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    • 3. 发明申请
    • METHOD FOR CALIBRATING A DUAL -SPECTRAL COMPUTED TOMOGRAPHY (CT) SYSTEM
    • 用于校准双重计算机图像(CT)系统的方法
    • US20090161814A1
    • 2009-06-25
    • US11959709
    • 2007-12-19
    • Xiaoye WuJames Walter LeblancPaavana Sainath
    • Xiaoye WuJames Walter LeblancPaavana Sainath
    • G12B13/00G06K9/00A61B6/03
    • A61B6/583A61B6/032A61B6/482A61B6/505
    • A method for calibrating and reconstructing material density images in a dual-spectral computed tomography (CT) system 100 is disclosed. An X-ray source in the CT system 100 emits a first X-ray spectrum and a second X-ray spectrum towards an object. The method includes computing calibration coefficients by using projection data from the object for the two X-ray spectra and by linearizing at least two basis materials such as bone and water simultaneously. Further, basis materials decomposition coefficients for the at least two basis materials are computed by linearizing the basis materials individually. Correction values for the projection data and for the basis materials are then computed by using the basis materials decomposition coefficients and the calibration coefficients. The computed correction values are used in reconstructing material density images for the basis materials.
    • 公开了一种用于在双光谱计算机断层摄影(CT)系统100中校准和重建材料密度图像的方法。 CT系统100中的X射线源朝向物体发射第一X射线光谱和第二X射线光谱。 该方法包括通过使用来自对象的两个X射线光谱的投影数据和同时线性化至少两种基础材料例如骨骼和水来计算校准系数。 此外,通过将基础材料单独线性化来计算至少两种基础材料的基础材料分解系数。 然后通过使用基础材料分解系数和校准系数来计算投影数据和基础材料的校正值。 计算的校正值用于重建基础材料的材料密度图像。
    • 5. 发明授权
    • Method for calibrating a dual -spectral computed tomography (CT) system
    • 校准双光谱计算机断层摄影(CT)系统的方法
    • US07801264B2
    • 2010-09-21
    • US11959709
    • 2007-12-19
    • Xiaoye WuJames Walter LeblancPaavana Sainath
    • Xiaoye WuJames Walter LeblancPaavana Sainath
    • A61B6/00
    • A61B6/583A61B6/032A61B6/482A61B6/505
    • A method for calibrating and reconstructing material density images in a dual-spectral computed tomography (CT) system 100 is disclosed. An X-ray source in the CT system 100 emits a first X-ray spectrum and a second X-ray spectrum towards an object. The method includes computing calibration coefficients by using projection data from the object for the two X-ray spectra and by linearizing at least two basis materials such as bone and water simultaneously. Further, basis materials decomposition coefficients for the at least two basis materials are computed by linearizing the basis materials individually. Correction values for the projection data and for the basis materials are then computed by using the basis materials decomposition coefficients and the calibration coefficients. The computed correction values are used in reconstructing material density images for the basis materials.
    • 公开了一种用于在双光谱计算机断层摄影(CT)系统100中校准和重建材料密度图像的方法。 CT系统100中的X射线源朝向物体发射第一X射线光谱和第二X射线光谱。 该方法包括通过使用来自对象的两个X射线光谱的投影数据和同时线性化至少两种基础材料例如骨骼和水来计算校准系数。 此外,通过将基础材料单独线性化来计算至少两种基础材料的基础材料分解系数。 然后通过使用基础材料分解系数和校准系数来计算投影数据和基础材料的校正值。 计算的校正值用于重建基础材料的材料密度图像。
    • 7. 发明授权
    • Tileable multi-layer detector
    • 可分层多层检测器
    • US07450683B2
    • 2008-11-11
    • US11516852
    • 2006-09-07
    • John Eric TkaczykJonathan David ShortJames Walter LeblancJames Wilson Rose
    • John Eric TkaczykJonathan David ShortJames Walter LeblancJames Wilson Rose
    • A61B6/00
    • G01T1/2985A61B6/032
    • A detector assembly is presented. The detector assembly includes a first detector layer having a top side and a bottom side, where the first detector layer includes a plurality of first coupling gaps. Additionally, the detector assembly includes a first interconnect structure operationally coupled to the first detector layer and configured to facilitate transfer of a first set of image data from the first detector layer to backplane electronics. The detector assembly also includes a second detector layer having a top side and a bottom side and disposed adjacent the bottom side of the first detector layer, where the second detector layer includes a plurality of second coupling gaps configured to facilitate passage of the first interconnect structure from the first detector layer to the backplane electronics. Also, the detector assembly includes a second interconnect structure operationally coupled to the second detector layer and configured to facilitate transfer of a second set of image data from the second detector layer to the backplane electronics.
    • 提出了一种检测器组件。 检测器组件包括具有顶侧和底侧的第一检测器层,其中第一检测器层包括多个第一耦合间隙。 另外,检测器组件包括第一互连结构,其可操作地耦合到第一检测器层并且被配置为便于将第一组图像数据从第一检测器层传送到背板电子器件。 检测器组件还包括具有顶侧和底侧并且邻近第一检测器层的底侧设置的第二检测器层,其中第二检测器层包括多个第二耦合间隙,其被配置为便于第一互连结构的通过 从第一检测器层到背板电子设备。 此外,检测器组件包括第二互连结构,其可操作地耦合到第二检测器层并且被配置为便于将第二组图像数据从第二检测器层传送到背板电子器件。