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    • 1. 发明授权
    • Automated analysis device
    • US10717087B2
    • 2020-07-21
    • US16487029
    • 2018-03-08
    • Hitachi High-Tech Corporation
    • Akihiro YasuiAkihisa MakinoMasashi AkutsuHiroyuki MishimaYoshihiro Suzuki
    • B01L9/00G01N35/00G01N35/02G01N35/10
    • Provided is an automated analysis device with which sufficient reaction process data can be acquired irrespective of the scale of the device, and with which it is possible to ensure freedom of the device configuration. An automated analysis device 100 is provided with: a reaction disk 1 which circumferentially accommodates a plurality of reaction vessels 2; a specimen dispensing mechanism 11 which dispenses a specimen into the reaction vessels 2; a reagent dispensing mechanism 7 which dispenses a reagent into the reaction vessels 2; a measuring unit 4 which measures a reaction process of a mixture of the specimen and the reagent in the reaction vessels 2; and a cleaning mechanism 3 which cleans the reaction vessels 2 after measurement. Further, the automated analysis device 100 includes a controller 21 which controls the drive of the reaction disk 1 such that in one cycle the reaction vessels 2 move by an amount A in the circumferential direction in such a way that N and A are mutually prime, B and C are mutually prime, and the relationship A×B=N×C±1 holds, where N is the total number of reaction vessels 2 accommodated in the reaction disk 1, the reaction disk 1 moves through C (where C>1) rotations+an amount equivalent to one reaction vessel after B (where B>2) cycles, and the number of reaction vessels 2 moved in one cycle is A (where N>A>N/B+1).
    • 6. 发明授权
    • Automated analysis device
    • US11235334B2
    • 2022-02-01
    • US16918858
    • 2020-07-01
    • Hitachi High-Tech Corporation
    • Akihiro YasuiAkihisa MakinoMasashi AkutsuHiroyuki MishimaYoshihiro Suzuki
    • B01L9/00G01N35/00G01N35/02G01N35/10
    • Provided is an automated analysis device with which sufficient reaction process data can be acquired irrespective of the scale of the device, and with which it is possible to ensure freedom of the device configuration. An automated analysis device 100 is provided with: a reaction disk 1 which circumferentially accommodates a plurality of reaction vessels 2; a specimen dispensing mechanism 11 which dispenses a specimen into the reaction vessels 2; a reagent dispensing mechanism 7 which dispenses a reagent into the reaction vessels 2; a measuring unit 4 which measures a reaction process of a mixture of the specimen and the reagent in the reaction vessels 2; and a cleaning mechanism 3 which cleans the reaction vessels 2 after measurement. Further, the automated analysis device 100 includes a controller 21 which controls the drive of the reaction disk 1 such that in one cycle the reaction vessels 2 move by an amount A in the circumferential direction in such a way that N and A are mutually prime, B and C are mutually prime, and the relationship A×B=N×C±1 holds, where N is the total number of reaction vessels 2 accommodated in the reaction disk 1, the reaction disk 1 moves through C (where C>1) rotations+an amount equivalent to one reaction vessel after B (where B>2) cycles, and the number of reaction vessels 2 moved in one cycle is A (where N>A>N/B+1).
    • 9. 发明授权
    • Automated analyzer
    • US11486887B2
    • 2022-11-01
    • US16468761
    • 2017-11-13
    • Hitachi High-Tech Corporation
    • Masashi AkutsuAkihisa MakinoHiroyuki MishimaAkihiro Yasui
    • G01N35/04G01N35/00G01N35/02
    • The present invention is provided with a sample rack insertion unit 12 that is capable of holding one or more sample racks 5 having mounted therein one or more sample containers 6 accommodating a sample to be analyzed, one or more analysis devices 2, 3 for analyzing the sample accommodated in the sample containers 6, a sample rack conveyance unit 14 for conveying the sample racks 5 from the sample rack insertion unit 12 to the analysis devices 2, 3, and a control device 4 for acquiring, for each analysis device 2, 3, load information that is information expressing an operating condition of the analysis device 2, 3, and, if there is an analysis device 2, 3 for which the load information is larger than a predetermined conveyance permission value, carrying out control so as to stop the conveyance of the sample racks 5 from the sample rack insertion unit 12 to the analysis device(s) 2, 3. As a result of this configuration, it is possible to mitigate in-device sample conveyance congestion occurring as a result of the insertion of many samples and keep the sample environment and analysis processing power at high levels.