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1. 发明申请

US20170314990A1 DEVICES AND METHODS FOR ANALYZING GRANULAR SAMPLES 审中-公开
公开(公告)号：US20170314990A1
公开(公告)日：2017-11-02
申请号：US15652458
申请日：2017-07-18
申请人： H2Optx Inc.
发明人： Rudolf J. Hofmeister , Donald A. Ice , Scott W. Tandy
IPC分类号： G01J3/42 , B01D46/00 , G01N33/15 , G01N23/00 , G01N21/65 , G01N21/3577 , G01N21/3504 , G01N21/33 , G01N21/25 , G01N21/01 , G01N1/06 , G01J3/44 , G01J3/10 , G01J3/06 , G01J3/00 , B01D46/42 , G01N35/10
CPC分类号： G01J3/42 , B01D46/0002 , B01D46/42 , G01J3/00 , G01J3/0202 , G01J3/0205 , G01J3/0237 , G01J3/0267 , G01J3/0286 , G01J3/0291 , G01J3/06 , G01J3/10 , G01J3/2823 , G01J3/44 , G01N1/06 , G01N21/01 , G01N21/25 , G01N21/253 , G01N21/33 , G01N21/3504 , G01N21/3577 , G01N21/65 , G01N23/00 , G01N33/15 , G01N35/10 , G01N2021/0106 , G01N2201/0231
摘要： In some aspects, a device for apportioning granular samples includes a sample feeder defining a conduit, the conduit including a first opening to receive the granular samples and a second opening. The device includes a shuttle operably coupled to the sample feeder to receive the granular samples from the conduit via the second opening. The shuttle is configured to apportion the granular samples to incrementally enter a sample chamber to be analyzed. The device includes an outlet conduit fluidly coupled to the sample chamber and configured to permit the sample chamber to be evacuated.

2. 发明申请

US20160216154A1 SYSTEMS, DEVICES AND METHODS FOR ANALYZING AND PROCESSING SAMPLES 审中-公开
标题翻译：用于分析和处理样品的系统，设备和方法
公开(公告)号：US20160216154A1
公开(公告)日：2016-07-28
申请号：US15006681
申请日：2016-01-26
申请人： H2Optx Inc.
发明人： Rudolf J. Hofmeister , Donald A. Ice , Scott W. Tandy
IPC分类号： G01J3/42 , G01J3/06 , G01J3/10 , G01J3/44
CPC分类号： G01J3/42 , B01D46/0002 , B01D46/42 , G01J3/00 , G01J3/0202 , G01J3/0205 , G01J3/0237 , G01J3/0267 , G01J3/0286 , G01J3/0291 , G01J3/06 , G01J3/10 , G01J3/2823 , G01J3/44 , G01N1/06 , G01N21/01 , G01N21/25 , G01N21/253 , G01N21/33 , G01N21/3504 , G01N21/3577 , G01N21/65 , G01N23/00 , G01N33/15 , G01N35/10 , G01N2021/0106 , G01N2201/0231
摘要： An example embodiment may include a hyperspectral analyzation subassembly configured to obtain information for a sample. The hyperspectral analyzation subassembly may include one or more transmitters configured to generate electromagnetic radiation electromagnetically coupled to the sample, one or more sensors configured to detect electromagnetic radiation electromagnetically coupled to the sample, and an electromagnetically transmissive window. At least one of the sensors may be configured to detect electromagnetic radiation from the sample via the window. The hyperspectral analyzation subassembly may include an analyzation actuation subassembly configured to actuate at least a portion of the hyperspectral analyzation subassembly in one or more directions of movement with respect to the sample.
摘要翻译：示例性实施例可以包括被配置为获取样本的信息的超光谱分析子组件。超光谱分析子组件可以包括被配置为产生电磁耦合到样品的电磁辐射的一个或多个发射器，配置成检测电磁耦合到样品的电磁辐射的一个或多个传感器和电磁透射窗口。传感器中的至少一个可经配置以经由窗口检测来自样品的电磁辐射。超光谱分析子组件可以包括分析致动子组件，其被配置为致动相对于样品的一个或多个运动方向的高光谱分析子组件的至少一部分。

3. 发明授权

US09453764B2 Devices and methods for analyzing layers of samples 有权
标题翻译：用于分析样品层的设备和方法
公开(公告)号：US09453764B2
公开(公告)日：2016-09-27
申请号：US14805221
申请日：2015-07-21
申请人： H2Optx Inc.
发明人： Rudolf J. Hofmeister , Donald A. Ice , Scott W. Tandy
IPC分类号： G01N21/25 , G01J3/42 , G01J3/44 , G01J3/06 , G01J3/10 , B01D46/00 , B01D46/42 , G01N1/06 , G01N33/15 , G01N21/01 , G01N23/00 , G01N35/10 , G01N21/3504 , G01J3/00 , G01N21/33 , G01N21/3577 , G01N21/65
CPC分类号： G01J3/42 , B01D46/0002 , B01D46/42 , G01J3/00 , G01J3/0267 , G01J3/0291 , G01J3/06 , G01J3/10 , G01J3/44 , G01N1/06 , G01N21/01 , G01N21/25 , G01N21/253 , G01N21/33 , G01N21/3504 , G01N21/3577 , G01N21/65 , G01N23/00 , G01N33/15 , G01N35/10 , G01N2021/0106 , G01N2201/0231
摘要： The present disclosure generally relates to systems, devices and methods for analyzing and processing samples or analytes. In one example configuration, a method of analyzing an analyte includes shaving a first layer of a plurality of layers of an analyte to expose a first surface of an analyte. The method includes positioning the first surface of the analyte over a window of a hyperspectral analyzation subassembly. The method further includes scanning the first surface of the analyte by the hyperspectral analyzation subassembly to obtain information regarding the analyte proximate the first surface. Other systems, devices and methods are disclosed herein.
摘要翻译：本公开一般涉及用于分析和处理样品或分析物的系统，装置和方法。在一个示例性配置中，分析分析物的方法包括剃刮分析物的多个层的第一层以暴露分析物的第一表面。该方法包括将分析物的第一表面定位在高光谱分析子组件的窗口上。该方法还包括通过高光谱分析子组件扫描分析物的第一表面以获得关于第一表面附近的分析物的信息。本文公开了其它系统，装置和方法。

4. 发明申请

US20160216288A1 DEVICES AND METHODS FOR ANALYZING GRANULAR SAMPLES 有权
标题翻译：用于分析颗粒样品的装置和方法
公开(公告)号：US20160216288A1
公开(公告)日：2016-07-28
申请号：US14744778
申请日：2015-06-19
申请人： H2Optx Inc.
发明人： Rudolf J. Hofmeister , Donald A. Ice , Scott W. Tandy
IPC分类号： G01N35/10 , G01N21/01 , G01N23/00
CPC分类号： G01J3/42 , B01D46/0002 , B01D46/42 , G01J3/00 , G01J3/0267 , G01J3/0291 , G01J3/06 , G01J3/10 , G01J3/44 , G01N1/06 , G01N21/01 , G01N21/25 , G01N21/253 , G01N21/33 , G01N21/3504 , G01N21/3577 , G01N21/65 , G01N23/00 , G01N33/15 , G01N35/10 , G01N2021/0106 , G01N2201/0231
摘要： In some aspects, a device for apportioning granular samples includes a sample feeder defining a conduit, the conduit including a first opening to receive the granular samples and a second opening. The device includes a shuttle operably coupled to the sample feeder to receive the granular samples from the conduit via the second opening. The shuttle is configured to apportion the granular samples to incrementally enter a sample chamber to be analyzed. The device includes an outlet conduit fluidly coupled to the sample chamber and configured to permit the sample chamber to be evacuated.
摘要翻译：在一些方面，用于分配颗粒样品的装置包括限定导管的样品进料器，所述导管包括用于接收颗粒样品的第一开口和第二开口。该装置包括可操作地连接到样品供给器的穿梭器，以经由第二开口从导管接收颗粒样品。梭子被配置成分配颗粒样品以递增地进入待分析的样品室。该装置包括流体耦合到样品室并被配置为允许样品室被排空的出口导管。

5. 发明申请

US20160041087A1 ANALYSIS AND PURGING OF MATERIALS IN MANUFACTURING PROCESSES 有权
标题翻译：材料在制造过程中的分析和清洗
公开(公告)号：US20160041087A1
公开(公告)日：2016-02-11
申请号：US14454483
申请日：2014-08-07
申请人： H2Optx Inc.
发明人： Rudolf J. Hofmeister , Donald A. Ice , Scott W. Tandy
IPC分类号： G01N21/11 , G01N21/03
CPC分类号： G01N21/11 , G01N21/03 , G01N21/31 , G01N21/65 , G01N2021/115 , G01N2201/022
摘要： Various systems and methods of analyzing one or more properties of a sample are provided. The system includes a self-contained purging device having a sample holder and one or more analyzers for analyzing one or more properties of the sample. The purging device is configured to remove sample contained within the sample holder when an analysis is complete. In one embodiment the purging device is configured via an air pump having a tube in fluid communication with an air inlet of the sample holder, wherein the air pump is configured to deliver pressurized air to the air inlet and thereby purge the sample. The pressurized air is localized ambient air, and substantially free of contaminants. Methods and other systems are also described and illustrated.
摘要翻译：提供了分析样品的一种或多种性质的各种系统和方法。该系统包括具有样品保持器和用于分析样品的一个或多个性质的一个或多个分析器的独立清洗装置。清洗装置被配置为当分析完成时除去样品架中包含的样品。在一个实施例中，清洗装置经由具有与样品保持器的空气入口流体连通的管的空气泵配置，其中空气泵构造成将加压空气输送到空气入口并由此吹扫样品。加压空气是局部环境空气，并且基本上没有污染物。还描述和示出了方法和其他系统。

6. 发明授权

US09863868B2 Analysis and purging of materials in manufacturing processes 有权
公开(公告)号：US09863868B2
公开(公告)日：2018-01-09
申请号：US14454483
申请日：2014-08-07
申请人： H2Optx Inc.
发明人： Rudolf J. Hofmeister , Donald A. Ice , Scott W. Tandy
IPC分类号： G01N1/10 , G01N21/11 , G01N21/03 , G01N21/31 , G01N21/65
CPC分类号： G01N21/11 , G01N21/03 , G01N21/31 , G01N21/65 , G01N2021/115 , G01N2201/022
摘要： Various systems and methods of analyzing one or more properties of a sample are provided. The system includes a self-contained purging device having a sample holder and one or more analyzers for analyzing one or more properties of the sample. The purging device is configured to remove sample contained within the sample holder when an analysis is complete. In one embodiment the purging device is configured via an air pump having a tube in fluid communication with an air inlet of the sample holder, wherein the air pump is configured to deliver pressurized air to the air inlet and thereby purge the sample. The pressurized air is localized ambient air, and substantially free of contaminants. Methods and other systems are also described and illustrated.

7. 发明授权

US09846077B2 Devices and methods for analyzing granular samples 有权
公开(公告)号：US09846077B2
公开(公告)日：2017-12-19
申请号：US14744778
申请日：2015-06-19
申请人： H2Optx Inc.
发明人： Rudolf J. Hofmeister , Donald A. Ice , Scott W. Tandy
IPC分类号： B07C5/00 , G01J3/42 , G01J3/44 , G01J3/06 , G01J3/10 , B01D46/00 , B01D46/42 , G01N1/06 , G01N21/25 , G01N33/15 , G01N21/01 , G01N23/00 , G01N35/10 , G01N21/3504 , G01J3/00 , G01N21/33 , G01N21/3577 , G01N21/65
CPC分类号： G01J3/42 , B01D46/0002 , B01D46/42 , G01J3/00 , G01J3/0267 , G01J3/0291 , G01J3/06 , G01J3/10 , G01J3/44 , G01N1/06 , G01N21/01 , G01N21/25 , G01N21/253 , G01N21/33 , G01N21/3504 , G01N21/3577 , G01N21/65 , G01N23/00 , G01N33/15 , G01N35/10 , G01N2021/0106 , G01N2201/0231
摘要： In some aspects, a device for apportioning granular samples includes a sample feeder defining a conduit, the conduit including a first opening to receive the granular samples and a second opening. The device includes a shuttle operably coupled to the sample feeder to receive the granular samples from the conduit via the second opening. The shuttle is configured to apportion the granular samples to incrementally enter a sample chamber to be analyzed. The device includes an outlet conduit fluidly coupled to the sample chamber and configured to permit the sample chamber to be evacuated.

8. 发明申请

US20160216199A1 DEVICES AND METHODS FOR ANALYZING LAYERS OF SAMPLES 有权
标题翻译：用于分析样品层的装置和方法
公开(公告)号：US20160216199A1
公开(公告)日：2016-07-28
申请号：US14805221
申请日：2015-07-21
申请人： H2Optx Inc.
发明人： Rudolf J. Hofmeister , Donald A. Ice , Scott W. Tandy
IPC分类号： G01N21/25 , B01D46/42 , B01D46/00 , G01N33/15 , G01N1/06
CPC分类号： G01J3/42 , B01D46/0002 , B01D46/42 , G01J3/00 , G01J3/0267 , G01J3/0291 , G01J3/06 , G01J3/10 , G01J3/44 , G01N1/06 , G01N21/01 , G01N21/25 , G01N21/253 , G01N21/33 , G01N21/3504 , G01N21/3577 , G01N21/65 , G01N23/00 , G01N33/15 , G01N35/10 , G01N2021/0106 , G01N2201/0231
摘要： The present disclosure generally relates to systems, devices and methods for analyzing and processing samples or analytes. In one example configuration, a method of analyzing an analyte includes shaving a first layer of a plurality of layers of an analyte to expose a first surface of an analyte. The method includes positioning the first surface of the analyte over a window of a hyperspectral analyzation subassembly. The method further includes scanning the first surface of the analyte by the hyperspectral analyzation subassembly to obtain information regarding the analyte proximate the first surface. Other systems, devices and methods are disclosed herein.
摘要翻译：本公开一般涉及用于分析和处理样品或分析物的系统，装置和方法。在一个示例性配置中，分析分析物的方法包括剃刮分析物的多个层的第一层以暴露分析物的第一表面。该方法包括将分析物的第一表面定位在高光谱分析子组件的窗口上。该方法还包括通过高光谱分析子组件扫描分析物的第一表面以获得关于第一表面附近的分析物的信息。本文公开了其它系统，装置和方法。

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