会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 1. 发明授权
    • Techniques for multi-wire encoding with an embedded clock
    • 使用嵌入式时钟进行多线编码的技术
    • US08649460B2
    • 2014-02-11
    • US12663230
    • 2008-06-04
    • Frederick WareJade Kizer
    • Frederick WareJade Kizer
    • H04L27/00
    • H03M5/16G11C7/1066G11C7/1093G11C7/222H03K3/356026H03K19/01855H03M5/20H04L25/0272H04L25/4906H04L25/4917
    • Techniques for multi-wire encoding with an embedded clock are disclosed. In one particular exemplary embodiment, the techniques may be realized as a transmitter component. The transmitter component may comprise at least one encoder module to generate a set of symbols, each symbol being represented by a combination of signal levels on a set of wires. The transmitter component may also comprise at least one signaling module to transmit one or more of the symbols over the set of wires according to a transmit clock. The transmitter component may additionally comprise control logic to restrict transmission of first and second subsets of the set of symbols to respective first and second portions of a clock cycle of the transmit clock, such that a signal differential among at least two of the set of wires exhibits a switching behavior that has a same frequency as the transmit clock.
    • 公开了一种具有嵌入式时钟的多线编码技术。 在一个特定的示例性实施例中,这些技术可以被实现为发射器部件。 发射机组件可以包括至少一个编码器模块以产生一组符号,每个符号由一组线路上的信号电平的组合表示。 发射机组件还可以包括至少一个信令模块,用于根据传输时钟在一组线路上传输一个或多个符号。 发射机组件可以另外包括控制逻辑,以将该组符号的第一和第二子集的发射限制到发射时钟的时钟周期的相应第一和第二部分,使得在该组线中的至少两个之间的信号差分 表现出与发送时钟频率相同的开关行为。
    • 2. 发明申请
    • TECHNIQUES FOR MULTI-WIRE ENCODING WITH AN EMBEDDED CLOCK
    • 用嵌入式时钟进行多线编码的技术
    • US20100215118A1
    • 2010-08-26
    • US12663230
    • 2008-06-04
    • Frederick WareJade Kizer
    • Frederick WareJade Kizer
    • H04L7/00H04L27/00
    • H03M5/16G11C7/1066G11C7/1093G11C7/222H03K3/356026H03K19/01855H03M5/20H04L25/0272H04L25/4906H04L25/4917
    • Techniques for multi-wire encoding with an embedded clock are disclosed. In one particular exemplary embodiment, the techniques may be realized as a transmitter component. The transmitter component may comprise at least one encoder module to generate a set of symbols, each symbol being represented by a combination of signal levels on a set of wires. The transmitter component may also comprise at least one signaling module to transmit one or more of the symbols over the set of wires according to a transmit clock. The transmitter component may additionally comprise control logic to restrict transmission of first and second subsets of the set of symbols to respective first and second portions of a clock cycle of the transmit clock, such that a signal differential among at least two of the set of wires exhibits a switching behavior that has a same frequency as the transmit clock.
    • 公开了一种具有嵌入式时钟的多线编码技术。 在一个特定的示例性实施例中,这些技术可以被实现为发射器部件。 发射机组件可以包括至少一个编码器模块以产生一组符号,每个符号由一组线路上的信号电平的组合来表示。 发射机组件还可以包括至少一个信令模块,用于根据传输时钟在一组线路上传输一个或多个符号。 发射机组件可以另外包括控制逻辑,以将该组符号的第一和第二子集的发射限制到发射时钟的时钟周期的相应的第一和第二部分,使得在该组线路中的至少两个之间的信号差分 表现出与发送时钟频率相同的开关行为。
    • 3. 发明授权
    • Method and apparatus for test and characterization of semiconductor components
    • 用于半导体元件测试和表征的方法和装置
    • US07592824B2
    • 2009-09-22
    • US10768443
    • 2004-01-30
    • Frederick WareScott BestTimothy ChangRichard PeregoEly TsernJeff Mitchell
    • Frederick WareScott BestTimothy ChangRichard PeregoEly TsernJeff Mitchell
    • G01R31/02G01R31/28
    • G11C29/56004G01R31/31707G06F11/24G11C2029/5602
    • A method and apparatus for testing and characterizing circuits is provided. In one embodiment, a high-speed interface of a semiconductor component includes high-speed test circuitry. The high-speed test circuitry obviates the need for an external high-speed testing system for testing and characterization. In one embodiment, the high-speed test circuitry includes a test pattern generation circuit, and various differential comparators to compare low bandwidth reference signals with interface signals during testing and characterization. In one embodiment, an interface that includes the test circuitry can test itself or another interface. In one embodiment, a timing reference signal decouples the individual parameters of two interfaces testing each other to avoid any errors introduced by the combination of individual interface circuit parameters, such as receiver parameters and transmitter parameters. The testing can be performed at the wafer stage, at the component stage, and in a system.
    • 提供了用于测试和表征电路的方法和装置。 在一个实施例中,半导体部件的高速接口包括高速测试电路。 高速测试电路无需外部高速测试系统进行测试和表征。 在一个实施例中,高速测试电路包括测试图形生成电路和各种差分比较器,用于在测试和表征期间将低带宽参考信号与接口信号进行比较。 在一个实施例中,包括测试电路的接口可以测试自身或另一接口。 在一个实施例中,定时参考信号使彼此测试的两个接口的各个参数解耦,以避免由诸如接收机参数和发射机参数的各个接口电路参数的组合引入的任何错误。 测试可以在晶片级,元件级和系统中执行。
    • 6. 发明申请
    • Memory Controller for Non-Homogeneous Memory System
    • 非均匀内存系统的内存控制器
    • US20070300038A1
    • 2007-12-27
    • US11852996
    • 2007-09-10
    • Frederick Ware
    • Frederick Ware
    • G06F12/06
    • G06F12/10G06F12/0292G06F12/08G06F12/0804G06F2212/2022G06F2212/205Y02D10/13
    • A memory controller includes at least one interface adapted to be coupled to one or more first memory devices of a first memory type having a first set of attributes, and to one or more second memory devices of a second memory type having a second set of attributes. The first and second sets of attributes have at least one differing attribute. The controller also includes interface logic configured to direct memory transactions having a predefined first characteristic to the first memory devices and to direct memory transactions having a predefined second characteristic to the second memory devices. Pages having a usage characteristic of large volumes of write operations may be mapped to the one or more first memory devices, while pages having a read-only or read-mostly usage characteristic may be mapped to the one or more second memory devices.
    • 存储器控制器包括适于耦合到具有第一组属性的第一存储器类型的一个或多个第一存储器件的至少一个接口以及具有第二组属性的第二存储器类型的一个或多个第二存储器件 。 第一和第二组属性具有至少一个不同的属性。 控制器还包括接口逻辑,其被配置为将具有预定义的第一特性的存储器事务定向到第一存储器设备,并且将具有预定义的第二特性的存储器事务定向到第二存储器设备。 具有大量写入操作的使用特性的页面可以被映射到一个或多个第一存储器设备,而具有只读或读取主要使用特性的页面可以映射到一个或多个第二存储器设备。
    • 8. 发明申请
    • Clocked Memory System with Termination Component
    • 带终端组件的定时存储系统
    • US20070247935A1
    • 2007-10-25
    • US11767983
    • 2007-06-25
    • Frederick WareEly TsernRichard PeregoCraig Hampel
    • Frederick WareEly TsernRichard PeregoCraig Hampel
    • G11C7/00
    • G11C7/1039G11C5/04G11C5/063G11C7/1048
    • A memory system having first and second memory devices and a termination component. A first signal line is coupled to the first memory device to provide first data, associated with a write command, to the first memory device, and a second signal line coupled to the second memory device to provide second data, associated with the write command, to the second memory device. A control signal path is coupled to the first and second memory devices and the termination component such that the write command propagating on the control signal path propagates past the first memory device and the second memory device before reaching the termination component. A third signal line is provided to convey a clock signal that indicates when the write command propagating on the control signal path is to be sampled by the first and second memory devices.
    • 一种具有第一和第二存储器件和终端部件的存储器系统。 第一信号线耦合到第一存储器设备,以向第一存储器设备提供与写命令相关联的第一数据,以及耦合到第二存储器设备以提供与写命令相关联的第二数据的第二信号线, 到第二存储设备。 控制信号路径被耦合到第一和第二存储器件和终端部件,使得在到达终端部件之前,在控制信号路径上传播的写入命令传播通过第一存储器件和第二存储器件。 提供第三信号线来传送时钟信号,该时钟信号指示在控制信号路径上传播的写入命令何时被第一和第二存储器件采样。