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    • 1. 发明授权
    • Voltage-current conversion circuit employing MOS transistor cells as
synapses of neural network
    • 采用MOS晶体管电池的电压 - 电流转换电路作为神经网络的突触
    • US5704014A
    • 1997-12-30
    • US828063
    • 1992-01-30
    • Giulio MarottaEros Pasero
    • Giulio MarottaEros Pasero
    • G06N3/063H03K19/0948G06F15/18
    • G06N3/0635
    • A cell of MOS transistors for converting a voltage into a current for forming synapses of neural nets, in particular for converting the difference between an input voltage (V.sub.IN) and a voltage (V.sub.W) for weighting the synapse into a current, realized by means of a differential stage comprising a first transistor (M1) operating as a current generator, in which a first and a second branch in parallel end, which branches respectively comprise a second (M2) and a third (M3) push-pull connected transistor, to the gate regions of which the input voltage (V.sub.IN) and the voltage (V.sub.W) for weighting the synapse, and to which a fourth (M4) and a fifth (M5) transistor are respectively connected in series, in which the fourth (M4) and the fifth (M5) transistor are P-MOS transistors having their gate regions short-circuited and said fourth (M4) P-MOS transistor is connected as a diode, and in which the output current (I.sub.OUT) is drawn from the node (N) that connects said third (M3) and said fifth (M5) transistors inserted in series in said second branch of the circuit and a capacitor (c) is connected to the gate region of said third (M3) transistor to store the voltage (V.sub.W) for weighting the synapse applied to the circuit.
    • 用于将电压转换成用于形成神经网络突触的电流的MOS晶体管的单元,特别是用于将用于加权突触的输入电压(VIN)和电压(VW)之间的差值转换成电流,所述电压通过 差动级包括作为电流发生器工作的第一晶体管(M1),其中并联端的第一和第二支路分别分别包括第二(M2)和第三(M3)推挽连接的晶体管,至 其输入电压(VIN)和用于加权突触的电压(VW)的栅极区域和第四(M4)和第五(M5)晶体管分别串联连接的栅极区域,其中第四(M4) 并且第五(M5)晶体管是其栅极区短路的P-MOS晶体管,并且所述第四(M4)P-MOS晶体管作为二极管连接,并且其中输出电流(IOUT)从节点 N),其连接所述第三(M3)和所述第五(M5)转换器 串联插入电路的所述第二分支的电阻器和电容器(c)连接到所述第三(M3)晶体管的栅极区域,以存储用于加权施加到电路的突触的电压(VW)。
    • 4. 发明授权
    • Programmable and convertible non-volatile memory array
    • 可编程和可转换的非易失性存储器阵列
    • US5732021A
    • 1998-03-24
    • US690244
    • 1996-07-19
    • Michael C. SmaylingGiulio MarottaGiovanni SantinPietro PiersimoniCristina Lattaro
    • Michael C. SmaylingGiulio MarottaGiovanni SantinPietro PiersimoniCristina Lattaro
    • G11C16/12G11C16/16H01L21/8247H01L27/105G11C7/00
    • H01L27/11526G11C16/12G11C16/16H01L27/105H01L27/11546
    • A method for selectibly erasing one or more non-volatile programmable memory cells in an integrated circuit. The method is applicable to an array 1 of memory cells 10 fabricated in a semiconductor substrate 30 of a first conductivity type semiconductor material, each cell having a floating gate 14 for programming the cell and a control gate 11 for reading the cell, the array having a plurality of row lines 15, a plurality of column lines 25 and a plurality of output lines 18. The cells should be formed in a first well 33 of said first conductivity type semiconductor material, the first wells being formed in second wells 31 of a second conductivity type semiconductor material, the first wells including cells in groups of one or more. The method involves the steps of applying a high voltage source to a selected one or more column lines, applying a zero voltage source to a selected one or more row lines; and applying the high voltage source to non-selected row lines. The method is particularly suited to Flash memories. Erasure can be sectored by grouping cells in separate ones of the first wells and applying the method selectably to such groups.
    • 一种用于可选地擦除集成电路中的一个或多个非易失性可编程存储器单元的方法。 该方法适用于在第一导电型半导体材料的半导体衬底30中制造的存储器单元10的阵列1,每个单元具有用于对单元进行编程的浮置栅极14和用于读取该单元的控制栅极11,该阵列具有 多条行线15,多条列线25和多条输出线18.这些电池应形成在所述第一导电类型半导体材料的第一阱33中,第一阱形成在第一阱31中 第二导电型半导体材料,第一阱包括一个或多个基团的单元。 该方法包括以下步骤:将高电压源施加到所选择的一个或多个列线,将零电压源施加到所选择的一个或多个行线; 以及将高电压源施加到未选择的行线。 该方法特别适用于闪存。 可以通过将单元格分组在第一个孔中并将该方法可选择地应用于这样的组来分割擦除。
    • 5. 发明授权
    • Programmable and convertible non-volatile memory array
    • 可编程和可转换的非易失性存储器阵列
    • US5717634A
    • 1998-02-10
    • US684650
    • 1996-07-19
    • Michael C. SmaylingGiulio MarottaGiovanni SantinPietro Piersimoni
    • Michael C. SmaylingGiulio MarottaGiovanni SantinPietro Piersimoni
    • G11C16/08G11C16/10G11C17/12H01L21/8247H01L27/105G11C16/06
    • H01L27/11526G11C16/08G11C16/10G11C17/12H01L27/105H01L27/11546
    • A non-volatile, integrated circuit memory, such as a Flash EPROM, including an array 1 of memory cells 10, each cell having a floating gate 14 for programming the cell and a control gate 11 for reading the cell, the array having a plurality of row lines 15, a plurality of column lines 25 and a plurality of output lines 18. Included is a decoder circuit 16 having a plurality of input lines 94, 96, for each row in the array, and having as outputs the row lines 15. The decoder circuit includes a decoder logic circuit associated with each row line, the decoder logic circuit including a plurality of low power logic devices 84-90 interconnected to perform a predetermined decoding function on the signals on the input lines for the associated row line to apply a signal to an associated row node when the decoder logic circuit determines that the associated row line is selected. The decoder circuit also includes a high power pass device 82 associated with each row line, having one of its source and drain connected to the associated row node, having the other of its source and drain connected to a row line and having its gate connected to a first voltage, lower than the high voltage, so as to couple the signal on the row node to the row line. Finally, a keeper circuit 102 is provided, associated with each row line and coupled to the high voltage for sensing the signal on the row line and in response thereto for coupling the high voltage to the row line. The memory has high speed, since the decoder logic is performed by low power devices. In addition, in fabrication the memory is readily convertible to a permanent ROM by eliminating the formation of the floating gate, bypassing the high power pass device and not connecting the keeper circuit.
    • 诸如闪存EPROM的非易失性集成电路存储器,包括存储器单元10的阵列1,每个单元具有用于对单元进行编程的浮置栅极14和用于读取单元的控制栅极11,该阵列具有多个 行列15,多列列线25和多条输出线18.包括解码器电路16,其具有用于阵列中的每一行的多条输入线94,96,并具有作为输出的行线15 解码器电路包括与每条行线相关联的解码器逻辑电路,解码器逻辑电路包括多个低功率逻辑器件84-90,其互连以对输入线上的信号执行预定的解码功能,用于相关联的行线到 当解码器逻辑电路确定相关联的行线被选择时,将信号施加到相关联的行节点。 解码器电路还包括与每个行线相关联的高功率通过器件82,其中源极和漏极中的一个源极和漏极连接到相关联的行节点,其另一个源极和漏极连接到行线并且其栅极连接到 低于高电压的第一电压,以将行节点上的信号耦合到行线。 最后,提供一个保持器电路102,其与每个行线相关联并耦合到高电压,用于感测行线上的信号,并响应于此将高电压耦合到行线。 存储器具有高速度,因为解码器逻辑由低功率器件执行。 此外,在制造中,通过消除浮动栅极的形成,绕过高功率通过装置并且不连接保持器电路,存储器容易地转换成永久ROM。