会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 1. 发明申请
    • TEMPERATURE CONTROL IN EUV RETICLE INSPECTION TOOL
    • EUV RETICLE检验工具的温度控制
    • US20130265557A1
    • 2013-10-10
    • US13857278
    • 2013-04-05
    • Frank ChileseDaniel WackDouglas Fowler
    • Frank ChileseDaniel WackDouglas Fowler
    • G03F7/20
    • G03F7/20G01N2021/95676G03F1/22G03F1/84G03F7/70875G03F7/70891
    • An apparatus comprises an optics assembly and a plate. The optics assembly configured to focus light from an EUV source onto a reticle or sensor. The plate has an opening to allow the EUV light to pass through disposed between the optics assembly and the reticle or sensor. The plate is cooled to a temperature less than that of the reticle or sensor. The plate is engineered to balance out heat absorbed from the reticle or sensor with heat absorbed by the plate. It is emphasized that this abstract is provided to comply with the rules requiring an abstract that will allow a searcher or other reader to quickly ascertain the subject matter of the technical disclosure. It is submitted with the understanding that it will not be used to interpret or limit the scope or meaning of the claims.
    • 一种装置包括光学组件和板。 光学组件被配置为将来自EUV源的光聚焦到掩模版或传感器上。 该板具有允许EUV光穿过设置在光学组件和光罩或传感器之间的开口。 将板冷却至比标线片或传感器的温度低的温度。 该板被设计成平衡来自掩模版或传感器的热量被板吸收的热量。 要强调的是,该摘要被提供以符合要求抽象的规则,允许搜索者或其他读者快速确定技术公开内容的主题。 提交它的理解是,它不会用于解释或限制权利要求的范围或含义。
    • 2. 发明授权
    • Temperature control in EUV reticle inspection tool
    • EUV光罩检测工具的温度控制
    • US09164388B2
    • 2015-10-20
    • US13857278
    • 2013-04-05
    • Frank ChileseDaniel WackDouglas Fowler
    • Frank ChileseDaniel WackDouglas Fowler
    • G03B27/32G03B27/42G03F7/20G03F1/84G03F1/22
    • G03F7/20G01N2021/95676G03F1/22G03F1/84G03F7/70875G03F7/70891
    • An apparatus comprises an optics assembly and a plate. The optics assembly configured to focus light from an EUV source onto a reticle or sensor. The plate has an opening to allow the EUV light to pass through disposed between the optics assembly and the reticle or sensor. The plate is cooled to a temperature less than that of the reticle or sensor. The plate is engineered to balance out heat absorbed from the reticle or sensor with heat absorbed by the plate. It is emphasized that this abstract is provided to comply with the rules requiring an abstract that will allow a searcher or other reader to quickly ascertain the subject matter of the technical disclosure. It is submitted with the understanding that it will not be used to interpret or limit the scope or meaning of the claims.
    • 一种装置包括光学组件和板。 光学组件被配置为将来自EUV源的光聚焦到掩模版或传感器上。 该板具有允许EUV光穿过设置在光学组件和光罩或传感器之间的开口。 将板冷却至比标线片或传感器的温度低的温度。 该板被设计成平衡来自掩模版或传感器的热量被板吸收的热量。 要强调的是,该摘要被提供以符合要求抽象的规则,允许搜索者或其他读者快速确定技术公开内容的主题。 提交它的理解是,它不会用于解释或限制权利要求的范围或含义。
    • 3. 发明申请
    • MULTIPLEXING EUV SOURCES IN RETICLE INSPECTION
    • 反复检查中的多重EUV来源
    • US20140036333A1
    • 2014-02-06
    • US13563850
    • 2012-08-01
    • Daniel WackDaimian WangKarl R. UmstadterEd MaFrank Chilese
    • Daniel WackDaimian WangKarl R. UmstadterEd MaFrank Chilese
    • G02B26/08
    • G02B26/123G01N21/8806G01N2021/95676G01N2201/105G03F1/24G03F1/84G03F7/7005
    • The present disclosure is directed to an illumination system. The illumination system may include a base member rotatable about a rotation axis and a plurality of mirrors disposed on an outer surface of the base member along a perimeter of the base member. The mirrors may be oriented at a predetermined angle. The illumination system also includes at least two illumination sources. Each of the mirrors of the first plurality of mirrors is configured to receive radiation from the first illumination source at a first portion of each mirror at a first time. The mirror is configured to reflect the radiation to an optical path. Each of the mirrors is further configured to receive radiation from the second illumination source at a second portion of the mirror at a second time. The mirrors reflect the radiation from the second illumination source to the common optical path.
    • 本公开涉及一种照明系统。 照明系统可以包括可围绕旋转轴线旋转的基座构件和沿着基座构件的周边设置在基座构件的外表面上的多个反射镜。 反射镜可以以预定角度定向。 照明系统还包括至少两个照明源。 第一多个反射镜的每个反射镜被配置为在第一时间在每个反射镜的第一部分处接收来自第一照明源的辐射。 镜被配置为将辐射反射到光路。 每个反射镜被进一步配置成在第二时间在反射镜的第二部分处接收来自第二照明光源的辐射。 反射镜将从第二照明源的辐射反射到公共光路。
    • 4. 发明授权
    • Multiplexing EUV sources in reticle inspection
    • 在掩模版检查中复用EUV源
    • US08917432B2
    • 2014-12-23
    • US13563850
    • 2012-08-01
    • Daniel WackDaimian WangKarl R. UmstadterEd MaFrank Chilese
    • Daniel WackDaimian WangKarl R. UmstadterEd MaFrank Chilese
    • G02B26/08G03F7/20G02B26/12
    • G02B26/123G01N21/8806G01N2021/95676G01N2201/105G03F1/24G03F1/84G03F7/7005
    • The present disclosure is directed to an illumination system. The illumination system may include a base member rotatable about a rotation axis and a plurality of mirrors disposed on an outer surface of the base member along a perimeter of the base member. The mirrors may be oriented at a predetermined angle. The illumination system also includes at least two illumination sources. Each of the mirrors of the first plurality of mirrors is configured to receive radiation from the first illumination source at a first portion of each mirror at a first time. The mirror is configured to reflect the radiation to an optical path. Each of the mirrors is further configured to receive radiation from the second illumination source at a second portion of the mirror at a second time. The mirrors reflect the radiation from the second illumination source to the common optical path.
    • 本公开涉及一种照明系统。 照明系统可以包括可围绕旋转轴线旋转的基座构件和沿着基座构件的周边设置在基座构件的外表面上的多个反射镜。 反射镜可以以预定角度定向。 照明系统还包括至少两个照明源。 第一多个反射镜的每个反射镜被配置为在第一时间在每个反射镜的第一部分处接收来自第一照明源的辐射。 镜被配置为将辐射反射到光路。 每个反射镜被进一步配置成在第二时间在反射镜的第二部分处接收来自第二照明光源的辐射。 反射镜将从第二照明源的辐射反射到公共光路。
    • 7. 发明授权
    • Recirculation high purity system for protecting optical modules or inspection system during storage, transport and shipping
    • 循环高纯度系统,用于在储存,运输和运输过程中保护光学模块或检查系统
    • US08414688B1
    • 2013-04-09
    • US13160878
    • 2011-06-15
    • Gildardo DelgadoFrank ChileseRudolf Brunner
    • Gildardo DelgadoFrank ChileseRudolf Brunner
    • B01D46/00
    • B08B9/08
    • A purging apparatus for a storage chamber is disclosed. The purging apparatus is configured for establishing a purge gas flow through the storage chamber. The purging apparatus may include a gas purifier and a particle filter. The gas purifier may provide a purge gas to the storage chamber. The purge gas may flow through the storage chamber, and a mixture of the purge gas and potential contaminants may subsequently exit the storage chamber as exhaust gas. The particle filter may receive and filter the exhaust gas. The filtered gas may be provided to the gas purifier for purification and recirculation. The gas purifier may purify the filtered gas by substantially removing at least one of: an acid, a base, an organic compound, water or oxygen from the filtered gas. The purified filtered gas may then be recirculated and provided to the storage chamber as the purge gas.
    • 公开了一种用于储存室的清洗装置。 清洗装置构造成用于建立通过储存室的净化气体流。 吹扫装置可以包括气体净化器和颗粒过滤器。 气体净化器可以向储存室提供净化气体。 净化气体可以流过储存室,并且吹扫气体和潜在污染物的混合物随后可以作为废气排出存储室。 颗粒过滤器可以接收和过滤废气。 可以将过滤的气体提供给气体净化器以进行净化和再循环。 气体净化器可以通过从过滤的气体中基本上除去酸,碱,有机化合物,水或氧中的至少一种来净化过滤的气体。 净化的过滤气体然后可再循环,并作为净化气体提供给储存室。