is in close contact with and supports at least a portion of the sample, that is disposed between the X-ray source and the X-ray detection unit.

8. 发明申请

US20210262949A1 INSPECTING METHOD AND INSPECTION APPARATUS FOR MEMBRANEELECTRODE ASSEMBLY 有权
公开(公告)号：US20210262949A1
公开(公告)日：2021-08-26
申请号：US17183739
申请日：2021-02-24
申请人： TOYOTA JIDOSHA KABUSHIKI KAISHA , HITACHI HIGH-TECH SCIENCE CORPORATION
发明人： Shinya TAKESHITA , Toshiyuki TAKAHARA , Masaki TATSUMI
IPC分类号： G01N23/18 , H01M8/04664 , H01M8/1004 , G01B15/02 , G01N23/083 , G01N23/04
摘要： A method of inspecting a membrane-electrode assembly includes obtaining an X-ray transmission image by applying X-rays to the membrane-electrode assembly, and determining whether a foreign matter having a size equal to or larger than a predetermined value is included in the membrane-electrode assembly, according to a brightness reduction amount in each pixel of the X-ray transmission image obtained, while referring to a correlative relationship between the size of the foreign matter measured in a planar direction of the membrane-electrode assembly, and the brightness reduction amount in the X-ray transmission image.

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