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1. 发明授权

US06781398B2 Circuit for testing an integrated circuit 失效
标题翻译：用于测试集成电路的电路
公开(公告)号：US06781398B2
公开(公告)日：2004-08-24
申请号：US10208252
申请日：2002-07-30
申请人： Frank Adler , Hartmut Berger
发明人： Frank Adler , Hartmut Berger
IPC分类号： G01R3126
CPC分类号： G11C29/56 , G11C2029/5606
摘要： A test circuit for testing an integrated circuit, includes a test signal input for receiving a test signal from the integrated circuit and a reference signal input for receiving a reference signal. A comparator is in communication with the test signal input and with the reference signal input. The comparator is configured to provide, at a comparator output, an error signal if a comparison between the reference signal and the test signal indicates an error. The error signal, if present, is stored in an error memory, in communication with the comparator output.
摘要翻译：用于测试集成电路的测试电路包括用于从集成电路接收测试信号的测试信号输入端和用于接收参考信号的参考信号输入。比较器与测试信号输入和参考信号输入通信。如果参考信号和测试信号之间的比较指示错误，则比较器被配置为在比较器输出端提供误差信号。错误信号（如果存在）存储在与比较器输出通信的错误存储器中。

2. 发明授权

US07124336B2 Method for the defect analysis of memory modules 有权
标题翻译：内存模块缺陷分析方法
公开(公告)号：US07124336B2
公开(公告)日：2006-10-17
申请号：US10200642
申请日：2002-07-22
申请人： Frank Adler , Martin Versen
发明人： Frank Adler , Martin Versen
IPC分类号： G11C29/00
CPC分类号： G11C29/56 , G11C5/04 , G11C29/56008 , G11C2029/4402 , G11C2029/5606
摘要： A computer system has at least one data defect memory, at least one address defect memory and also a test program. The computer system is connected to a memory module that has a memory space with defect-free and defective memory cells, a plurality of data lines, and a plurality of address lines. The addresses of the defective memory cells in the memory space and the data lines that are connected to the defective memory cells are determined from the information items of the address defect memory and also from the information items of the data defect memory.
摘要翻译：计算机系统具有至少一个数据缺陷存储器，至少一个地址缺陷存储器以及测试程序。计算机系统连接到存储器模块，存储器模块具有无缺陷存储单元，多个数据线和多个地址线的存储器空间。从地址缺陷存储器的信息项以及数据缺陷存储器的信息项中确定存储器空间中的有缺陷的存储器单元的地址和连接到有缺陷的存储器单元的数据线。

3. 发明授权

US06505530B2 Ink application device for tattooing or for making permanent make-up 有权
公开(公告)号：US06505530B2
公开(公告)日：2003-01-14
申请号：US10072991
申请日：2002-02-12
申请人： Frank Adler , Walter Lisec , Gerhard Türk
发明人： Frank Adler , Walter Lisec , Gerhard Türk
IPC分类号： B43K500
CPC分类号： A61M37/0076 , A45D34/04
摘要： An ink application device for tattooing or for making permanent make-up includes a handle, a needle drive, a needle, a needle nozzle and a protective cap. The device further includes at least two modules releasably connected to one another. One of the modules is formed as a reusable base module with an integrated needle drive, and the other module is a sterilized disposable module in which all components of the manual device capable of being infected by bodily fluids of a customer are integrated. The device can be constructively divided into two or three separate modules: a basic module, a disposable or hygienic module and an optional ink module. The basic module corresponds to the handle that includes the needle drive and is designed such that the hygienic module can be safely attached and connected to the integrated needle drive.

4. 发明授权

US07110900B2 Determination of waveguide parameters 有权
标题翻译：波导参数的确定
公开(公告)号：US07110900B2
公开(公告)日：2006-09-19
申请号：US10820088
申请日：2004-04-07
申请人： Frank Adler , Everhard Muyzert
发明人： Frank Adler , Everhard Muyzert
IPC分类号： G01R23/16
CPC分类号： G01V1/30
摘要： A method of determining at least one parameter of a waveguide (3) from wavefield data acquired from wave propagation in the waveguide including obtaining first and second dispersion curves (9a, 9b, 9c) in the frequency domain from the wavefield data. A frequency interval between the first dispersion curve and the second dispersion curve is found, and this is used in the determination of at least one parameter of the waveguide. The frequency separation Δƒ(V) between the first and second dispersion curves may be found at a particular value of the phase velocity V, and the thickness h of the waveguide can be found using: Δ ⁢ ⁢ f ⁡ ( V ) = c 1 2 ⁢ h ⁢ 1 - c 1 2 V 2 Here, c1 is the velocity of wave propagation in the waveguide. This may be found from the asymptotic velocity values of the dispersion curves.
摘要翻译：一种从波导中的波传播获得的波场数据中确定波导（3）的至少一个参数的方法，包括从波场数据获得频域中的第一和第二色散曲线（9a，9b，9c）。找到第一色散曲线和第二色散曲线之间的频率间隔，并将其用于确定波导的至少一个参数。可以在相速度V的特定值处找到第一和第二色散曲线之间的频率间隔Deltaf（V），并且可以使用以下方式找到波导的厚度h： $Delta$

5. 发明授权

US06836440B2 Method of checking electrical connections between a memory module and a semiconductor memory chip 失效
标题翻译：检查存储器模块和半导体存储器芯片之间的电连接的方法
公开(公告)号：US06836440B2
公开(公告)日：2004-12-28
申请号：US10356921
申请日：2003-01-30
申请人： Frank Adler , Thomas Huber , Manfred Moser
发明人： Frank Adler , Thomas Huber , Manfred Moser
IPC分类号： G11C2900
CPC分类号： G11C29/025 , G11C29/02 , G11C2207/105
摘要： Two methods check functional capability of electrical connections between address lines of a printed circuit board of a memory module and address line contacts of an integrated semiconductor memory chip mounted on the printed circuit board. Ruptured solder contacts are conventionally examined optically or investigated by electrical resistance measurements; however, the latter do not work in the case of memory modules with a number of semiconductor chips, the pin contacts of which are connected in parallel by the address lines. The methods make it possible to locate interrupted contacts on individual address lines by the indirect use of a write-read access to the semiconductor memory chip, specifically utilizing the misrouting of writing and reading commands produced by defective contact connections.
摘要翻译：两种方法检查存储器模块的印刷电路板的地址线和安装在印刷电路板上的集成半导体存储器芯片的地址线触点之间的电连接的功能性。通常通过电阻测量光学地检查破裂的焊料接触点; 然而，后者在具有多个半导体芯片的存储器模块的情况下不起作用，其引脚触点由地址线并联连接。这些方法可以通过间接使用对半导体存储器芯片的写入访问来定位各个地址线上的中断的触点，特别是利用写入和读取由缺陷接触连接产生的命令的错误路由。

6. 发明授权

US06345553B1 Ink application device for tattooing or for making permanent make-up 有权
公开(公告)号：US06345553B1
公开(公告)日：2002-02-12
申请号：US09671650
申请日：2000-09-28
申请人： Frank Adler , Walter Lisec , Gerhard Türk
发明人： Frank Adler , Walter Lisec , Gerhard Türk
IPC分类号： B43K500
CPC分类号： A61M37/0076 , A45D34/04
摘要： An ink application device for tattooing or for making permanent make-up includes a handle, a needle drive, a needle, a needle nozzle and a protective cap. The device further includes at least two modules releasably connected to one another. One of the modules is formed as a reusable base module with an integrated needle drive, and the other module is a sterilized disposable module in which all components of the manual device capable of being infected by bodily fluids of a customer are integrated. The device can be constructively divided into two or three separate modules: a basic module, a disposable or hygienic module and an optional ink module. The basic module corresponds to the handle that includes the needle drive and is designed such that the hygienic module can be safely attached and connected to the integrated needle drive.

7. 发明申请

US20120148995A1 APPARATUS AND RELATED METHODS FOR THE CONTROLLED ILLUMINATION OF A CONVEX SURFACE 失效
标题翻译：装置和相关方法用于控制照明的表面
公开(公告)号：US20120148995A1
公开(公告)日：2012-06-14
申请号：US13367877
申请日：2012-02-07
申请人： Edward Cheung , Eric Poesch , Frank Adler , Michael O'Connor
发明人： Edward Cheung , Eric Poesch , Frank Adler , Michael O'Connor
IPC分类号： G09B23/00 , F21V11/00
CPC分类号： G09B27/04
摘要： Illumination provided to the interior of a convex surface can be controlled using a plurality of internal barriers separating light sources such as light emitting diodes. Such controlled illumination can simulate phases of the moon using logic which can be limited to yes or no Boolean decisions, thereby minimizing the complexity of required input.
摘要翻译：可以使用分离光源（例如发光二极管）的多个内部屏障来控制提供给凸表面内部的照明。这种受控照明可以使用逻辑来模拟月球的阶段，逻辑可以被限制为是或否布尔决定，从而最小化所需输入的复杂度。

8. 发明授权

US08133058B2 Apparatus and related methods for the controlled illumination of a convex surface 有权
标题翻译：用于凸表面受控照明的装置和相关方法
公开(公告)号：US08133058B2
公开(公告)日：2012-03-13
申请号：US11877226
申请日：2007-10-23
申请人： Edward Cheung , Eric Poesch , Frank Adler , Michael O'Connor
发明人： Edward Cheung , Eric Poesch , Frank Adler , Michael O'Connor
IPC分类号： G09B23/00
CPC分类号： G09B27/04
摘要： Illumination provided to the interior of a convex surface can be controlled using a plurality of internal barriers separating light sources such as light emitting diodes. Such controlled illumination can simulate phases of the moon using logic which can be limited to yes or no Boolean decisions, thereby minimizing the complexity of required input.
摘要翻译：可以使用分离光源（例如发光二极管）的多个内部屏障来控制提供给凸表面内部的照明。这种受控照明可以使用逻辑来模拟月球的阶段，逻辑可以被限制为是或否布尔决定，从而最小化所需输入的复杂度。

9. 发明授权

US07165002B2 Test device for dynamic memory modules 有权
标题翻译：动态内存模块测试装置
公开(公告)号：US07165002B2
公开(公告)日：2007-01-16
申请号：US10159849
申请日：2002-05-31
申请人： Frank Adler
发明人： Frank Adler
IPC分类号： G01R31/00 , G01R31/14
CPC分类号： G11C29/56 , G11C11/401
摘要： A test device for dynamic memory modules is described and has an electronic test unit for generating test signals. Accordingly, the electronic test unit has at least one electronic component for generating the test signals, and is configured for use on a personal computer mother board and contains at least one memory controller.
摘要翻译：描述了用于动态存储器模块的测试装置，并且具有用于产生测试信号的电子测试单元。因此，电子测试单元具有用于生成测试信号的至少一个电子部件，并且被配置为在个人计算机母板上使用并且包含至少一个存储器控制器。

10. 发明授权

US06703844B2 Method for determining the transit time of electrical signals on printed circuit boards using automatic standard test equipment 失效
标题翻译：使用自动标准测试设备确定印刷电路板上电信号传输时间的方法
公开(公告)号：US06703844B2
公开(公告)日：2004-03-09
申请号：US10223899
申请日：2002-08-20
申请人： Frank Adler , Thomas Huber , Manfred Moser , Martin Versen
发明人： Frank Adler , Thomas Huber , Manfred Moser , Martin Versen
IPC分类号： G01R3128
CPC分类号： G11C29/025 , G01R31/2801 , G01R31/3016 , G11C29/02 , G11C29/50 , G11C29/50012 , G11C2029/5002
摘要： Signal transit times on printed circuit boards which are equipped with all the passive components but without any active components can be determined using automatic standard test equipment composed of a standard test unit and a performance board with fittings attached thereto. In that first, using a standard routine of the test unit, a transit time is measured on the performance board from the CIF connector as far as the fitting, then a printed circuit board is plugged into the fitting location determined for it and then the sum transit time of the CIF connector is measured as far as the landing pad on the printed circuit board. By forming differences between the two measured values, the transit times on a printed circuit board can be measured with a high degree of precision with the automatic standard test equipment used in standard module testing technology.
摘要翻译：配备有所有被动部件但没有任何有源部件的印刷电路板上的信号传递时间可以使用由标准测试单元和附接到其上的配件的性能板组成的自动标准测试设备来确定。首先，使用测试单元的标准程序，在CIF连接器的性能板上测量运输时间至配件，然后将印刷电路板插入到为其确定的配件位置，然后总和 CIF连接器的通行时间被测量到印刷电路板上的着陆焊盘。通过形成两个测量值之间的差异，可以使用标准模块测试技术中使用的自动标准测试设备，以高精度测量印刷电路板上的传送时间。

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