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    • 10. 发明授权
    • Method and apparatus for sensing resistive memory state
    • 用于感测电阻式存储器状态的方法和装置
    • US06954385B2
    • 2005-10-11
    • US10918386
    • 2004-08-16
    • Stephen L. CasperKevin DuesmanGlen Hush
    • Stephen L. CasperKevin DuesmanGlen Hush
    • G11C13/00G11C11/34G11C13/02G11C16/28H01L27/105
    • G11C13/0069G11C13/0004G11C13/0011G11C13/004G11C2013/0042G11C2013/0054G11C2013/009G11C2213/79
    • A sense circuit for reading a resistance level of a programmable conductor random access memory (PCRAM) cell is provided. A voltage potential difference is introduced across a PCRAM cell by activating an access transistor from a raised rowline voltage. Both a digit line and a digit complement reference line are precharged to a first predetermined voltage. The cell being sensed has the precharged voltage discharged through the resistance of the programmable conductor memory element of the PCRAM cell. A comparison is made of the voltage read at the digit line and at the reference conductor. If the voltage at the digit line is greater than the reference voltage, the cell is read as a high resistance value (e.g., logic HIGH); however, if the voltage measured at the digit line is lower than that of the reference voltage, the cell is read as a low resistance value (e.g., logic LOW).
    • 提供了用于读取可编程导体随机存取存储器(PCRAM)单元的电阻电平的读出电路。 通过从升高的行线电压激活存取晶体管,通过PCRAM单元引入电压电位差。 数字线和数位补码参考线都被预充电到第一预定电压。 被感测的电池具有通过PCRAM单元的可编程导体存储元件的电阻放电的预充电电压。 比较在数字线和参考导体读取的电压。 如果数字线上的电压大于参考电压,则将单元读为高电阻值(例如,逻辑高电平); 然而,如果在数字线处测量的电压低于参考电压的电压,则将该单元读为低电阻值(例如,逻辑低电平)。