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    • 8. 发明授权
    • DLL static phase error measurement technique
    • DLL静态相位误差测量技术
    • US06829548B2
    • 2004-12-07
    • US10406541
    • 2003-04-03
    • Priya AnanthanarayananPradeep R. TrivediClaude R. Gauthier
    • Priya AnanthanarayananPradeep R. TrivediClaude R. Gauthier
    • G06F1100
    • H03L7/0812G01R25/005
    • An apparatus for measuring static phase error in a delay locked loop includes a first test stage and a second test stage. The first test stage receives a reference clock, a chip clock, and a control signal. In parallel with the first test stage, the second test stage receives the reference clock, the chip clock, and a complement of the control signal. Dependent on the control signal, the first test stage outputs a first test signal, and, dependent on the complement of the control signal, the second test stage outputs a second test signal. The first test signal and the second test signal are used to generate a set of static phase error measurements dependent on values of the control signal and the complement of the control signal. By averaging the set of static phase error measurements, a static phase error is measured for the delay locked loop.
    • 用于测量延迟锁定环路中的静态相位误差的装置包括第一测试阶段和第二测试阶段。 第一测试阶段接收参考时钟,芯片时钟和控制信号。 与第一测试级并行,第二测试级接收参考时钟,芯片时钟和控制信号的补码。 根据控制信号,第一测试级输出第一测试信号,并且根据控制信号的补码,第二测试级输出第二测试信号。 第一测试信号和第二测试信号用于根据控制信号和控制信号的补码产生一组静态相位误差测量值。 通过对静态相位误差测量值进行平均,对延迟锁定环路测量静态相位误差。
    • 10. 发明授权
    • Programmable current source adjustment of leakage current for delay locked loop
    • 用于延迟锁定环路的可编程电流源调节漏电流
    • US06570420B1
    • 2003-05-27
    • US10230649
    • 2002-08-29
    • Pradeep R. TrivediClaude R. GauthierDean Liu
    • Pradeep R. TrivediClaude R. GauthierDean Liu
    • H03L706
    • H03L7/0891H03L7/0812
    • A method and apparatus for post-fabrication adjustment of a delay locked loop leakage current is provided. The adjustment system includes a programmable current source that adjusts a leakage current offset circuit to compensate for the leakage current of a capacitor. The capacitor connects to a control voltage of the delay locked loop. The programmable current source includes at least one current source and switch to adjust the leakage current offset circuit. The programmable current source is selectively adjusted by a combinational logic circuit. Such control of the leakage current in the delay locked loop allows a designer to achieve a desired delay locked loop operating characteristic after fabrication of the adjustable delay locked loop.
    • 提供了延迟锁定环路漏电流的制造后调整方法和装置。 调节系统包括一个可编程电流源,调节漏电流补偿电路以补偿电容器的漏电流。 电容器连接到延迟锁定环路的控制电压。 可编程电流源包括至少一个电流源和用于调整漏电流补偿电路的开关。 可编程电流源由组合逻辑电路选择性地调节。 对延迟锁定环路中的漏电流的这种控制允许设计者在制造可调延迟锁定环路之后实现期望的延迟锁定环路工作特性。